IEC 63171:2021 covers shielded and unshielded free and fixed connectors, circular or rectangular, for balanced single-pair data transmission, with current-carrying capacity. It specifies the IEC 63171 series’ common mechanical, electrical and transmission characteristics and environmental requirements, as well as required test specifications. This document does not describe a specific mating interface. Detail specifications of mating interfaces complying with this document can be found in the family of detail specification standards IEC 63171-X (type X). Within their own type, the shielded and unshielded connectors are interoperable for their transmission performance and can be exchanged; though the shielded version has improved alien crosstalk and coupling attenuation properties<\/p>\n
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| 2<\/td>\n | undefined <\/td>\n<\/tr>\n | ||||||
| 5<\/td>\n | Annex ZA(normative)Normative references to international publicationswith their corresponding European publications <\/td>\n<\/tr>\n | ||||||
| 9<\/td>\n | English CONTENTS <\/td>\n<\/tr>\n | ||||||
| 11<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
| 13<\/td>\n | INTRODUCTION Figures Figure 1 \u2013 Relationships between the IEC 63171 series and their related references <\/td>\n<\/tr>\n | ||||||
| 14<\/td>\n | 1 Scope 2 Normative references <\/td>\n<\/tr>\n | ||||||
| 16<\/td>\n | 3 Terms and definitions 4 Common features and typical connector pair 5 Characteristics 5.1 General 5.2 Pin assignment 5.3 Classification into climatic category Figure 2 \u2013 Example of front view of fixed connector pin assignment <\/td>\n<\/tr>\n | ||||||
| 17<\/td>\n | 5.4 Electrical characteristics 5.4.1 Creepage and clearance distances 5.4.2 Voltage proof <\/td>\n<\/tr>\n | ||||||
| 18<\/td>\n | 5.4.3 Current-temperature derating Figure 3 \u2013 Level I connector de-rating curve <\/td>\n<\/tr>\n | ||||||
| 19<\/td>\n | 5.4.4 Interface contact resistance \u2013 initial only 5.4.5 Input to output DC resistance Figure 4 \u2013 Level II connector de-rating curve <\/td>\n<\/tr>\n | ||||||
| 20<\/td>\n | 5.4.6 Input to output DC resistance unbalance 5.4.7 Initial insulation resistance 5.5 Transmission characteristics 5.5.1 General 5.5.2 Insertion loss <\/td>\n<\/tr>\n | ||||||
| 21<\/td>\n | 5.5.3 Return loss 5.5.4 Propagation delay 5.5.5 Transverse conversion loss Tables Table 1 \u2013 Maximum insertion loss Table 2 \u2013 Minimum return loss <\/td>\n<\/tr>\n | ||||||
| 22<\/td>\n | 5.5.6 Transverse conversion transfer loss 5.5.7 Transfer impedance (shielded only) 5.5.8 Coupling attenuation Table 3 \u2013 Minimum transverse conversion loss Table 4 \u2013 Minimum transverse conversion transfer loss <\/td>\n<\/tr>\n | ||||||
| 23<\/td>\n | 5.5.9 Power sum alien (exogenous) NEXT 5.5.10 Power sum alien (exogenous) FEXT Table 5 \u2013 Minimum coupling attenuation Table 6 \u2013 Minimum power sum alien near end crosstalk (PS ANEXT) <\/td>\n<\/tr>\n | ||||||
| 24<\/td>\n | 5.6 Mechanical characteristics 5.6.1 Mechanical operation Table 7 \u2013 Minimum power sum alien far end crosstalk (PS AFEXT) <\/td>\n<\/tr>\n | ||||||
| 25<\/td>\n | 5.6.2 Effectiveness of connector coupling devices 5.6.3 Insertion and withdrawal forces Table 8 \u2013 Preferred values for the number of mating cycles Table 9 \u2013 Minimum pull-out force <\/td>\n<\/tr>\n | ||||||
| 26<\/td>\n | 5.6.4 Polarizing method 5.6.5 Dynamic stress 6 Tests and test schedule 6.1 General <\/td>\n<\/tr>\n | ||||||
| 27<\/td>\n | 6.2 Example of input to output resistance measurement arrangement Figure 5 \u2013 Example of input to output resistance measurement arrangement <\/td>\n<\/tr>\n | ||||||
| 28<\/td>\n | 6.3 Example of arrangement for contact resistance measurement 6.4 Arrangement for vibration test (test phase CP) Figure 6 \u2013 Example of arrangement for contact resistance measurement <\/td>\n<\/tr>\n | ||||||
| 29<\/td>\n | 6.5 Test procedures and measuring methods 6.6 Preconditioning 6.7 Test schedules 6.7.1 General 6.7.2 Basic (minimum) test schedule 6.7.3 Full test schedule <\/td>\n<\/tr>\n | ||||||
| 30<\/td>\n | Table 10 \u2013 Test group P <\/td>\n<\/tr>\n | ||||||
| 31<\/td>\n | Table 11 \u2013 Test group AP <\/td>\n<\/tr>\n | ||||||
| 34<\/td>\n | Table 12 \u2013 Test group BP <\/td>\n<\/tr>\n | ||||||
| 35<\/td>\n | Table 13 \u2013 Test group CP <\/td>\n<\/tr>\n | ||||||
| 37<\/td>\n | Table 14 \u2013 Test group DP <\/td>\n<\/tr>\n | ||||||
| 39<\/td>\n | Table 15 \u2013 Test group EP <\/td>\n<\/tr>\n | ||||||
| 41<\/td>\n | Table 16 \u2013 Test group FP Table 17 \u2013 Test group GP <\/td>\n<\/tr>\n | ||||||
| 42<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Connectors for electrical and electronic equipment. Shielded or unshielded free and fixed connectors for balanced single-pair data transmission with current-carrying capacity. General requirements and tests<\/b><\/p>\n |