{"id":231921,"date":"2024-10-19T15:06:36","date_gmt":"2024-10-19T15:06:36","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-en-iso-16410-22018-tc\/"},"modified":"2024-10-25T09:28:50","modified_gmt":"2024-10-25T09:28:50","slug":"bs-en-iso-16410-22018-tc","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-en-iso-16410-22018-tc\/","title":{"rendered":"BS EN ISO 16410-2:2018 – TC"},"content":{"rendered":"
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
---|---|---|---|---|---|---|---|
27<\/td>\n | National foreword <\/td>\n<\/tr>\n | ||||||
29<\/td>\n | European foreword <\/td>\n<\/tr>\n | ||||||
31<\/td>\n | Foreword <\/td>\n<\/tr>\n | ||||||
33<\/td>\n | Introduction <\/td>\n<\/tr>\n | ||||||
34<\/td>\n | 1 Scope 2 Normative references 3 Terms and definitions <\/td>\n<\/tr>\n | ||||||
35<\/td>\n | 4 Abbreviated terms 5 Abstract test method (ATM) 5.1 Introduction <\/td>\n<\/tr>\n | ||||||
36<\/td>\n | 5.2 Test architecture 5.2.1 Security 5.3 Protocol Implementation Extra Information for Testing (PIXIT) <\/td>\n<\/tr>\n | ||||||
37<\/td>\n | 6 Untestable test purposes (TPs) 7 ATS data structures 7.1 ASN.1 description 7.2 Parameterized support <\/td>\n<\/tr>\n | ||||||
39<\/td>\n | 8 Message filtering 9 ATS naming conventions 9.1 Introduction 9.2 Definition naming conventions <\/td>\n<\/tr>\n | ||||||
40<\/td>\n | 9.3 Test case identifier <\/td>\n<\/tr>\n | ||||||
41<\/td>\n | 9.4 TTCN-3 modules identifier <\/td>\n<\/tr>\n | ||||||
42<\/td>\n | Annex A (normative) Abstract test suite (ATS) for FE and BE <\/td>\n<\/tr>\n | ||||||
43<\/td>\n | Annex B (informative) PIXIT proforma for FE and BE <\/td>\n<\/tr>\n | ||||||
45<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Tracked Changes. Electronic fee collection. Evaluation of equipment for conformity to ISO 17575-3 – Abstract test suite<\/b><\/p>\n |