{"id":458146,"date":"2024-10-20T09:55:10","date_gmt":"2024-10-20T09:55:10","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bsi-24-30490678-dc-2024\/"},"modified":"2024-10-26T18:26:24","modified_gmt":"2024-10-26T18:26:24","slug":"bsi-24-30490678-dc-2024","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bsi-24-30490678-dc-2024\/","title":{"rendered":"BSI 24\/30490678 DC 2024"},"content":{"rendered":"
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
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5<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
7<\/td>\n | 1 Scope 2 Normative references 3 Terms, definitions and abbreviated terms 3.1 Terms and definitions <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | 1 2 3 3.1 3.2 Abbreviated terms 4 Measuring methods 4.1 General 4.2 Principle <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | 4.3 Requirements 4 4.1 4.2 4.3 4.3.1 Measuring conditions 4.3.1 4.3.2 Measuring instruments and equipment 4.3.2 4.3.2.1 General 4.3.2.2 Laser <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | 4.3.2.3 Stage 4.3.2.4 Lens 4.3.2.5 Long-wavelength-pass filter 4.3.2.6 Spectrometer <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | 4.4 4.4 Measurement 4.4.1 Measurement setup <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | 4.4.2 Measurement items 4.4.3 Measurement sequence <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | 5 Test report <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | Table 1 \u2013 Summary of test report <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" BS IEC 60747-5-18 Semiconductor devices – Part 5-18: Optoelectronic devices – Light emitting diodes – Test method light emitting diodesof the macro photoluminescence for epitaxial wafers of micro light emitting diodes<\/b><\/p>\n |