Shopping Cart

No products in the cart.

IEEE C62.32-2004

$80.71

IEEE Standard Test Methods for Low-Voltage Air Gap Surge-Protective Device Components (Excluding Valve and Expulsion Types)

Published By Publication Date Number of Pages
IEEE 2004 23
Guaranteed Safe Checkout
Category:

If you have any questions, feel free to reach out to our online customer service team by clicking on the bottom right corner. We’re here to assist you 24/7.
Email:[email protected]

Revision Standard – Inactive-Withdrawn. This standard applies to air gaps for overvoltage protection applications on systems with operating voltages equal to or less than 600 V rms. This standard contains a series of standard tests for determining the electrical characteristics of these air gap devices. This standard’s test criteria and definitions provide a common engineering language beneficial to users and manufacturers of air gap surge protective devices.

PDF Catalog

PDF Pages PDF Title
1 IEEE Standard Test Methods for Low-Voltage Air Gap Surge-Protective Device Components (Excluding Valve and Expulsion Types)
3 Title page
5 Introduction
Notice to users
Patents
Interpretations
Patents
6 Participants
8 CONTENTS
9 1. Scope
10 2. Definitions
11 3. Service conditions
3.1 Normal service conditions
3.1.1 Physical conditions
3.1.2 System conditions
3.2 Unusual service conditions
3.2.1 Physical conditions
3.2.2 System conditions
12 4. Standard design test criteria
4.1 General
4.2 Ambient conditions
4.3 Necessary precautions for testing air gaps
4.4 Current waveform decay time
13 4.5 Insulation resistance measurement and clearing source
4.6 DC breakdown voltage test
14 4.7 Capacitance test
4.8 Insulation resistance test
15 4.9 Initial impulse breakdown voltage test
16 4.10 Impulse breakdown voltage variability test
17 4.11 Maximum single impulse discharge current test
4.12 Impulse life test
18 4.13 AC discharge current test
4.14 Pulsed AC test
19 4.14.1 Pulsed AC life tests
4.14.2 Pulsed AC gap erosion test
4.15 Alternating follow-on current test
20 4.16 DC holdover test
21 4.17 Failure mode
4.17.1 Short-circuit failure mode
4.17.2 Low breakdown voltage failure mode
4.17.3 High breakdown voltage failure mode
22 4.17.4 Low insulation resistance failure mode
4.18 Fail-safe operation
23 Annex A—(informative) Bibliography
IEEE C62.32-2004
$80.71