{"id":445027,"date":"2024-10-20T08:39:59","date_gmt":"2024-10-20T08:39:59","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-c57-168-2023\/"},"modified":"2024-10-26T16:08:08","modified_gmt":"2024-10-26T16:08:08","slug":"ieee-c57-168-2023","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-c57-168-2023\/","title":{"rendered":"IEEE C57.168-2023"},"content":{"rendered":"
New IEEE Standard – Active. Provided in this guide for low frequency dielectric testing for distribution, power, and regulating transformers are background on various low frequency test methods as well as guidance on how to conduct and interpret the results. Common pitfalls to avoid are presented along with compiled guidance on interpreting the results and possible methods for correcting test issues.<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
---|---|---|---|---|---|---|---|
1<\/td>\n | IEEE Std C57.168\u2122-2023 Front cover <\/td>\n<\/tr>\n | ||||||
2<\/td>\n | Title page <\/td>\n<\/tr>\n | ||||||
4<\/td>\n | Important Notices and Disclaimers Concerning IEEE Standards Documents <\/td>\n<\/tr>\n | ||||||
8<\/td>\n | Participants <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | Introduction <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | Contents <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | 1.\u2002Overview 1.1\u2002Scope 1.2\u2002Purpose 1.3\u2002Word usage 2.\u2002Normative references <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | 3.\u2002Definitions 4.\u2002Low-frequency testing overview <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | 5.\u2002Applied voltage withstand testing 5.1\u2002Alternate circuit for high voltage delta-connected windings <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | 6.\u2002Induced voltage testing of transformer 6.1\u2002Performing induced testing on distribution and Class I transformers 6.2\u2002Performing induced testing on Class II power transformers <\/td>\n<\/tr>\n | ||||||
20<\/td>\n | 6.3\u2002Selection of the tap changer position <\/td>\n<\/tr>\n | ||||||
22<\/td>\n | 7.\u2002Insulation power factor and capacitance testing 7.1\u2002Theory <\/td>\n<\/tr>\n | ||||||
25<\/td>\n | 7.2\u2002Test preparation 7.3\u2002Insulation power factor test connection for a two-winding transformer <\/td>\n<\/tr>\n | ||||||
27<\/td>\n | 7.4\u2002Insulation power factor test connection for a three-winding transformer <\/td>\n<\/tr>\n | ||||||
29<\/td>\n | 7.5\u2002Test result analysis <\/td>\n<\/tr>\n | ||||||
30<\/td>\n | 7.6\u2002Effect of core interlaminar resistance on measured insulation power factor <\/td>\n<\/tr>\n | ||||||
34<\/td>\n | 7.7\u2002Test instruments <\/td>\n<\/tr>\n | ||||||
35<\/td>\n | Annex A (informative) Measurement of ac voltage during low-frequency dielectric tests A.1\u2002Extracted from IEEE Std 4-2013 [B4] A.2\u2002Voltage measurement requirements <\/td>\n<\/tr>\n | ||||||
37<\/td>\n | Annex B (informative) Bibliography <\/td>\n<\/tr>\n | ||||||
38<\/td>\n | Back cover <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" IEEE Guide for Low-Frequency Dielectric Testing for Distribution, Power, and Regulating Transformers (Published)<\/b><\/p>\n |