IEC 60060-2:2010 is applicable to complete measuring systems, and to their components, used for the measurement of high voltages during laboratory and factory tests with direct voltage, alternating voltage and lightning and switching impulse voltages as specified in IEC 60060-1. For measurements during on-site tests see IEC 60060-3. The limits on uncertainties of measurements stated in this standard apply to test levels stated in IEC 60071-1:2006. The principles of this standard apply also to higher levels but the uncertainty may be greater. This standard also defines the terms used, methods to estimate the uncertainties of high-voltage measurements, states the requirements which the measuring systems shall meet, describes the methods for approving a measuring system and checking its components and describes the procedures by which the user shall show that a measuring system meets the requirements of this standard, including the limits set for the uncertainty of measurement. This third edition cancels and replaces the second edition, published in 1994, and constitutes a technical revision. The significant technical changes with respect to the previous edition are as follows: – The general layout and text was updated and improved to make the standard easier to use. – The standard was revised to align it with IEC 60060-1. – The treatment of measurement uncertainty estimation has been expanded.<\/p>\n
| PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
|---|---|---|---|---|---|---|---|
| 6<\/td>\n | English CONTENTS <\/td>\n<\/tr>\n | ||||||
| 10<\/td>\n | 1 Scope 2 Normative references 3 Terms and definitions <\/td>\n<\/tr>\n | ||||||
| 11<\/td>\n | 3.1 Measuring systems 3.2 Components of a measuring system <\/td>\n<\/tr>\n | ||||||
| 12<\/td>\n | 3.3 Scale factors <\/td>\n<\/tr>\n | ||||||
| 13<\/td>\n | 3.4 Rated values 3.5 Definitions related to dynamic behaviour <\/td>\n<\/tr>\n | ||||||
| 14<\/td>\n | Figures Figure 1 \u2013 Amplitude-frequency response with examples for limit frequencies (f1: f2) <\/td>\n<\/tr>\n | ||||||
| 15<\/td>\n | 3.6 Definitions related to uncertainty <\/td>\n<\/tr>\n | ||||||
| 16<\/td>\n | 3.7 Definitions related to tests on measuring systems <\/td>\n<\/tr>\n | ||||||
| 17<\/td>\n | 4 Procedures for qualification and use of measuring systems 4.1 General principles <\/td>\n<\/tr>\n | ||||||
| 18<\/td>\n | 4.2 Schedule of performance tests 4.3 Schedule of performance checks 4.4 Requirements for the record of performance <\/td>\n<\/tr>\n | ||||||
| 19<\/td>\n | 4.5 Operating conditions 4.6 Uncertainty <\/td>\n<\/tr>\n | ||||||
| 20<\/td>\n | 5 Tests and test requirements for an approved measuring system and its components 5.1 General requirements <\/td>\n<\/tr>\n | ||||||
| 21<\/td>\n | 5.2 Calibration \u2013 Determination of the scale factor <\/td>\n<\/tr>\n | ||||||
| 22<\/td>\n | Figure 2 \u2013 Calibration by comparison over the full voltage range <\/td>\n<\/tr>\n | ||||||
| 23<\/td>\n | Figure 3 \u2013 Uncertainty contributions of the calibration (example with minimum of 5 voltage levels) <\/td>\n<\/tr>\n | ||||||
| 24<\/td>\n | Figure 4 \u2013 Calibration by comparison over a limited voltage range, with an additional linearity test <\/td>\n<\/tr>\n | ||||||
| 25<\/td>\n | 5.3 Linearity test <\/td>\n<\/tr>\n | ||||||
| 26<\/td>\n | Figure 5 \u2013 Linearity test of the measuring system with a linear device in the extended voltage range <\/td>\n<\/tr>\n | ||||||
| 27<\/td>\n | 5.4 Dynamic behaviour <\/td>\n<\/tr>\n | ||||||
| 28<\/td>\n | 5.5 Short-term stability 5.6 Long-term stability <\/td>\n<\/tr>\n | ||||||
| 29<\/td>\n | 5.7 Ambient temperature effect 5.8 Proximity effect 5.9 Software effect 5.10 Uncertainty calculation of the scale factor <\/td>\n<\/tr>\n | ||||||
| 32<\/td>\n | 5.11 Uncertainty calculation of time parameter measurement (impulse voltages only) <\/td>\n<\/tr>\n | ||||||
| 34<\/td>\n | 5.12 Interference test (transmission system and instrument for impulse voltage measurements) 5.13 Withstand tests of converting device <\/td>\n<\/tr>\n | ||||||
| 35<\/td>\n | 6 Measurement of direct voltage 6.1 Requirements for an approved measuring system 6.2 Tests on an approved measuring system <\/td>\n<\/tr>\n | ||||||
| 36<\/td>\n | 6.3 Performance check Tables Table 1 \u2013 Tests required for an approved direct voltage measuring system <\/td>\n<\/tr>\n | ||||||
| 37<\/td>\n | 6.4 Measurement of ripple amplitude <\/td>\n<\/tr>\n | ||||||
| 38<\/td>\n | 7 Measurement of alternating voltage 7.1 Requirements for an approved measuring system Table 2 \u2013 Required tests for uncertainty contributions in ripple measurement <\/td>\n<\/tr>\n | ||||||
| 39<\/td>\n | Figure 6 \u2013 Shaded area for acceptable normalised amplitude-frequency responses of measuring systems intended for single fundamental frequencies fnom (to be tested in the range (1…..7) fnom) <\/td>\n<\/tr>\n | ||||||
| 40<\/td>\n | 7.2 Tests on an approved measuring system 7.3 Dynamic behaviour test 7.4 Performance check Figure 7 \u2013 Shaded area for acceptable normalised amplitude-frequency responses of measuring systems intended for a range of fundamental frequencies fnom1 to fnom2 (to be tested in the range fnom1 to 7 fnom2) <\/td>\n<\/tr>\n | ||||||
| 41<\/td>\n | Table 3 \u2013 Tests required for an approved alternating voltage measuring system <\/td>\n<\/tr>\n | ||||||
| 42<\/td>\n | 8 Measurement of lightning impulse voltage 8.1 Requirements for an approved measuring system <\/td>\n<\/tr>\n | ||||||
| 43<\/td>\n | 8.2 Tests on an approved measuring system Table 4 \u2013 Tests required for an approved lightning impulse voltage measuring system <\/td>\n<\/tr>\n | ||||||
| 44<\/td>\n | 8.3 Performance test on measuring systems <\/td>\n<\/tr>\n | ||||||
| 45<\/td>\n | 8.4 Dynamic behaviour test 8.5 Performance check 9 Measurement of switching impulse voltage 9.1 Requirements for an approved measuring system <\/td>\n<\/tr>\n | ||||||
| 46<\/td>\n | 9.2 Tests on an approved measuring system 9.3 Performance test on measuring systems <\/td>\n<\/tr>\n | ||||||
| 47<\/td>\n | 9.4 Dynamic behaviour test by comparison 9.5 Performance check <\/td>\n<\/tr>\n | ||||||
| 48<\/td>\n | Table 5 \u2013 Tests required for a switching impulse voltage measuring system <\/td>\n<\/tr>\n | ||||||
| 49<\/td>\n | 10 Reference measuring systems 10.1 Requirements for reference measuring systems 10.2 Calibration of a reference measuring system 10.3 Interval between successive calibrations of reference measuring systems <\/td>\n<\/tr>\n | ||||||
| 50<\/td>\n | 10.4 Use of reference measuring systems Table 6 \u2013 Recommended response parametersfor impulse voltage reference measuring systems <\/td>\n<\/tr>\n | ||||||
| 51<\/td>\n | Annex A (informative) Uncertainty of measurement <\/td>\n<\/tr>\n | ||||||
| 56<\/td>\n | Table A.1 \u2013 Coverage factor k for effective degrees of freedom \u03bdeff (p = 95,45 %) <\/td>\n<\/tr>\n | ||||||
| 57<\/td>\n | Figure A.1 \u2013 Normal probability distribution p(x) Table A.2 \u2013 Schematic of an uncertainty budget <\/td>\n<\/tr>\n | ||||||
| 58<\/td>\n | Figure A.2 \u2013 Rectangular probability distribution p(x) <\/td>\n<\/tr>\n | ||||||
| 59<\/td>\n | Annex B (informative) Examples for the calculation of measuringuncertainties in high-voltage measurements <\/td>\n<\/tr>\n | ||||||
| 60<\/td>\n | Table B.1 \u2013 Result of the comparison measurement at a single voltage level <\/td>\n<\/tr>\n | ||||||
| 61<\/td>\n | Table B.2 \u2013 Summary of results for h = 5 voltage levels (Vxmax = 500 kV) <\/td>\n<\/tr>\n | ||||||
| 62<\/td>\n | Table B.3 \u2013 Uncertainty budget of the assigned scale factor Fx <\/td>\n<\/tr>\n | ||||||
| 63<\/td>\n | Table B.4 \u2013 Uncertainty budget of the assigned scale factor F <\/td>\n<\/tr>\n | ||||||
| 65<\/td>\n | Table B.5 \u2013 Calibration result for front time T1 and deviations Table B.6 \u2013 Uncertainty budget of the front time deviation \u0394T1cal <\/td>\n<\/tr>\n | ||||||
| 66<\/td>\n | Figure B.1 \u2013 Comparison between the system under test, X, and the reference system, N and their mean \u0394T1m in the range of T1 = 0,8 us… 1.6 us Figure B.2 \u2013 Front time deviation \u0394T1,j of system X, related to the reference system N, and their mean \u0394T1m in the range of T1 = 0,8 us … 1,6 us <\/td>\n<\/tr>\n | ||||||
| 67<\/td>\n | Annex C (informative) Step response measurements <\/td>\n<\/tr>\n | ||||||
| 70<\/td>\n | Figure C.1 \u2013 Definitions of response parameters <\/td>\n<\/tr>\n | ||||||
| 71<\/td>\n | Figure C.2 \u2013 A unit-step response g(t) showing an initial distortionof initial distortion time T0 Figure C.3 \u2013 Suitable circuits for step response measurement <\/td>\n<\/tr>\n | ||||||
| 72<\/td>\n | Annex D (informative) Convolution method for the determinationof dynamic behaviour from step response measurements <\/td>\n<\/tr>\n | ||||||
| 75<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" High-voltage test techniques – Measuring systems<\/b><\/p>\n |