New IEEE Standard – Inactive – Superseded. Digital recorders and digital oscilloscopes used for measurements during tests with high-impulse voltages and high-impulse currents are considered. Terms specifically related to the digital recorders used for monitoring high-voltage and high-current impulse tests are defined. The performance characteristics for such recorders, necessary to ensure their compliance with the requirements for high-voltage and for high-current impulse tests, are specified. The tests and procedures that are necessary to show that these performance characteristics are within those specified limits are indicated.<\/p>\n
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| 11<\/td>\n | Scope and References 1.1 Scope 1.2 References 1.3 Bibliography 2 Object 3 Conditions of Use Range of Operating Conditions <\/td>\n<\/tr>\n | ||||||
| 12<\/td>\n | 3.2 Reference Conditions General Definitions Digitizer) Output of an Impulse Digitizer 4.3 Offset 4.4.1 Static Scale Factor (sso Impulse Scale Factor (isf) 4.5 Quantization Characteristic Table 1 Normal Operating Conditions Table 2 Reference Conditions <\/td>\n<\/tr>\n | ||||||
| 13<\/td>\n | Static Integral Non-Linearity (sinl) Rated Resolution (rr) Full Scale Value (fsv) (k)) 4.10 Average Code Bin Width w, ) Differential Non-Linearity (dnl) 4.12 Sampling Rate 4.13 Sampling Interval Uncertainty 4.14 Record Length 4.15 Quantization Error 4.16 Warm-up Time Input Impedence 6 Analysis of the Impulse Waveform 6.1 General Equivalent Oscillogram Method <\/td>\n<\/tr>\n | ||||||
| 14<\/td>\n | Procedures for Reading Digital Records Reading Using a Cursor Reading Using Algorithms Quantization Characteristic of an Ideal 3-Bit Digitizer Static Integral Non-Linearity (sinl) Differential Non-Linearity (dnl) Under DC Conditions <\/td>\n<\/tr>\n | ||||||
| 15<\/td>\n | Measurements Limits on Overall Error Limits on Individual Errors 7.2.1 Sampling Rate 7.2.2 Rated Resolution Accuracy of the Reading Process 7.2.4 Non-Linearity Non-Linearity of Amplitude 7.2.4.2 Non-Linearity of Time Base First 3 ps of a Full Lightning Impulse <\/td>\n<\/tr>\n | ||||||
| 16<\/td>\n | Impulse Scale Factor 7.2.6 Rise Time t, > Internal Noise Level 7.2.8 Limits of Interference 7.2.9 Ripple 8 Performance Tests Direct Voltage Calibration <\/td>\n<\/tr>\n | ||||||
| 17<\/td>\n | Differential Non-Linearity (Impulse Conditions) Internal Noise Level 8.4 Time Calibration 8.5 Rise Time Measurement of the Impulse Scale Factor 8.6.1 Pulse Calibration Fig 5A Direct Voltage Calibration Fig 5B Direct Voltage Calibration <\/td>\n<\/tr>\n | ||||||
| 18<\/td>\n | 8.6.2 Step Calibration 8.7 Interference Check 8.8 Ripple Routine Tests 9.1 General 9.2 Pulse Calibration 9.3 Alternative Check <\/td>\n<\/tr>\n | ||||||
| 19<\/td>\n | 9.4 Application Step Response of an Impulse Digitizer 3 Requirements on Pulse Parameters for Pulse Calibration <\/td>\n<\/tr>\n | ||||||
| 20<\/td>\n | A Electromagnetic Interference A1 General Techniques A2.1 Electromagnetic Shielding A2.2 Reduction of Conducted Interference on the Supply Line A2.3 Reduction of Interference on the Signal Line A2.4 Signal Transmission by Optical Means A3 Individual Interference Tests <\/td>\n<\/tr>\n | ||||||
| 21<\/td>\n | A3.1 Current Injection into the Shield of the Cables A3.2 Transient Superimposed on the Power Supply A3.3 Application of Electric and Magnetic Fields A3.4 Evaluation of Interference Tests Fig Al Current Injection Into the Shield Fig A2 Transient Superimposed on the Power Supply Fig A3 Application of Electric and Magnetic Fields <\/td>\n<\/tr>\n | ||||||
| 22<\/td>\n | Special Recommendations for Scan Converters <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" IEEE Standard for Digital Recorders for Measurements in High-Voltage Impulse Tests<\/b><\/p>\n |