IEEE IEC 62527 2007

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IEC 62527 Ed. 1 (IEEE Std 1450.2(TM)-2002): Standard for Extensions to Standard Test Interface Language (STIL) for DC Level Specification

Published By	Publication Date	Number of Pages
IEEE	2007	44

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Description

New IEEE Standard – Active. This standard extends IEEE Std 1450-1999 (STIL) to support the definition of DC levels. STIL language constructs are defined to specify the DC conditions necessary to execute digital vectors on automated test equipment (ATE). STIL language extensions include structures for: (a) specifying the DC conditions for a device under test; (b) specifying DC conditions either globally, by pattern burst, by pattern, or by vector; (c) specifying alternate DC levels; and (d) selecting DC levels and alternate levels within a period, much the same as timed format events.

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PDF Pages	PDF Title
4	CONTENTS
6	FOREWORD
8	Title page
9	IEEE Introduction
10	1. Overview
11	1.1 Scope
12	1.2 Purpose 2. References 3. Definitions, acronyms, and abbreviations 3.1 Definitions
15	3.2 Acronyms and abbreviations
16	4. Structure of this standard 5. Extensions to Clause 6, STIL syntax description 5.1 Additional reserved words 5.2 DC expressions and units (dc_expr)
17	5.3 Additions to STIL name spaces and name resolution (IEEE Std 1450-1999, 6.16) 6. Statement structure and organization of STIL information 6.1 Top-level statements and required ordering
18	6.2 Optional top-level statements 7. Extensions to Clause 8, STIL statement
19	7.1 STIL syntax 7.2 STIL example 8. Extensions to Clause 19, Spec and Selector blocks 9. Extensions to Clause 16, PatternExec block 9.1 PatternExec block syntax
20	9.2 PatternExec block example 9.3 DCLevels and DCSets usage in PatternExec and Pattern blocks 10. DCLevels block
21	10.1 DCLevels block syntax
24	10.2 DCLevels block example
25	10.3 InheritDCLevels Processing 10.4 InheritDCLevels example
26	11. DCSets block 11.1 DCSets block syntax 11.2 DCSets statement example 12. DCSequence block
27	12.1 DCSequence block syntax
28	12.2 DCSequence example
30	13. Extensions to Clause 18, WaveformTable block 13.1 Event definition in WaveformTable block
31	13.2 Mapping of event integers to DCLevels statements
32	13.3 DC levels switching example
33	14. Extensions to Clause 22, STIL Pattern statements 14.1 DCLevels statement 14.2 DCLevels statement example
34	Annex A – DCLevels and DCSets usage example
40	Annex B – Bibliography
41	Annex C – List of participants

Additional information

Standard Title	IEC 62527 Ed. 1 (IEEE Std 1450.2(TM)-2002): Standard for Extensions to Standard Test Interface Language (STIL) for DC Level Specification
Published Code	IEEE
Publication Date	2007
Pages Count	44

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IEEE IEC 62527 2007

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