31.080.99 - Other semiconductor devices
Showing 113–128 of 299 results
-
UNE-EN 62258-5:2006:2007 Edition
Semiconductor die products — Part 5: Requirements for information concerning electrical simulation Published By Publication…
-
UNE-EN 62258-2:2011
Semiconductor die products – Part 2: Exchange data formats Published By Publication Date Number of…
-
UNE-EN 62258-2:2005
Semiconductor die products — Part 2: Exchange data formats Published By Publication Date Number of…
-
UNE-EN 62258-1:2010:2011 Edition
Semiconductor die products — Part 1: Procurement and use Published By Publication Date Number of…
-
UNE-EN 62047-9:2011:2012 Edition
Semiconductor devices – Micro-electromechanical devices – Part 9: Wafer to wafer bonding strength measurement for…
-
UNE-EN 62047-8:2011
Semiconductor devices – Micro-electromechanical devices – Part 8: Strip bending test method for tensile property…
-
UNE-EN 62047-7:2011
Semiconductor devices – Micro-electromechanical devices – Part 7: MEMS BAW filter and duplexer for radio…
-
UNE-EN 62047-6:2010
Semiconductor devices – Micro-electromechanical devices — Part 6: Axial fatigue testing methods of thin film…
-
UNE-EN 62047-5:2011
Semiconductor devices – Micro-electromechanical devices – Part 5: RF MEMS switches Published By Publication Date…
-
UNE-EN 62047-4:2010:2011 Edition
Semiconductor devices – Micro-electromechanical devices — Part 4: Generic specification for MEMS Published By Publication…
-
UNE-EN 62047-3:2006:2007 Edition
Semiconductor devices – Micro-electromechanical devices — Part 3: Thin film standard test piece for tensile…
-
UNE-EN 62047-26:2016
Semiconductor devices – Micro-electromechanical devices – Part 26: Description and measurement methods for micro trench…
-
UNE-EN 62047-22:2014
Semiconductor devices – Micro-electromechanical devices – Part 22: Electromechanical tensile test method for conductive thin…
-
UNE-EN 62047-25:2016:2017 Edition
Semiconductor devices – Micro-electromechanical devices – Part 25: Silicon based MEMS fabrication technology – Measurement…
-
UNE-EN 62047-21:2014
Semiconductor devices – Micro-electromechanical devices – Part 21: Test method for Poisson’s ratio of thin…
-
UNE-EN 62047-20:2014
Semiconductor devices – Micro-electromechanical devices – Part 20: Gyroscopes Published By Publication Date Number of…