BS EN 60749-7:2002
$86.31
Semiconductor devices. Mechanical and climatic test methods – Internal moisture content measurement and the analysis of other residual gases
| Published By | Publication Date | Number of Pages |
| BSI | 2002 | 12 |
Aims at testing and measuring the water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. Applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace. The contents of the corrigendum of August 2003 have been included in this copy.
