| PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
|---|---|---|---|---|---|---|---|
| 2<\/td>\n | undefined <\/td>\n<\/tr>\n | ||||||
| 7<\/td>\n | CONTENTS <\/td>\n<\/tr>\n | ||||||
| 11<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
| 13<\/td>\n | INTRODUCTION <\/td>\n<\/tr>\n | ||||||
| 14<\/td>\n | 1 Scope 2 Normative references <\/td>\n<\/tr>\n | ||||||
| 15<\/td>\n | 3 Terms, definitions, physical quantities, units and abbreviations 3.1 Terms and definitions <\/td>\n<\/tr>\n | ||||||
| 17<\/td>\n | 3.2 Physical quantities and units Tables Table 1 \u2013 Physical quantities and units <\/td>\n<\/tr>\n | ||||||
| 18<\/td>\n | 3.3 Abbreviations 4 Limits 4.1 General 4.2 Unintentional radiating part of lighting equipment 4.2.1 General <\/td>\n<\/tr>\n | ||||||
| 19<\/td>\n | 4.2.2 Lighting equipment deemed to comply with the Van der Hoofden test without testing 4.2.3 Application of limits 4.3 Intentional radiating part of lighting equipment <\/td>\n<\/tr>\n | ||||||
| 20<\/td>\n | 5 General requirements Van der Hoofden test 5.1 Measurand 5.2 Supply voltage and frequency Figures Figure 1 \u2013 Compliance routes and pass\/fail criteria for lighting equipment <\/td>\n<\/tr>\n | ||||||
| 21<\/td>\n | 5.3 Measurement frequency range 5.4 Ambient temperature 5.5 Measurement equipment requirements Table 2 \u2013 Receiver or spectrum analyser settings <\/td>\n<\/tr>\n | ||||||
| 22<\/td>\n | Figure 2 \u2013 The Van der Hoofden test head Figure 3 \u2013 Example of a protection circuit <\/td>\n<\/tr>\n | ||||||
| 23<\/td>\n | 5.6 Measurement instrumentation uncertainty 5.7 Test report 5.8 Evaluation of results 6 Measurement procedure for the Van der Hoofden test 6.1 General <\/td>\n<\/tr>\n | ||||||
| 24<\/td>\n | 6.2 Operating conditions 6.2.1 Operating conditions for lighting equipment 6.2.2 Operating conditions for specific lighting equipment 6.2.3 Operating conditions for lighting equipment with intentional radiators 6.3 Measurement distance 6.4 Measurement set-up 6.4.1 General <\/td>\n<\/tr>\n | ||||||
| 25<\/td>\n | 6.4.2 Measurement set-up for specific lighting equipment 6.5 Location of measurement test head Figure 4 \u2013 Measurement set-up <\/td>\n<\/tr>\n | ||||||
| 26<\/td>\n | 6.6 Calculation of the results 7 Assessment procedure intentional radiators 7.1 General 7.2 Low-power exclusion method 7.2.1 General 7.2.2 Determination of the total radiated power 7.2.3 Determination of the low-power exclusion level <\/td>\n<\/tr>\n | ||||||
| 27<\/td>\n | 7.2.4 Summation of multiple transmitters 7.3 Application of the EMF product standard for body worn-equipment 7.4 Application of the EMF product standard for base stations 7.5 Application of another EMF standard <\/td>\n<\/tr>\n | ||||||
| 28<\/td>\n | Figure 5 \u2013 Compliance demonstration procedure for the intentional-transmitter part of the lighting equipment <\/td>\n<\/tr>\n | ||||||
| 29<\/td>\n | Annexes Annex A (normative) Measurement distances Table A.1 \u2013 Lighting equipment and measurement distances <\/td>\n<\/tr>\n | ||||||
| 30<\/td>\n | Annex B (informative) Location of measurement test head Figure B.1 \u2013 Location of measurement point in the transverse direction of lighting equipment \u2013 side view Figure B.2 \u2013 Location of measurement points in the longitude direction of lighting equipment \u2013 side view <\/td>\n<\/tr>\n | ||||||
| 31<\/td>\n | Figure B.3 \u2013 Location of measurement points in the longitude direction of lighting equipment; in the direction of illumination Figure B.4 \u2013 Location of measurement point for lighting equipment with rotationally symmetrical dimensions <\/td>\n<\/tr>\n | ||||||
| 32<\/td>\n | Figure B.5 \u2013 Location of measurement point for lighting equipment with rotationally symmetrical dimensions; in the direction of illumination Figure B.6 \u2013 Location of measurement point for lighting equipment with the same dimensions in the x- and y- axis <\/td>\n<\/tr>\n | ||||||
| 33<\/td>\n | Figure B.7 \u2013 Location of measurement point(s) for lighting equipment with single capped lamp (360\u00b0 illumination) Figure B.8 \u2013 Location of measurement points for lighting equipment with a remote controlgear <\/td>\n<\/tr>\n | ||||||
| 34<\/td>\n | Figure B.9 \u2013 Location of measurement point for an independent electronic converter Figure B.10 \u2013 Location of measurement point(s) for an uplighter (floor standing\/suspended) <\/td>\n<\/tr>\n | ||||||
| 35<\/td>\n | Annex C (informative) Exposure limits C.1 General C.2 ICNIRP basic restrictions C.2.1 Basic restrictions – SAR C.2.2 Basic restrictions \u2013 Internal electric field C.2.3 Changes introduced by ICNIRP 2020 with respect to ICNIRP 1998 and ICNIRP 2010 Table C.1 \u2013 Basic restrictions for general public exposure to time varying electric and magnetic fields for frequencies between 100 kHz and 300 GHz Table C.2 \u2013 Basic restrictions for general public exposure to time varying electric and magnetic fields for frequencies up to 10 MHz <\/td>\n<\/tr>\n | ||||||
| 36<\/td>\n | C.3 IEEE Table C.3 \u2013 IEEE basic restrictions (BR) for the general public Table C.4 \u2013 IEEE basic restrictions (BR) between 100 kHz and 3 GHz for the general public <\/td>\n<\/tr>\n | ||||||
| 37<\/td>\n | Annex D (informative) Rationale measurement and assessment method D.1 General D.2 Induced internal electric field D.2.1 General Figure D.1 \u2013 Overview measurement and assessment method <\/td>\n<\/tr>\n | ||||||
| 39<\/td>\n | D.2.2 Induced electric field due to the magnetic field; Eeddy(fi,dloop) Figure D.2 \u2013 Distances of the head, loop and measurement set-up <\/td>\n<\/tr>\n | ||||||
| 40<\/td>\n | Table D.1 \u2013 Induced internal electric field calculations <\/td>\n<\/tr>\n | ||||||
| 41<\/td>\n | Figure D.3 \u2013 Maximum current in the 2 m LLA as function of the frequency <\/td>\n<\/tr>\n | ||||||
| 43<\/td>\n | Figure D.4 \u2013 Induced internal electric field and associated limit levels <\/td>\n<\/tr>\n | ||||||
| 44<\/td>\n | D.2.3 Induced electric field due to the electric field; Ecap(fi,d) Figure D.5 \u2013 Example of magnetic-field test result using the LLA <\/td>\n<\/tr>\n | ||||||
| 45<\/td>\n | Figure D.6 \u2013 Distances of the head and measurement set-up Figure D.7 \u2013 Plot of Equation (D.20) <\/td>\n<\/tr>\n | ||||||
| 46<\/td>\n | Table D.2 \u2013 Calculation main contributions <\/td>\n<\/tr>\n | ||||||
| 47<\/td>\n | D.3 Thermal effects from 100 kHz to 300 GHz D.3.1 General Table D.3 \u2013 Frequency steps for the amplitude addition that equals 1,11 times B6 <\/td>\n<\/tr>\n | ||||||
| 48<\/td>\n | D.3.2 The 100 kHz to 30 MHz contribution to the thermal effects Table D.4 \u2013 Frequency steps for the power addition that equals 0,833 times B6 <\/td>\n<\/tr>\n | ||||||
| 49<\/td>\n | D.3.3 The 30 MHz to 300 MHz contribution to the thermal effects Figure D.8 \u2013 Example of the CM-current measured using a conducted emission test Table D.5 \u2013 Field strength limits according to CISPR 15 <\/td>\n<\/tr>\n | ||||||
| 50<\/td>\n | D.3.4 Overall conclusion for the contribution to thermal effects <\/td>\n<\/tr>\n | ||||||
| 51<\/td>\n | Annex E (normative) Practical internal electric-field measurement and assessment method E.1 Measurement of induced internal electric field E.2 Calculation program <\/td>\n<\/tr>\n | ||||||
| 52<\/td>\n | E.3 Compliance criterion for the Van der Hoofden head test Table E.1 \u2013 Conductivity as a function of frequency (see Table C.1 of IEC 62311:2007) <\/td>\n<\/tr>\n | ||||||
| 53<\/td>\n | Annex F (normative) Protection network F.1 Calibration of the protection network Figure F.1 \u2013 Test set-up for normalization of the network analyser <\/td>\n<\/tr>\n | ||||||
| 54<\/td>\n | F.2 Calculation of the theoretical characteristic of the protection network Figure F.2 \u2013 Test set-up for measurement of the voltage division factor using a network analyser <\/td>\n<\/tr>\n | ||||||
| 55<\/td>\n | Figure F.3 \u2013 Calculated theoretical characteristic for the calibration of the protection network <\/td>\n<\/tr>\n | ||||||
| 56<\/td>\n | Annex G (informative) Measurement instrumentation uncertainty Table G.1 \u2013 Uncertainty calculation for the measurement method described in Clauses 5 and 6 in the frequency range from 20 kHz to 10 MHz <\/td>\n<\/tr>\n | ||||||
| 57<\/td>\n | Table G.2 \u2013 Comments and information to Table G.1 <\/td>\n<\/tr>\n | ||||||
| 58<\/td>\n | Annex H (informative) Equipment deemed to comply <\/td>\n<\/tr>\n | ||||||
| 59<\/td>\n | Figure H.1 \u2013 Flow chart to determine applicability deemed to comply without F factor measurement <\/td>\n<\/tr>\n | ||||||
| 60<\/td>\n | Annex I (informative) Intentional radiators I.1 General I.2 Intentional radiators in lighting equipment I.3 Properties of antennas in lighting applications <\/td>\n<\/tr>\n | ||||||
| 61<\/td>\n | Table I.1 \u2013 Overview of wireless radio technologies that might be applied in lighting systems <\/td>\n<\/tr>\n | ||||||
| 62<\/td>\n | Figure I.1 \u2013 Luminaire with a transmitting antenna in a room <\/td>\n<\/tr>\n | ||||||
| 63<\/td>\n | Figure I.2 \u2013 Impact of a conducting ceiling\/plane <\/td>\n<\/tr>\n | ||||||
| 64<\/td>\n | Figure I.3 \u2013 Electric field of a small electrical dipole: analytical formula vs far-field approximation <\/td>\n<\/tr>\n | ||||||
| 65<\/td>\n | Figure I.4 \u2013 Electric field as a function of distance, antenna gain and input power (far-field approximation) <\/td>\n<\/tr>\n | ||||||
| 66<\/td>\n | I.4 Exposure assessment approach I.4.1 General I.4.2 Determination of average total radiated power Pint,rad Figure I.5 \u2013 Impact of pulsed signals on the average exposure <\/td>\n<\/tr>\n | ||||||
| 67<\/td>\n | I.4.3 Determination of the low-power exclusion level Pmax I.5 Multiple transmitters in a luminaire <\/td>\n<\/tr>\n | ||||||
| 68<\/td>\n | I.6 Exposure to multiple luminaires I.7 References in Annex I <\/td>\n<\/tr>\n | ||||||
| 70<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Assessment of lighting equipment related to human exposure to electromagnetic fields<\/b><\/p>\n |