ASTM-E427 2006

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E427-95(2006) Standard Practice for Testing for Leaks Using the Halogen Leak Detector(Alkali-Ion Diode)

Published By	Publication Date	Number of Pages
ASTM	2006	7

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Categories: 31.080.01 - Semiconductor devices in general, ASTM

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Description

ASTM E427-95-Reapproved2006

Withdrawn Standard: Standard Practice for Testing for Leaks Using the Halogen Leak Detector(Alkali-Ion Diode) (Withdrawn 2013)

ASTM E427

Scope

1.1 This practice covers procedures for testing and locating the sources of gas leaking at the rate of 2.2 10 ¹⁴ mol/s (5 10¹⁰ Std cm³/s). The test may be conducted on any device or component across which a pressure differential of halogen tracer gas may be created, and on which the effluent side of the area to be leak tested is accessible for probing with the halogen leak detector.

1.2 Five methods are described:

1.2.1 Method A – Direct probing with no significant halogen contamination in the atmosphere.

1.2.2 Method B – Direct probing with significant halogen contamination in the atmosphere.

1.2.3 Method C – Shroud test.

1.2.4 Method D – Air-curtain shroud test.

1.2.5 Method E Accumulation test.

1.3 The values stated in inch-pound units are to be regarded as the standard. The metric equivalents of inch-pound units may be approximate.

This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Keywords

freon leak testing; halogen leak testing; heated anode halogen detection; leak testing

ICS Code

ICS Number Code 31.080.01 (Semi-conductor devices in general)

DOI: 10.1520/E0427-95R06

PDF Catalog

PDF Pages	PDF Title
1	Scope Referenced Documents Terminology Summary of Practice
2	Personnel Qualification Significance and Use FIG. 1 FIG. 2
3	Interferences FIG. 3 FIG. 4 FIG. 5 FIG. 6
4	Apparatus Material Calibration Procedure
7	Keywords FIG. 7

Additional information

Standard Title	E427-95(2006) Standard Practice for Testing for Leaks Using the Halogen Leak Detector(Alkali-Ion Diode)
Published Code	ASTM
Publication Date	2006
Pages Count	7
ICS Codes	31.080.01 - Semiconductor devices in general