SAE SSB 1_005:2021

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Radiation Hardness Assurance

Published By	Publication Date	Number of Pages
SAE	2021-07-07	26

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Categories: 31.080 - Semiconductor devices, 31.200 - Integrated circuits. Microelectronics, SAE

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Description

This document is an annex to SAE Technical Report SSB-1 (the latest revision).

This document provides reference information and guidance concerning methods used by the semiconductor industry and original equipment manufacturers related to radiation hardness assessments. This document is broken into three primary sections. Section 3 discusses part characterization with focus on selection criteria and acceptance testing. Section 4 discusses design hardening for piece parts with focus on degraded design limits and radiation design margin. The last section, Section 5, of this report is on hardness assurance inspection and test. This section discusses total ionizing dose, displacement damage and single event effects testing in detail.

Additional information

Published Code	SAE
Published By	SAE International, formerly Society of Automotive Engineers
Publication Date	2021-07-07
Pages Count	26
Language	English
Descriptors	Integrated circuits; Semiconductor devices; Defense industry; Manufacturing systems
File Size	419.8 KB
ICS Codes	31.080 - Semiconductor devices 31.200 - Integrated circuits. Microelectronics

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SAE SSB 1_005:2021

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