{"id":208079,"date":"2024-10-19T13:24:33","date_gmt":"2024-10-19T13:24:33","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/astm-f1259m-2\/"},"modified":"2024-10-25T06:06:57","modified_gmt":"2024-10-25T06:06:57","slug":"astm-f1259m-2","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/astm\/astm-f1259m-2\/","title":{"rendered":"ASTM-F1259M"},"content":{"rendered":"

ASTM F1259M-96-Reapproved2003<\/h3>\n

Withdrawn Standard: Standard Guide for Design of Flat, Straight-Line Test Structures for Detecting Metallization Open-Circuit or Resistance-Increase Failure Due to Electromigration [Metric] (Withdrawn 2009)<\/h4>\n
\n

ASTM F1259M<\/h4>\n

Scope<\/strong><\/p>\n

1.1 This guide covers recommended design features for test structures used in accelerated stress tests, as described in Test Method F 1260M, to characterize the failure distribution of interconnect metallizations that fail due to electromigration.<\/p>\n

1.2 This guide is restricted to structures with a straight test line on a flat surface that are used to detect failures due to an open-circuit or a percent-increase in resistance of the test line.<\/p>\n

1.3 This guide is not intended for testing metal lines whose widths are approximately equal to or less than the estimated mean size of the metal grains in the metallization line.<\/p>\n

1.4 This guide is not intended for test structures used to detect random defects in a metallization line.<\/p>\n

1.5 Metallizations tested and characterized are those that are used in microelectronic circuits and devices.<\/p>\n

Keywords<\/strong><\/p>\n

design guideline; electromigration; electromigration failure; interconnect metallization; metallization open-circuit; metallization resistance; microelectronic; test structure<\/p>\n

ICS Code<\/strong><\/p>\n

ICS Number Code n\/a<\/p>\n

DOI:<\/strong> 10.1520\/F1259M-96R03<\/p>\n<\/div>\n

PDF Catalog<\/h4>\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
1<\/td>\nScope
Referenced Documents
Terminology
Significance and Use
Design Features <\/td>\n<\/tr>\n
2<\/td>\nKeywords
FIG. 1 <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

F1259M-96(2003) Standard Guide for Design of Flat, Straight-Line Test Structures for Detecting Metallization Open-Circuit or Resistance-Increase Failure Due to Electromigration [Metric] (Withdrawn 2009)<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
ASTM<\/b><\/a><\/td>\n2003<\/td>\n2<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":208085,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2637],"product_tag":[],"class_list":{"0":"post-208079","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-astm","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/208079","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/208085"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=208079"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=208079"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=208079"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}