{"id":437084,"date":"2024-10-20T07:57:24","date_gmt":"2024-10-20T07:57:24","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-c57-100-2022\/"},"modified":"2024-10-26T14:59:32","modified_gmt":"2024-10-26T14:59:32","slug":"ieee-c57-100-2022","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-c57-100-2022\/","title":{"rendered":"IEEE C57.100-2022"},"content":{"rendered":"
Revision Standard – Active. A series of test procedures to provide uniform methods for investigating the effects of operating temperature on the life expectancy of liquid-immersed transformers or insulation systems is provided. The test procedures are intended to provide data for the selection of a limiting hottest-spot temperature for rating purposes, provide data which may serve as the basis for a guide for loading, and permit the comparative evaluation of a proposed insulation system with reference to a system that has proven to be acceptable in service.<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
---|---|---|---|---|---|---|---|
1<\/td>\n | IEEE Std C57.100\u2122-2022 Front cover <\/td>\n<\/tr>\n | ||||||
2<\/td>\n | Title page <\/td>\n<\/tr>\n | ||||||
4<\/td>\n | Important Notices and Disclaimers Concerning IEEE Standards Documents <\/td>\n<\/tr>\n | ||||||
8<\/td>\n | Participants <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | Introduction <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | Contents <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | 1.\u2002Overview 1.1\u2002Scope 1.2\u2002Purpose 1.3\u2002Word usage <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | 2.\u2002Normative references <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | 3.\u2002Definitions, acronyms, and abbreviations 3.1\u2002Definitions <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | 3.2\u2002Acronyms and abbreviations 4.\u2002Relative thermal index aging testing 4.1\u2002General <\/td>\n<\/tr>\n | ||||||
17<\/td>\n | 4.2\u2002Aging influences 4.3\u2002Minimum life expectancy 4.4\u2002Criteria for end-of-life <\/td>\n<\/tr>\n | ||||||
18<\/td>\n | 5.\u2002Sealed tube aging test 5.1\u2002Purpose 5.2\u2002General requirements 5.3\u2002Test equipment <\/td>\n<\/tr>\n | ||||||
20<\/td>\n | 5.4\u2002Test samples <\/td>\n<\/tr>\n | ||||||
22<\/td>\n | 5.5\u2002Test sample preparation and testing <\/td>\n<\/tr>\n | ||||||
24<\/td>\n | 6.\u2002Dual-temperature sealed tube aging test 6.1\u2002Purpose of test 6.2\u2002General requirements 6.3\u2002Test equipment <\/td>\n<\/tr>\n | ||||||
25<\/td>\n | 6.4\u2002Test samples <\/td>\n<\/tr>\n | ||||||
26<\/td>\n | 6.5\u2002Test sample preparation and testing <\/td>\n<\/tr>\n | ||||||
27<\/td>\n | 7.\u2002Three-point aging test procedure 7.1\u2002General 7.2\u2002Determination of end-of-life for the IPS <\/td>\n<\/tr>\n | ||||||
28<\/td>\n | 7.3\u2002Selection of aging times and temperatures for CS <\/td>\n<\/tr>\n | ||||||
29<\/td>\n | 7.4\u2002Analysis of the aging results <\/td>\n<\/tr>\n | ||||||
32<\/td>\n | 8.\u2002Test report <\/td>\n<\/tr>\n | ||||||
33<\/td>\n | Annex\u00a0A (normative) Distribution transformer test A.1\u2002Test specimens A.2\u2002Test method <\/td>\n<\/tr>\n | ||||||
35<\/td>\n | A.3\u2002Test report <\/td>\n<\/tr>\n | ||||||
38<\/td>\n | Annex\u00a0B (normative) Power transformer test B.1\u2002Test specimens B.2\u2002Test method <\/td>\n<\/tr>\n | ||||||
41<\/td>\n | B.3\u2002Test report <\/td>\n<\/tr>\n | ||||||
43<\/td>\n | Annex\u00a0C (normative) Modifications to an already qualified CS C.1\u2002Purpose C.2\u2002Modifications requiring new full three-point aging test evaluation C.3\u2002Modifications requiring abbreviated single-point verification test evaluation <\/td>\n<\/tr>\n | ||||||
44<\/td>\n | C.4\u2002Modifications where additional testing is not required C.5\u2002Abbreviated single-point verification test procedure for a modified CS <\/td>\n<\/tr>\n | ||||||
45<\/td>\n | Annex\u00a0D (normative) Standard test procedure for qualification of thermally upgraded paper D.1\u2002Single-point sealed tube aging test procedure for qualification of thermally upgraded paper D.2\u2002Evaluation of single-point sealed tube aging test <\/td>\n<\/tr>\n | ||||||
46<\/td>\n | Annex\u00a0E (informative) Modified aging test for use in determining the thermal class of enameled conductors used in liquid-immersed transformers E.1\u2002Background E.2\u2002New modified aging test method for enameled conductors in liquid-immersed transformers <\/td>\n<\/tr>\n | ||||||
54<\/td>\n | E.3\u2002Experimental verification of the new modified aging test and thermal index qualification method <\/td>\n<\/tr>\n | ||||||
57<\/td>\n | Annex\u00a0F (informative) Consideration of material weight ratios F.1\u2002Examples of transformers leading to actual weight ratios in Table\u00a03 <\/td>\n<\/tr>\n | ||||||
59<\/td>\n | F.2\u2002Calculation of core steel surface ratio F.3\u2002Bare copper conductor surface ratio <\/td>\n<\/tr>\n | ||||||
60<\/td>\n | Annex\u00a0G (informative) Thermal screening test G.1\u2002Purpose G.2\u2002Procedure <\/td>\n<\/tr>\n | ||||||
61<\/td>\n | G.3\u2002Other uses for the screening test <\/td>\n<\/tr>\n | ||||||
62<\/td>\n | Annex\u00a0H (informative) Bibliography <\/td>\n<\/tr>\n | ||||||
64<\/td>\n | Back cover <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" IEEE Standard for Test Procedure for Thermal Evaluation of Insulation Systems for Liquid-Immersed Distribution, Power, and Regulating Transformers (Approved Draft)<\/b><\/p>\n |