{"id":290788,"date":"2024-10-19T19:44:15","date_gmt":"2024-10-19T19:44:15","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-iso-159322013\/"},"modified":"2024-10-25T16:44:52","modified_gmt":"2024-10-25T16:44:52","slug":"bs-iso-159322013","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-iso-159322013\/","title":{"rendered":"BS ISO 15932:2013"},"content":{"rendered":"

This International Standard defines terms used in the practice of AEM. It covers both general and specific concepts classified according to their hierarchy in a systematic order.<\/p>\n

This International Standard is applicable to all standardization documents relevant to the practice of AEM. In addition, some parts of this International Standard are applicable to those documents relevant to the practice of related fields (e.g. TEM, STEM, SEM, EPMA, EDX) for the definition of those terms common to them.<\/p>\n

\n

NOTE See also the ISO online browsing platform (OBP): \/2<\/p>\n<\/blockquote>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
6<\/td>\nForeword <\/td>\n<\/tr>\n
7<\/td>\nIntroduction <\/td>\n<\/tr>\n
9<\/td>\nSection sec_0
Section sec_1
0\tScope
1\tAbbreviated terms <\/td>\n<\/tr>\n
10<\/td>\nSection sec_2
Section sec_2.1
Section sec_2.1.1
Section sec_2.1.1.1
Section sec_2.1.1.2
Section sec_2.1.2
Section sec_2.1.2.1
Section sec_2.1.2.2
Section sec_2.1.2.2.1
Section sec_2.1.2.2.2
2\tDefinitions of terms used in the physical basis of AEM <\/td>\n<\/tr>\n
11<\/td>\nSection sec_2.1.3
Section sec_2.1.3.1
Section sec_2.1.3.2
Section sec_2.1.4
Section sec_2.1.5
Section sec_2.2
Section sec_2.2.1
Section sec_2.2.1.1
Section sec_2.2.2
Section sec_2.2.2.1 <\/td>\n<\/tr>\n
12<\/td>\nSection sec_2.2.2.2
Section sec_2.2.2.3
Section sec_2.2.2.4
Section sec_2.2.3
Section sec_2.3
Section sec_2.3.1
Section sec_2.3.2
Section sec_2.4
Section sec_2.5
Section sec_2.5.1
Section sec_2.5.2 <\/td>\n<\/tr>\n
13<\/td>\nSection sec_2.5.3
Section sec_2.5.4
Section sec_2.5.5
Section sec_2.6
Section sec_2.6.1
Section sec_2.7
Section sec_2.8
Section sec_2.9
Section sec_3
Section sec_3.1
Section sec_3.1.1
Section sec_3.1.2
3\tDefinitions of terms used in AEM instrumentation <\/td>\n<\/tr>\n
14<\/td>\nSection sec_3.1.2.1
Section sec_3.1.2.2
Section sec_3.1.2.3
Section sec_3.1.3
Section sec_3.1.3.1
Section sec_3.1.3.2
Section sec_3.1.3.3
Section sec_3.1.3.4
Section sec_3.1.3.5
Section sec_3.1.3.6
Section sec_3.1.4 <\/td>\n<\/tr>\n
15<\/td>\nSection sec_3.1.5
Section sec_3.1.6
Section sec_3.1.7
Section sec_3.2
Section sec_3.2.1
Section sec_3.2.2
Section sec_3.2.2.1
Section sec_3.2.2.2
Section sec_3.2.2.3 <\/td>\n<\/tr>\n
16<\/td>\nSection sec_3.2.3
Section sec_3.2.3.1
Section sec_3.2.3.2
Section sec_3.2.3.3
Section sec_3.2.3.4
Section sec_3.2.3.5
Section sec_3.2.4
Section sec_3.2.5
Section sec_3.2.5.1
Section sec_3.2.6
Section sec_3.2.7
Section sec_3.2.8
Section sec_3.2.8.1 <\/td>\n<\/tr>\n
17<\/td>\nSection sec_3.2.9
Section sec_3.2.9.1
Section sec_3.2.10
Section sec_3.3
Section sec_3.4
Section sec_3.4.1
Section sec_3.4.2
Section sec_3.4.3
Section sec_3.4.4
Section sec_3.4.5
Section sec_3.4.6
Section sec_3.4.7
Section sec_3.4.8 <\/td>\n<\/tr>\n
18<\/td>\nSection sec_3.5
Section sec_3.6
Section sec_3.7
Section sec_3.7.1
Section sec_4
Section sec_4.1
Section sec_4.2
Section sec_4.3
Section sec_4.4
Section sec_4.5
Section sec_4.5.1
Section sec_4.6
4\tDefinitions of terms used in specimen preparation of AEM <\/td>\n<\/tr>\n
19<\/td>\nSection sec_4.7
Section sec_4.8
Section sec_4.9
Section sec_4.10
Section sec_4.11
Section sec_4.12
Section sec_5
Section sec_5.1
Section sec_5.2
Section sec_5.3
5\tDefinitions of terms used in AEM image formation and processing <\/td>\n<\/tr>\n
20<\/td>\nSection sec_5.4
Section sec_5.4.1
Section sec_5.4.1.1
Section sec_5.4.1.2
Section sec_5.5
Section sec_5.6
Section sec_5.7
Section sec_5.8
Section sec_5.9
Section sec_5.9.1
Section sec_5.9.2 <\/td>\n<\/tr>\n
21<\/td>\nSection sec_5.9.3
Section sec_5.9.4
Section sec_5.9.5
Section sec_5.9.6
Section sec_6
Section sec_6.1
Section sec_6.1.1
Section sec_6.1.2
Section sec_6.1.3
Section sec_6.1.4
Section sec_6.2
6\tDefinitions of terms used in AEM image interpretation and analysis <\/td>\n<\/tr>\n
22<\/td>\nSection sec_6.2.1
Section sec_6.3
Section sec_6.4
Section sec_6.4.1
Section sec_6.4.2
Section sec_6.4.3
Section sec_6.5
Section sec_6.5.1
Section sec_6.5.1.1
Section sec_6.5.1.2
Section sec_6.5.2
Section sec_6.5.3
Section sec_6.5.4 <\/td>\n<\/tr>\n
23<\/td>\nSection sec_6.6
Section sec_6.6.1
Section sec_6.6.2
Section sec_6.6.3
Section sec_6.6.4
Section sec_6.6.5
Section sec_6.6.6
Section sec_6.6.7
Section sec_6.6.8
Section sec_6.6.9
Section sec_6.6.9.1 <\/td>\n<\/tr>\n
24<\/td>\nSection sec_6.6.10
Section sec_6.7
Section sec_6.8
Section sec_6.9
Section sec_6.10
Section sec_6.11
Section sec_6.12
Section sec_6.12.1
Section sec_6.12.2
Section sec_6.12.3
Section sec_6.13 <\/td>\n<\/tr>\n
25<\/td>\nSection sec_7
Section sec_7.1
Section sec_7.2
Section sec_7.2.1
Section sec_7.2.2
Section sec_7.3
Section sec_7.4
Section sec_7.5
Section sec_7.6
Section sec_7.7
7\tDefinitions of terms used in the measurement and calibration of AEM image magnification and resolution <\/td>\n<\/tr>\n
26<\/td>\nSection sec_7.8
Section sec_7.8.1
Section sec_7.9
Section sec_7.10
Section sec_8
Section sec_8.1
Section sec_8.2
Section sec_8.3
Section sec_8.3.1
8\tDefinitions of terms used in electron diffraction in AEM <\/td>\n<\/tr>\n
27<\/td>\nSection sec_8.3.2
Section sec_8.3.3
Section sec_8.3.3.1
Section sec_8.3.3.2
Section sec_8.3.4
Section sec_8.3.5
Section sec_8.3.6
Section sec_8.4
Section sec_8.5
Section sec_8.5.1
Section sec_8.5.2
Section sec_8.5.3
Section sec_8.5.3.1 <\/td>\n<\/tr>\n
28<\/td>\nSection sec_8.5.4
Section sec_8.5.5 <\/td>\n<\/tr>\n
29<\/td>\nReference ref_1
Reference ref_2
Reference ref_3
Reference ref_4
Reference ref_5
Reference ref_6
Reference ref_7
Reference ref_8
Reference ref_9
Reference ref_10
Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Microbeam analysis. Analytical electron microscopy. Vocabulary<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
BSI<\/b><\/a><\/td>\n2013<\/td>\n32<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":290795,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2641],"product_tag":[],"class_list":{"0":"post-290788","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-bsi","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/290788","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/290795"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=290788"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=290788"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=290788"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}