{"id":363681,"date":"2024-10-20T01:46:55","date_gmt":"2024-10-20T01:46:55","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-en-iec-631852021\/"},"modified":"2024-10-26T02:48:01","modified_gmt":"2024-10-26T02:48:01","slug":"bs-en-iec-631852021","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-en-iec-631852021\/","title":{"rendered":"BS EN IEC 63185:2021"},"content":{"rendered":"
IEC 63185:2020 relates to a measurement method for complex permittivity of a dielectric substrates at microwave and millimeter-wave frequencies. This method has been developed to evaluate the dielectric properties of low-loss materials used in microwave and millimeter-wave circuits and devices. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband measurements of dielectric substrates by using one resonator, where the effect of excitation holes is taken into account accurately on the basis of the mode-matching analysis.<\/p>\n
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2<\/td>\n | undefined <\/td>\n<\/tr>\n | ||||||
5<\/td>\n | Annex ZA(normative)Normative references to international publicationswith their corresponding European publications <\/td>\n<\/tr>\n | ||||||
7<\/td>\n | English CONTENTS <\/td>\n<\/tr>\n | ||||||
8<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | 1 Scope 2 Normative references <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | 4 Measurement parameters 5 Theory and calculation equations <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | Figures Figure 1 \u2013 Structure of a circular disk resonator <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | 6 Measurement system Figure 2 \u2013 Relations between resonant frequency and relative permittivity <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | 7 Measurement procedure 7.1 Preparation of measurement apparatus 7.2 Adjustment of measurement conditions 7.3 Calibration of a vector network analyzer Figure 3 \u2013 Schematic diagram of a vector network analyzer measurement system <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | 7.4 Measurement of complex permittivity of test sample 7.5 Periodic checkup of metal in resonator Figure 4 \u2013 Frequency response of |S21| of balanced-type circular disk resonator <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | Annex A (informative)Example of measurement results and associateduncertainties for complex permittivity Tables Table A.1 \u2013 Parameters of the cavity and the sheet sample Table A.2 \u2013 The resonant frequencies and unloaded Q-factors <\/td>\n<\/tr>\n | ||||||
17<\/td>\n | Table A.3 \u2013 Measurement results of complex permittivity <\/td>\n<\/tr>\n | ||||||
18<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk resonator method<\/b><\/p>\n |