{"id":258030,"date":"2024-10-19T17:04:32","date_gmt":"2024-10-19T17:04:32","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-iso-17987-72016\/"},"modified":"2024-10-25T12:40:15","modified_gmt":"2024-10-25T12:40:15","slug":"bs-iso-17987-72016","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-iso-17987-72016\/","title":{"rendered":"BS ISO 17987-7:2016"},"content":{"rendered":"

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
7<\/td>\nForeword <\/td>\n<\/tr>\n
8<\/td>\nIntroduction <\/td>\n<\/tr>\n
11<\/td>\n1 Scope
2 Normative references
3 Terms, definitions, symbols and abbreviated terms
3.1 Terms and definitions
3.2 Symbols <\/td>\n<\/tr>\n
14<\/td>\n3.3 Abbreviated terms <\/td>\n<\/tr>\n
15<\/td>\n4 Conventions
5 EPL 12\u00a0V LIN devices with RX and TX access
5.1 Test specification overview
5.1.1 Test case organization <\/td>\n<\/tr>\n
16<\/td>\n5.1.2 Measurement and signal generation requirements <\/td>\n<\/tr>\n
17<\/td>\n5.2 Operational conditions \u2014 Calibration
5.2.1 Electrical input\/output, LIN protocol
5.2.2 [EPL\u2013CT 1] Operating voltage range <\/td>\n<\/tr>\n
18<\/td>\n5.2.3 Threshold voltages <\/td>\n<\/tr>\n
22<\/td>\n5.2.4 [EPL\u2013CT 5] Variation of VSUP_NON_OP <\/td>\n<\/tr>\n
23<\/td>\n5.2.5 IBUS under several conditions <\/td>\n<\/tr>\n
26<\/td>\n5.2.6 Slope control <\/td>\n<\/tr>\n
29<\/td>\n5.2.7 Propagation delay <\/td>\n<\/tr>\n
31<\/td>\n5.2.8 Supply voltage offset <\/td>\n<\/tr>\n
38<\/td>\n5.2.9 Failure <\/td>\n<\/tr>\n
40<\/td>\n5.2.10 [EPL\u2013CT 22] Verifying internal capacitance and dynamic interference \u2014 IUT as slave <\/td>\n<\/tr>\n
42<\/td>\n5.3 Operation mode termination
5.3.1 General <\/td>\n<\/tr>\n
43<\/td>\n5.3.2 [EPL\u2013CT 23] Measuring internal resistor \u2014 IUT as slave <\/td>\n<\/tr>\n
44<\/td>\n5.3.3 [EPL\u2013CT 24] Measuring internal resistor \u2014 IUT as master
5.4 Static test cases <\/td>\n<\/tr>\n
48<\/td>\n6 EPL 12\u00a0V LIN devices without RX and TX access
6.1 Test specification overview
6.2 Communication scheme
6.2.1 General
6.2.2 IUT as slave <\/td>\n<\/tr>\n
49<\/td>\n6.2.3 IUT as master <\/td>\n<\/tr>\n
50<\/td>\n6.2.4 IUT class C device <\/td>\n<\/tr>\n
52<\/td>\n6.3 Test case organization <\/td>\n<\/tr>\n
53<\/td>\n6.4 Measurement and signal generation \u2014 Requirements
6.4.1 Data generation <\/td>\n<\/tr>\n
55<\/td>\n6.4.2 Various requirements
6.5 Operational conditions \u2014 Calibration
6.5.1 Electrical input\/output, LIN protocol
6.5.2 [EPL\u2013CT 25] Operating voltage range <\/td>\n<\/tr>\n
57<\/td>\n6.5.3 Threshold voltages <\/td>\n<\/tr>\n
61<\/td>\n6.5.4 [EPL\u2013CT 29] Variation of VSUP_NON_OP \u2208 [\u20130,3\u00a0V to 7,0\u00a0V], [18\u00a0V to 40\u00a0V] <\/td>\n<\/tr>\n
62<\/td>\n6.5.5 IBUS under several conditions <\/td>\n<\/tr>\n
65<\/td>\n6.5.6 Slope control <\/td>\n<\/tr>\n
69<\/td>\n6.5.7 [EPL\u2013CT 35] Propagation delay <\/td>\n<\/tr>\n
75<\/td>\n6.5.8 Supply voltage offset <\/td>\n<\/tr>\n
84<\/td>\n6.5.9 Failure <\/td>\n<\/tr>\n
86<\/td>\n6.5.10 [EPL\u2013CT 48] Verifying internal capacitance and dynamic interference \u2014 IUT as slave <\/td>\n<\/tr>\n
88<\/td>\n6.6 Operation mode termination
6.6.1 General <\/td>\n<\/tr>\n
89<\/td>\n6.6.2 [EPL\u2013CT 49] Measuring internal resistor \u2014 IUT as slave
6.6.3 [EPL\u2013CT 50] Measuring internal resistor \u2014 IUT as master
6.7 Static test cases <\/td>\n<\/tr>\n
92<\/td>\n7 EPL 24\u00a0V LIN devices with RX and TX access <\/td>\n<\/tr>\n
93<\/td>\n7.1 Test specification overview
7.1.1 Test case organization
7.1.2 Measurement and signal generation \u2014 Requirements <\/td>\n<\/tr>\n
94<\/td>\n7.2 Operational conditions \u2014 Calibration
7.2.1 Electrical input\/output, LIN protocol
7.2.2 [EPL\u2013CT 51] Operating voltage range <\/td>\n<\/tr>\n
96<\/td>\n7.2.3 Threshold voltages <\/td>\n<\/tr>\n
100<\/td>\n7.2.4 [EPL\u2013CT 55] Variation of VSUP_NON_OP <\/td>\n<\/tr>\n
101<\/td>\n7.2.5 IBUS under several conditions <\/td>\n<\/tr>\n
104<\/td>\n7.2.6 Slope control <\/td>\n<\/tr>\n
107<\/td>\n7.2.7 Propagation delay <\/td>\n<\/tr>\n
108<\/td>\n7.2.8 Supply voltage offset <\/td>\n<\/tr>\n
122<\/td>\n7.2.9 Failure <\/td>\n<\/tr>\n
124<\/td>\n7.2.10 [EPL\u2013CT 80] Verifying internal capacitance and dynamic interference \u2014 IUT as slave <\/td>\n<\/tr>\n
126<\/td>\n7.3 Operation mode termination
7.3.1 General <\/td>\n<\/tr>\n
127<\/td>\n7.3.2 [EPL\u2013CT 81] Measuring internal resistor \u2014 IUT as slave
7.3.3 [EPL\u2013CT 82] Measuring internal resistor \u2014 IUT as master <\/td>\n<\/tr>\n
128<\/td>\n7.4 Static test cases <\/td>\n<\/tr>\n
131<\/td>\n8 EPL 24\u00a0V LIN devices without RX and TX access
8.1 Test specification overview
8.2 Communication scheme
8.2.1 Overview <\/td>\n<\/tr>\n
132<\/td>\n8.2.2 IUT as slave
8.2.3 IUT as master <\/td>\n<\/tr>\n
133<\/td>\n8.2.4 IUT Class C device <\/td>\n<\/tr>\n
135<\/td>\n8.3 Test case organization <\/td>\n<\/tr>\n
136<\/td>\n8.4 Measurement and signal generation \u2014 Requirements
8.4.1 Data generation <\/td>\n<\/tr>\n
138<\/td>\n8.4.2 Various requirements
8.5 Operational conditions \u2014 Calibration
8.5.1 Electrical input\/output, LIN protocol
8.5.2 [EPL\u2013CT 83] Operating voltage range <\/td>\n<\/tr>\n
140<\/td>\n8.5.3 Threshold voltages <\/td>\n<\/tr>\n
145<\/td>\n8.5.4 [EPL\u2013CT 87] Variation of VSUP_NON_OP \u2208 [\u20130,3\u00a0V to 7,0\u00a0V], [18\u00a0V to 58\u00a0V] <\/td>\n<\/tr>\n
147<\/td>\n8.5.5 IBUS under several conditions <\/td>\n<\/tr>\n
151<\/td>\n8.5.6 Slope control <\/td>\n<\/tr>\n
156<\/td>\n8.5.7 [EPL\u2013CT 93] Propagation delay <\/td>\n<\/tr>\n
161<\/td>\n8.5.8 Supply voltage offset <\/td>\n<\/tr>\n
174<\/td>\n8.5.9 Failure <\/td>\n<\/tr>\n
176<\/td>\n8.5.10 [EPL\u2013CT 106] Verifying internal capacitance and dynamic interference \u2014 IUT as slave <\/td>\n<\/tr>\n
177<\/td>\n8.6 Operation mode termination
8.6.1 General <\/td>\n<\/tr>\n
178<\/td>\n8.6.2 [EPL\u2013CT 107] Measuring internal resistor \u2014 IUT as slave
8.6.3 [EPL\u2013CT 108] Measuring internal resistor \u2014 IUT as master <\/td>\n<\/tr>\n
179<\/td>\n8.7 Static test cases <\/td>\n<\/tr>\n
182<\/td>\nBibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Road vehicles. Local Interconnect Network (LIN) – Electrical Physical Layer (EPL) conformance test specification<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
BSI<\/b><\/a><\/td>\n2016<\/td>\n186<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":258033,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[742,2641],"product_tag":[],"class_list":{"0":"post-258030","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-43-040-15","7":"product_cat-bsi","9":"first","10":"instock","11":"sold-individually","12":"shipping-taxable","13":"purchasable","14":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/258030","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/258033"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=258030"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=258030"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=258030"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}