{"id":290568,"date":"2024-10-19T19:43:09","date_gmt":"2024-10-19T19:43:09","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-iso-110392012\/"},"modified":"2024-10-25T16:43:27","modified_gmt":"2024-10-25T16:43:27","slug":"bs-iso-110392012","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-iso-110392012\/","title":{"rendered":"BS ISO 11039:2012"},"content":{"rendered":"
This International Standard defines terms and specifies measurement methods for characterizing the drift rates of scanning-probe microscopy (SPM) instruments in the X- and Y-directions and, for SPM instruments measuring topography, the drift rate in the Z-direction. Though the behaviour of the long-term drift rate might be nonlinear, both that and the behaviour of the short-term drift rate after a user-defined settling time can be characterized by either typical average or typical maximum drift rates.<\/p>\n
This International Standard is suitable for evaluating the drift rate based on SPM images. It is intended to help manufacturers quote drift figures in specifications in a meaningful and consistent manner and to aid users to characterize the drift behaviour so that effective experiments can be designed. These measurements are not designed for image correction.<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
---|---|---|---|---|---|---|---|
6<\/td>\n | Foreword <\/td>\n<\/tr>\n | ||||||
7<\/td>\n | Introduction <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | 1\tScope 2\tNormative references 3\tTerms and definitions and abbreviated terms 3.1\tTerms and definitions <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | 3.2\tAbbreviated terms 4\tMeasurement method <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | 5\tRequirements 5.1\tInstrument requirements 5.2\tEnvironment requirements 6\tMeasurement procedures 6.1\tInitial check <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | 6.2\tBasic characterization and the settling time <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | 6.3\tFurther characterization and fresh image areas <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | 6.4\tOther specimens 7\tMeasurement report <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | Annex\u00a0A \n(normative)<\/p>\n Image correlation method <\/td>\n<\/tr>\n | ||||||
19<\/td>\n | Annex\u00a0B \n(normative)<\/p>\n Characteristic-marker method <\/td>\n<\/tr>\n | ||||||
21<\/td>\n | Annex\u00a0C \n(normative)<\/p>\n Non-periodic grating method <\/td>\n<\/tr>\n | ||||||
24<\/td>\n | Annex\u00a0D \n(informative)<\/p>\n Guidance to users <\/td>\n<\/tr>\n | ||||||
25<\/td>\n | Annex\u00a0E \n(informative)<\/p>\n Instrumental parameters to consider to reduce drift rates <\/td>\n<\/tr>\n | ||||||
26<\/td>\n | Annex\u00a0F \n(informative)<\/p>\n Example of drift results and analysis <\/td>\n<\/tr>\n | ||||||
27<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Surface chemical analysis. Scanning-probe microscopy. Measurement of drift rate<\/b><\/p>\n |