IEEE C62.35 2010 Cor1 2018
$27.30
IEEE Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components–Corrigendum 1
| Published By | Publication Date | Number of Pages |
| IEEE | 2018 | 11 |
Corrigendum Standard – Active. Avalanche breakdown diodes used for surge protection on systems with voltages equal to or less than 1000 V rms or 1200 V dc are discussed in this standard. The avalanche breakdown diode surge suppressor is a semiconductor diode that can operate in eithere the forward or reverse direction of its V-I characteristic. This component is a single package, which may be assembled from any combination of series and/or parallel diode chips. This standard contains definitions, service conditions, and a series of test criteria for determining the electrical characteristics and verifying ratings of these avalanche breakdown diodes. If the characteristics differ with the direction of conduction, then each direction of conduction shall be separately specified.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 1 | IEEE Std C62.35-2010/Cor 1-2018 Front Cover |
| 2 | Title page |
| 4 | Important Notices and Disclaimers Concerning IEEE Standards Documents |
| 7 | Participants |
| 8 | Introduction |
| 9 | Contents |
| 10 | 8.8.1 Rated forward surge current test method (See Figure 8) |
| 11 | Back Cover |
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