{"id":244138,"date":"2024-10-19T16:02:00","date_gmt":"2024-10-19T16:02:00","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-en-61326-2-12013\/"},"modified":"2024-10-25T11:00:42","modified_gmt":"2024-10-25T11:00:42","slug":"bs-en-61326-2-12013","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-en-61326-2-12013\/","title":{"rendered":"BS EN 61326-2-1:2013"},"content":{"rendered":"
IEC 61326-2-1:2012 specifies more detailed test configurations, operational conditions and performance criteria for equipment with test and measurement circuits (both internal and\/or external to the equipment) that are not EMC protected for operational and\/or functional reasons, as specified by the manufacturer. This second edition cancels and replaces the first edition published in 2005. This edition constitutes a technical revision. The main technical changes are: Update with respect to IEC 61326-1:2012. This publication is to be read in conjunction with \/2.<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
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6<\/td>\n | Annex ZZ (informative) Coverage of Essential Requirements of EU Directives <\/td>\n<\/tr>\n | ||||||
7<\/td>\n | English CONTENTS <\/td>\n<\/tr>\n | ||||||
8<\/td>\n | 1 Scope 2 Normative references 3 Terms and definitions 4 General 5 EMC test plan 5.1 General <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | 5.2 Configuration of EUT during testing 5.3 Operation conditions of EUT during testing <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | 5.4 Specification of functional performance 5.5 Test description 6 Immunity requirements 6.1 Conditions during the tests 6.2 Immunity test requirements 6.3 Random aspects 6.4 Performance criteria 7 Emission requirements 8 Test results and test report 9 Instructions for use <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Electrical equipment for measurement, control and laboratory use. EMC requirements – Particular requirements. Test configurations, operational conditions and performance criteria for sensitive test and measurement equipment for EMC unprotected applications<\/b><\/p>\n |