IEC 61083-3:2020 is applicable to digital recording instruments used for measurements during tests with high alternating and direct voltages and currents. It specifies the measuring characteristics and calibrations required to meet the measuring uncertainties and procedures specified in the relevant IEC standards (e.g. IEC 60060-1, IEC 60060-2, IEC 60060-3, IEC 62475, IEC 61180). This document is applicable to those digital recording instruments that will be designed and type tested according to this document. This document \u2022 defines performance requirements for digital recording instruments used during tests with alternating voltages and currents (AC) or direct voltages and currents (DC); \u2022 specifies the necessary requirements for such instruments to ensure their suitability for use under the relevant standards; \u2022 establishes the tests and procedures necessary to demonstrate their compliance; \u2022 defines the terms related to digital recording instruments with recording function and access to raw data. Examples of relevant alternating and direct voltages and currents to be measured are listed in Annex D. This International Standard has the status of a horizontal standard in accordance with IEC Guide 108.<\/p>\n
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| 2<\/td>\n | undefined <\/td>\n<\/tr>\n | ||||||
| 5<\/td>\n | Annex ZA(normative)Normative references to international publicationswith their corresponding European publications <\/td>\n<\/tr>\n | ||||||
| 6<\/td>\n | English CONTENTS <\/td>\n<\/tr>\n | ||||||
| 8<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
| 10<\/td>\n | INTRODUCTION <\/td>\n<\/tr>\n | ||||||
| 11<\/td>\n | 1 Scope 2 Normative references <\/td>\n<\/tr>\n | ||||||
| 12<\/td>\n | 3 Terms and definitions 3.1 Digital recording instruments <\/td>\n<\/tr>\n | ||||||
| 13<\/td>\n | 3.2 Rated values 3.3 Factors 3.4 Dynamic performance <\/td>\n<\/tr>\n | ||||||
| 14<\/td>\n | Figures Figure 1 \u2013 Integral non-linearity s(k) at code k <\/td>\n<\/tr>\n | ||||||
| 15<\/td>\n | 3.5 Uncertainties Figure 2 \u2013 Non-linearity d(k) and code bin width w(k) under DC conditions <\/td>\n<\/tr>\n | ||||||
| 16<\/td>\n | 3.6 Tests 4 Operating conditions <\/td>\n<\/tr>\n | ||||||
| 17<\/td>\n | 5 Calibration and test methods 5.1 Applicability 5.2 Qualification of digital recording instruments 5.3 Requirements for reference generators 5.4 Available methods for qualification of digital recording instruments Tables Table 1 \u2013 Operating conditions <\/td>\n<\/tr>\n | ||||||
| 18<\/td>\n | 5.5 Calibration 5.6 Alternative test methods 5.6.1 General 5.6.2 Test of the rise time, step response 5.6.3 Internal noise level 5.6.4 Interference test 5.6.5 Reading rate <\/td>\n<\/tr>\n | ||||||
| 19<\/td>\n | 5.7 Uncertainty contribution 5.8 Input impedance 6 Requirements for AC and DC measurements 6.1 Requirements for digital recording instruments used in approved measuring systems 6.2 Individual requirements 6.2.1 General 6.2.2 Scale factor 6.2.3 Sampling rate <\/td>\n<\/tr>\n | ||||||
| 20<\/td>\n | 6.2.4 Rated resolution 6.2.5 Rise time (bandwidth) 6.2.6 Noise level 6.2.7 Interference 6.2.8 Non-linearity of amplitude 6.2.9 Record length of digital recording instruments 6.3 Requirements for digital recording instruments used in reference measuring systems <\/td>\n<\/tr>\n | ||||||
| 21<\/td>\n | 6.4 Tests 6.4.1 General 6.4.2 Type tests 6.4.3 Routine tests 6.4.4 Performance tests Table 2 \u2013 Tests required for digital recording instruments <\/td>\n<\/tr>\n | ||||||
| 22<\/td>\n | 6.4.5 Performance checks 7 Uncertainty contributions for complete measuring systems 8 Record of performance <\/td>\n<\/tr>\n | ||||||
| 23<\/td>\n | Annex A (normative)Electromagnetic interference in high-voltage andhigh-current laboratories and test fields A.1 General A.2 Precautions A.2.1 Electromagnetic shielding A.2.2 Reduction of conducted interference from the supply line A.2.3 Reduction of interference on the signal line <\/td>\n<\/tr>\n | ||||||
| 24<\/td>\n | A.2.4 Signal transmission by optical means A.3 Tests with transient induced electromagnetic fields A.4 Tests with current injection Figure A.1 \u2013 Application of electric and magnetic fields <\/td>\n<\/tr>\n | ||||||
| 25<\/td>\n | Figure A.2 \u2013 Current injection into the shield of the cable <\/td>\n<\/tr>\n | ||||||
| 26<\/td>\n | Annex B (informative)Electromagnetic interference in high-voltage and high-current laboratories and test fields \u2013 Recommendations for digital recording instruments <\/td>\n<\/tr>\n | ||||||
| 27<\/td>\n | Table B.1 \u2013 Increased immunity levels suggested for digital recording instruments used in high-voltage environments <\/td>\n<\/tr>\n | ||||||
| 28<\/td>\n | Annex C (informative)Procedure to determine the non-linearity of amplitudeof sampling instruments Figure C.1 \u2013 Digitalization of a sinusoidal waveform with a 4 bit A\/D converter Figure C.2 \u2013 Ideal code distribution of a sinusoidal waveform digitized by a 4 bit A\/D converter <\/td>\n<\/tr>\n | ||||||
| 29<\/td>\n | Figure C.3 \u2013 Example of a non-ideal measurement of ideal sinusoidal waveform Figure C.4 \u2013 Example of the determination of the differential non-linearity <\/td>\n<\/tr>\n | ||||||
| 30<\/td>\n | Annex D (informative)Examples and considerations D.1 Suggested requirements for digital recording instruments for AC andDC voltage measurements D.1.1 Test cases <\/td>\n<\/tr>\n | ||||||
| 31<\/td>\n | D.1.2 Background D.1.3 Recommendations for digital recording instruments for AC testing (up to 60 Hz without consideration of harmonics) D.1.4 Recommendations for digital recording instruments for DC testing (without consideration of ripple) D.1.5 Recommendations for digital recording instruments for AC and DC testing under consideration of harmonics or superimposed or combined voltages D.2 Examples of relevant voltage and current characteristics to be measured <\/td>\n<\/tr>\n | ||||||
| 32<\/td>\n | Table D.1 \u2013 Relevant voltages and currents <\/td>\n<\/tr>\n | ||||||
| 33<\/td>\n | D.3 Determination of the necessary rise time of instruments <\/td>\n<\/tr>\n | ||||||
| 34<\/td>\n | D.4 Considerations regarding the large variety of AC and DC measurements <\/td>\n<\/tr>\n | ||||||
| 35<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Instruments and software used for measurement in high-voltage and high-current tests – Requirements for hardware for tests with alternating and direct voltages and currents<\/b><\/p>\n |