{"id":7369,"date":"2024-10-16T19:08:48","date_gmt":"2024-10-16T19:08:48","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/astm-e1621\/"},"modified":"2024-10-24T10:51:16","modified_gmt":"2024-10-24T10:51:16","slug":"astm-e1621","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/astm\/astm-e1621\/","title":{"rendered":"ASTM-E1621"},"content":{"rendered":"

ASTM E1621-05<\/h3>\n

Historical Standard: Standard Guide for X-Ray Emission Spectrometric Analysis<\/h4>\n
\n

ASTM E1621<\/h4>\n

Scope<\/strong><\/p>\n

1.1 This guide covers guidelines for developing and describing analytical procedures using a wavelength-dispersive X-ray spectrometer.<\/p>\n

1.2 The values stated in SI units are to be regarded as the standard. The values given in parentheses are for information only.<\/p>\n

1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.<\/p>\n

Keywords<\/strong><\/p>\n

interferences; line overlap; spectroscopy; X-ray<\/p>\n

ICS Code<\/strong><\/p>\n

ICS Number Code 71.040.50 (Physicochemical methods of analysis)<\/p>\n

DOI:<\/strong> 10.1520\/E1621-05<\/p>\n<\/div>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
1<\/td>\nScope
Referenced Documents
Terminology
Summary of Guide
Significance and Use
Interferences <\/td>\n<\/tr>\n
2<\/td>\nApparatus <\/td>\n<\/tr>\n
3<\/td>\nReagents and Materials
Reference Materials
Hazards
Preparation of Reference Materials and Test Specimens <\/td>\n<\/tr>\n
4<\/td>\nPreparation of Apparatus
Calibration and Standardization <\/td>\n<\/tr>\n
5<\/td>\nProcedure
Calculation of Results
Precision and Bias
Keywords <\/td>\n<\/tr>\n
6<\/td>\nX1. LINE OVERLAP CORRECTION
X1.1 General
X1.2 Determination of the Correction Factor by Direct Measurement
FIG. X1.1 <\/td>\n<\/tr>\n
7<\/td>\nX1.3 Determination of the Correction Factor Using Synthetic Specimens
X1.4 Determination of the Correction Factor Using Regression Analysis
X1.5 Subtraction of Background Using Lorentz Model
X1.6 Variance <\/td>\n<\/tr>\n
8<\/td>\nFIG. X1.2 <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

E1621-05 Standard Guide for X-Ray Emission Spectrometric Analysis<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
ASTM<\/b><\/a><\/td>\n2005<\/td>\n8<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":7370,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[1001,2637],"product_tag":[],"class_list":{"0":"post-7369","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-71-040-50","7":"product_cat-astm","9":"first","10":"instock","11":"sold-individually","12":"shipping-taxable","13":"purchasable","14":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/7369","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/7370"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=7369"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=7369"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=7369"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}