BSI 21/30437739 DC:2021 Edition
$24.66
BS EN 16603-20-07. Space engineering. Electromagnetic compatibility
Published By | Publication Date | Number of Pages |
BSI | 2021 | 102 |
EMC policy and general system requirements are specified in ECSS-E-ST-20 (equivalent to EN 16603-20). This ECSS-E-ST-20-07 (equivalent to EN 16603-20-07) Standard addresses detailed system requirements (Clause 4), general test conditions, verification requirements at system level, and test methods at subsystem and equipment level (Clause 5) as w ell as informative limits (Annex A). Associated to this standard is ECSS-E-ST-20-06 (equivalent to EN 16603-20-06) “Spacecraft charging”, w hich addresses charging control and risks arising from environmental and vehicle-induced spacecraft charging w hen ECSS-E-ST-20-07 addresses electromagnetic effects of electrostatic discharges. Annexes A to C of ECSS-E-ST-20 document EMC activities related to ECSS-E-ST-20-07: the EMC Control Plan (Annex A) defines the approach, methods, procedures, resources, and organization, the Electromagnetic Effects Verification Plan (Annex B) defines and specifies the verification processes, analyses and tests, and the Electromagnetic Effects Verification Report (Annex C) document verification results. The EMEVP and the EMEVR are the vehicles for tailoring this standard.
PDF Catalog
PDF Pages | PDF Title |
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3 | 5.2.6.2 Bonding of EUT 5.2.6.3 Shock and vibration isolators 5.2.6.4 Safety grounds 5.2.6.5 Orientation of EUTs |
11 | 1 Scope |
12 | 2 Normative references |
13 | 3 Terms, definitions and abbreviated terms 3.1 Terms from other standards |
14 | 3.2 Terms specific to the present standard |
16 | 3.3 Abbreviated terms |
18 | 4 Requirements 4.1 General system requirements 4.2 Detailed system requirements 4.2.1 Overview 4.2.2 EMC with the launch system 4.2.2.1 Overview 4.2.2.2 Detailed system requirements |
19 | 4.2.3 Lightning environment 4.2.3.1 Overview 4.2.3.2 Requirements to the space system 4.2.4 Spacecraft charging and effects 4.2.4.1 Overview 4.2.4.2 EMI control requirements to system and equipment in relation with ESD |
20 | 4.2.5 Spacecraft DC magnetic emission 4.2.5.1 Spacecraft with susceptible payload 4.2.5.2 Attitude control system (ACS) 4.2.6 Radiofrequency compatibility |
21 | 4.2.7 Hazards of electromagnetic radiation 4.2.8 Intrasystem EMC 4.2.9 EMC with ground equipment |
22 | 4.2.10 Grounding 4.2.10.1 Overview 4.2.10.2 Requirements 4.2.11 Electrical bonding requirements 4.2.11.1 Overview |
23 | 4.2.11.2 Normative provisions 4.2.11.3 External grounds |
24 | 4.2.12 Shielding (excepted wires and cables) 4.2.12.1 Overview 4.2.12.2 Requirement 4.2.13 Wiring (including wires and cables shielding) 4.2.13.1 Classification of cables 4.2.13.2 Cable shields |
26 | 5 Verification 5.1 Overview 5.1.1 Introduction 5.1.2 Electromagnetic effects verification plan 5.1.3 Electromagnetic effects verification report 5.2 Test conditions 5.2.1 Measurement tolerances |
27 | 5.2.2 Test site 5.2.2.1 Overview 5.2.2.2 Shielded enclosures |
28 | 5.2.2.3 Ambient electromagnetic level 5.2.2.4 Ambient conducted level |
29 | 5.2.3 Ground plane 5.2.3.1 General 5.2.3.2 Metallic ground plane 5.2.3.3 Composite ground plane 5.2.4 Power source impedance |
31 | 5.2.5 General test precautions 5.2.5.1 Safety 5.2.5.2 Excess personnel and equipment 5.2.5.3 Overload precautions 5.2.6 EUT test configurations 5.2.6.1 General |
33 | 5.2.6.6 Construction and arrangement of EUT cables |
34 | 5.2.6.7 Electrical and mechanical interfaces 5.2.7 Operation of EUT 5.2.7.1 General |
35 | 5.2.7.2 Operating frequencies for tuneable RF equipment 5.2.7.3 Operating frequencies for spread spectrum equipment 5.2.7.4 Susceptibility monitoring 5.2.8 Use of measurement equipment 5.2.8.1 Overview |
36 | 5.2.8.2 Detector 5.2.8.3 Calibration fixture (jig) |
37 | 5.2.9 Emission testing 5.2.9.1 Bandwidths 5.2.9.2 Emission identification 5.2.9.3 Frequency scanning |
38 | 5.2.9.4 Emission data presentation 5.2.10 Susceptibility testing 5.2.10.1 Frequency stepping |
39 | 5.2.10.2 Modulation of susceptibility signals 5.2.10.3 Thresholds of susceptibility |
40 | 5.2.10.4 Susceptibility data presentation 5.2.11 Calibration of measuring equipment 5.2.11.1 General 5.2.11.2 Measurement system test |
41 | 5.2.12 Power bus voltage 5.2.13 Photographic data 5.3 System level 5.3.1 General 5.3.2 Safety margin demonstration for critical or EED circuits 5.3.3 EMC with the launch system |
42 | 5.3.4 Lightning 5.3.5 Spacecraft and static charging 5.3.6 Spacecraft DC magnetic field emission 5.3.7 Intra–system electromagnetic compatibility |
43 | 5.3.8 Radiofrequency compatibility 5.3.9 Grounding 5.3.10 Electrical bonding 5.3.11 Wiring and shielding 5.4 Equipment and subsystem level test procedures 5.4.1 Overview |
44 | 5.4.2 CE, power leads, differential mode, 30 Hz to 100 kHz 5.4.2.1 Purpose 5.4.2.2 Test equipment 5.4.2.3 Setup |
45 | 5.4.2.4 Procedure |
46 | 5.4.3 CE, power and signal leads, 50 kHz to 100 MHz 5.4.3.1 Purpose 5.4.3.2 Test equipment |
47 | 5.4.3.3 Setup |
48 | 5.4.3.4 Procedures |
49 | 5.4.4 CE, power leads, inrush current 5.4.4.1 Purpose 5.4.4.2 Test equipment 5.4.4.3 Setup |
50 | 5.4.4.4 Procedures |
51 | 5.4.4.5 Data presentation |
52 | 5.4.5 DC Magnetic field emission, magnetic moment 5.4.5.1 Overview 5.4.5.2 Set-Up |
53 | 5.4.5.3 Test sequence 5.4.5.4 Data presentation |
54 | 5.4.6 RE, electric field, 30 MHz to 18 GHz 5.4.6.1 Purpose |
55 | 5.4.6.2 Test equipment 5.4.6.3 Test setup |
57 | 5.4.6.4 Test procedures |
58 | 5.4.6.5 Data Presentation |
59 | 5.4.7 CS, power leads, 30 Hz to 100 kHz 5.4.7.1 Purpose 5.4.7.2 Test equipment 5.4.7.3 Setup |
60 | 5.4.7.4 Procedures |
61 | 5.4.8 CS, bulk cable injection, 50 kHz to 100 MHz 5.4.8.1 Purpose 5.4.8.2 Test equipment |
62 | 5.4.8.3 Setup 5.4.8.4 Test procedures |
65 | 5.4.9 CS, power leads, transients 5.4.9.1 Purpose 5.4.9.2 Test equipment |
66 | 5.4.9.3 Setup |
68 | 5.4.9.4 Procedures |
69 | 5.4.10 RS, magnetic field, 30 Hz to 100 kHz 5.4.10.1 Purpose 5.4.10.2 Test equipment 5.4.10.3 Setup |
70 | 5.4.10.4 Test procedures |
71 | 5.4.10.5 Data Presentation |
72 | 5.4.11 RS, electric field, 30 MHz to 18 GHz 5.4.11.1 Purpose and overview 5.4.11.2 Test equipment |
73 | 5.4.11.3 Test setup |
75 | 5.4.11.4 Test procedures |
77 | 5.4.11.5 Test report content and data presentation |
78 | 5.4.12 Susceptibility to wire-coupled electrostatic discharges (legacy method) 5.4.12.1 Overview 5.4.12.2 Test equipment |
79 | 5.4.12.3 Setup |
82 | 5.4.12.4 Procedure |
83 | 5.4.12.5 Data presentation 5.4.13 Susceptibility to wire-coupled electrostatic discharges (current injection probe method) 5.4.13.1 Overview |
84 | 5.4.13.2 Test equipment 5.4.13.3 Calibration |
85 | 5.4.13.4 EUT testing |
86 | 5.4.13.5 Data presentation 5.4.14 Susceptibility to electrostatic discharges into the chassis 5.4.14.1 Overview 5.4.14.2 Test equipment |
87 | 5.4.14.3 Test setup 5.4.14.4 Procedure |
89 | 5.4.14.5 Data presentation 5.4.15 CE, power leads, time domain 5.4.15.1 Purpose 5.4.15.2 Test equipment 5.4.15.3 Test setup |
90 | 5.4.15.4 Procedure 5.4.15.5 Data presentation |