IEEE 2671-2022

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IEEE Standard for General Requirements of Online Detection Based on Machine Vision in Intelligent Manufacturing (Approved Draft)

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IEEE	2022

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New IEEE Standard – Active.

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PDF Pages	PDF Title
1	IEEE Std 2671-2022 Front cover
2	Title page
4	Important Notices and Disclaimers Concerning IEEE Standards Documents
8	Participants
10	Introduction
11	Contents
13	List of Figures
15	List of Tables
16	1. Overview 1.1 Scope 1.2 Purpose 1.3 Word usage
17	2. Normative references 3. Definitions, acronyms, and abbreviations 3.1 Definitions 3.2 Acronyms and abbreviations
18	4. Generic flows and architecture 4.1 Generic flows and generic architecture
20	4.2 Scenario and defect modes 5. Input 5.1 Requirements for image acquisition
21	5.2 Setup
22	5.3 Lighting 5.4 Camera 5.5 Other features
23	6. Process 6.1 Requirements of vision-based processing
24	6.2 Features 7. Output 7.1 Output requirements
25	7.2 Output data, output file, and output form 7.3 System interface standards 7.4 Output storage methods 8. Function requirements 8.1 General
26	8.2 Operation mode switching function
27	8.3 Configuration management function 8.4 Self-diagnostic function 8.5 Remote system maintenance function 8.6 Report function 8.7 Control function
28	8.8 Security and safety function 8.9 System reset function 9. Interoperability Requirements 9.1 Scenario
29	9.2 Interoperability requirement 9.3 Communication protocol
30	9.4 Communication interface 9.5 Data access 9.6 System management function
32	10. Performance 10.1 Comprehensive performance
33	10.2 Equipment performance 10.3 Process performance
34	10.4 Manufacturing management performance 11. Test methodology 11.1 General
35	11.2 Industrial scene survey 11.3 Demand to sort out 11.4 Testing preparation 11.5 Select the test case 11.6 Select industry comparison samples 11.7 Test suite simulation
36	11.8 Output test results
37	Annex A (informative) Integrated circuit (IC) substrate inspection A.1 Overview
38	A.2 Detailed introduction
42	A.3 Analysis
43	Annex B (normative) Thermal grease online detection B.1 Overview
44	B.2 Detailed introduction
47	B.3 Analysis
48	Annex C (informative) Machine vision in process control of IC manufacturing C.1 Overview
49	C.2 Detailed introduction
52	C.3 Analysis
53	Annex D (informative) Online detection on semiconductor package D.1 Overview
54	D.2 Detailed introduction
59	D.3 Analysis
60	Annex E (informative) Defect detection of magnetic tiles based on machine vision E.1 Overview
62	E.2 Detailed introduction
64	E.3 Analysis
65	Back cover

Additional information

Standard Title	IEEE Standard for General Requirements of Online Detection Based on Machine Vision in Intelligent Manufacturing (Approved Draft)
Published Code	IEEE
Publication Date	2022

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