ASTM-B878 2003

$35.75

B878-97(2003) Standard Test Method for Nanosecond Event Detection for Electrical Contacts and Connectors

Published By	Publication Date	Number of Pages
ASTM	2003	4

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Categories: 17.220.20 - Measurement of electrical and magnetic quantities, ASTM

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Description

1.1 This test method describes equipment and techniques for detecting contact resistance transients yielding resistances greater than a specified value and lasting for at least a specified minimum duration.

1.2 The minimum durations specified in this standard are 1, 10, and 50 nanoseconds (ns).

1.3 The minimum sample resistance required for an event detection in this standard is 10 ?.

1.4 An ASTM guide for measuring electrical contact transients of various durations is available as Guide B 854.

1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

PDF Catalog

PDF Pages	PDF Title
1	Scope Referenced Documents Terminology Significance and Use Apparatus
2	TABLE 1 FIG. 1 FIG. 2
3	Preliminary Procedures FIG. 3 FIG. 4 FIG. 5
4	Procedure Report Precision and Bias Keywords

Additional information

Standard Title	B878-97(2003) Standard Test Method for Nanosecond Event Detection for Electrical Contacts and Connectors
Published Code	ASTM
Publication Date	2003
Pages Count	4
ICS Codes	17.220.20 - Measurement of electrical and magnetic quantities

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ASTM-B878 2003

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