| PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
|---|---|---|---|---|---|---|---|
| 9<\/td>\n | 1 Scope 2 Terms and definitions 3 Symbols and abbreviated terms <\/td>\n<\/tr>\n | ||||||
| 11<\/td>\n | 4 Characterization of nanostructured materials with surface analysis methods 4.1 Introduction <\/td>\n<\/tr>\n | ||||||
| 14<\/td>\n | 4.2 Electron Spectroscopies (AES and XPS) <\/td>\n<\/tr>\n | ||||||
| 20<\/td>\n | 4.3 Ion-beam surface analysis methods (SIMS and LEIS) 4.3.1 SIMS and examples of SIMS applications – During SIMS measurements (Figure 1), primary ion beams of Ga+, Ar+, O2+, Cs+, C60+, Au+, Bi+ or other atomic, molecular or cluster ions with energies between 3 and 20 keV are incident on the surface and the ions removed (sputtered) from the surface are detected. To extract surface molecular information, SIMS is used in a \u201cstatic\u201d mode that involves a low density and low total dose of ions such that the surface damage and alteration is minimized. Both atomic and molecular secondary ions are used to extract the surface information [84]. <\/td>\n<\/tr>\n | ||||||
| 21<\/td>\n | 4.3.2 Low energy ion scattering and applications to nanomaterials <\/td>\n<\/tr>\n | ||||||
| 22<\/td>\n | 4.4 Scanning probe microscopy <\/td>\n<\/tr>\n | ||||||
| 23<\/td>\n | 4.5 Surface characterization of carbon nanostructures 5 Analysis considerations, issues and challenges associated with characterization of nanostructured materials: Information for the analyst. 5.1 Introduction <\/td>\n<\/tr>\n | ||||||
| 24<\/td>\n | 5.2 General considerations and analysis challenges <\/td>\n<\/tr>\n | ||||||
| 25<\/td>\n | 5.3 Physical properties <\/td>\n<\/tr>\n | ||||||
| 26<\/td>\n | 5.4 Particle stability and damage: influence of size, surface energy and confluence of energy scales 5.4.1 Crystal structure <\/td>\n<\/tr>\n | ||||||
| 27<\/td>\n | 5.4.2 Damage and probe effects 5.4.3 Time and environment 5.4.3.1 General information <\/td>\n<\/tr>\n | ||||||
| 29<\/td>\n | 5.4.3.2 Effect of environment on nanomaterial structure and properties 5.4.3.3 Time-dependent properties <\/td>\n<\/tr>\n | ||||||
| 30<\/td>\n | 5.4.3.4 Proximity effects <\/td>\n<\/tr>\n | ||||||
| 31<\/td>\n | 5.5 Sample mounting and preparation considerations <\/td>\n<\/tr>\n | ||||||
| 32<\/td>\n | 5.6 Specific considerations for analysis of nanostructured materials using XPS, AES, SIMS and SPM 5.6.1 Introduction 5.6.2 Issues related to application of XPS to nanomaterials 5.6.2.1 General information <\/td>\n<\/tr>\n | ||||||
| 33<\/td>\n | 5.6.2.2 Influence of shape <\/td>\n<\/tr>\n | ||||||
| 34<\/td>\n | 5.6.2.3 Low density of particles supported on a substrate <\/td>\n<\/tr>\n | ||||||
| 35<\/td>\n | 5.6.2.4 Agglomerates of particles 5.6.2.5 Binding-energy and peak-width changes 5.6.3 Issues related to the application of AES to nanostructured materials 5.6.4 Issues related to application of SIMS to nanoparticles <\/td>\n<\/tr>\n | ||||||
| 37<\/td>\n | 5.6.5 Issues related to the application of scanning probe methods to nanoparticles 6 General characterization needs and opportunities for nanostructured materials <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Surface chemical analysis. Characterization of nanostructured materials<\/b><\/p>\n |