IEEE 1780-2022

$47.13

IEEE Standard for Specifying Inertial Measurement Units (IMUs)

Published By	Publication Date	Number of Pages
IEEE	2022

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Description

New IEEE Standard – Active. Preparation of an inertial measurement unit (IMU) specification document is discussed in this standard. An outline is provided along with guidance for tailoring.

PDF Catalog

PDF Pages	PDF Title
1	IEEE Std 1780-2022 Front cover
2	Title page
4	Important Notices and Disclaimers Concerning IEEE Standards Documents Notice and Disclaimer of Liability Concerning the Use of IEEE Standards Documents Translations
5	Official statements Comments on standards Laws and regulations Data privacy Copyrights
6	Photocopies Updating of IEEE Standards documents Errata Patents
7	IMPORTANT NOTICE
8	Participants
9	Introduction
10	Contents
11	1. Overview 1.1 Scope 1.2 Purpose 1.3 Word usage
12	2. Normative references 3. Specification overview 3.1 Specification scope 3.2 Item description 3.3 Definitions, acronyms, and abbreviations 3.3.1 Definitions
13	3.4 Acronyms and abbreviations
14	4. Applicable documents 4.1 Government 4.1.1 Specifications 4.1.2 Standards
15	4.1.3 Drawings 4.1.4 Bulletins 4.2 Nongovernment 4.2.1 Specifications 4.2.2 Standards
16	4.2.3 Drawings 4.2.4 Bulletins 5. Requirements 5.1 System interfaces 5.1.1 Electrical interface 5.1.1.1 External connector 5.1.1.1.1 Type and location 5.1.1.1.2 Pin assignments
17	5.1.1.2 Input power forms 5.1.1.3 Discrete I/O
18	5.1.1.4 Serial I/O 5.1.2 Data interface(s) 5.1.2.1 Message rate(s)
19	5.1.2.2 Message format(s) 5.1.2.3 Message time of validity 5.1.2.4 Data latency 5.1.2.5 Message jitter
20	5.1.3 Mechanical interface 5.1.3.1 Mounting dimensions 5.1.3.2 IMU reference axes 5.1.4 Thermal interface 5.2 Functional 5.2.1 System states and modes 5.2.2 External reset capability 5.2.3 Turn-on time
21	5.2.4 Deactivation time 5.2.5 Time since turn-on 5.2.6 Fault history 5.2.7 Elapsed time indicator (ETI) 5.2.8 Number of turn-ons
22	5.2.9 System resources 5.2.9.1 Throughput (processor) 5.2.9.2 System memory 5.2.10 System timing 5.2.10.1 Time of validity output signal 5.2.10.2 External synchronization 5.2.11 External reprogrammability 5.2.12 Configuration
23	5.3 Performance 5.3.1 Translational data channels 5.3.1.1 Operating range 5.3.1.2 Response to out-of-range inputs
24	5.3.1.3 Polarity 5.3.1.4 Scale factor error 5.3.1.4.1 Total scale factor error 5.3.1.4.2 Scale factor repeatability 5.3.1.4.3 Scale factor stability 5.3.1.4.4 Scale factor linearity error 5.3.1.4.5 Scale factor asymmetry 5.3.1.5 Bias 5.3.1.5.1 Total bias 5.3.1.5.2 Bias repeatability 5.3.1.5.3 Bias stability
25	5.3.1.5.4 Bias instability 5.3.1.5.5 Bias vibration rectification error 5.3.1.6 Axis misalignment 5.3.1.7 Output noise 5.3.1.8 Quantization 5.3.1.9 Velocity random walk 5.3.1.10 Threshold 5.3.1.11 Dead band
26	5.3.1.12 Size effect 5.3.1.13 Sculling 5.3.1.14 Frequency response 5.3.1.15 Filtering 5.3.2 Rotational data channels
27	5.3.2.1 Operating range 5.3.2.2 Response to out-of-range inputs 5.3.2.3 Polarity 5.3.2.4 Scale factor error 5.3.2.4.1 Total scale factor error 5.3.2.4.2 Scale factor repeatability 5.3.2.4.3 Scale factor stability 5.3.2.4.4 Scale factor linearity error 5.3.2.4.5 Scale factor asymmetry 5.3.2.5 Bias 5.3.2.5.1 Total bias
28	5.3.2.5.2 Bias repeatability 5.3.2.5.3 Bias stability 5.3.2.5.4 Bias instability 5.3.2.5.5 Bias g sensitivity 5.3.2.5.6 Bias vibration rectification error 5.3.2.6 Axis misalignment 5.3.2.7 Output noise 5.3.2.8 Quantization
29	5.3.2.9 Angle random walk 5.3.2.10 Threshold 5.3.2.11 Dead band 5.3.2.12 Coning 5.3.2.13 Frequency response 5.3.2.14 Filtering 5.4 Physical characteristics 5.4.1 Weight
30	5.4.2 Mounting hardware 5.4.3 Outline dimensions 5.4.4 External surfaces 5.4.5 Power 5.4.6 Emissions 5.4.6.1 Acoustic noise 5.4.6.2 Light 5.5 Environmental
31	5.5.1 Nonoperating 5.5.1.1 Transportation and handling 5.5.1.2 Storage 5.5.1.3 Dormancy 5.5.2 Operating
32	5.5.3 Environments 5.5.3.1 Acoustic noise 5.5.3.2 Altitude
33	5.5.3.3 Atmosphere 5.5.3.3.1 Acidic atmosphere 5.5.3.3.2 Explosive atmosphere 5.5.3.4 Fluid susceptibility
34	5.5.3.5 Fungus 5.5.3.6 Humidity
35	5.5.3.7 Immersion 5.5.3.8 Magnetic fields 5.5.3.9 Motion 5.5.3.9.1 Angular motion 5.5.3.9.1.1 Acceleration 5.5.3.9.1.2 Rate 5.5.3.9.2 Linear motion 5.5.3.9.2.1 Acceleration
36	5.5.3.9.2.2 Jerk 5.5.3.10 Nuclear, biological, and chemical (NBC) 5.5.3.11 Pressure 5.5.3.12 Radiation 5.5.3.12.1 Nuclear radiation
37	5.5.3.12.2 Thermal radiation 5.5.3.12.2.1 Other thermal radiation 5.5.3.12.2.2 Solar radiation 5.5.3.13 Rain 5.5.3.13.1 Blowing rain 5.5.3.13.2 Dripping rain
38	5.5.3.13.3 Icing/freezing rain 5.5.3.14 Rapid decompression 5.5.3.15 Rapid pressure change 5.5.3.16 Salt fog 5.5.3.17 Sand and dust
39	5.5.3.18 Shock 5.5.3.18.1 Crash safety shock 5.5.3.18.2 Mechanical shock
40	5.5.3.18.3 Thermal shock 5.5.3.19 Snow 5.5.3.19.1 Blowing snow 5.5.3.19.2 Falling snow 5.5.3.19.3 Snow load 5.5.3.20 Temperature 5.5.3.21 Vibration 5.5.3.21.1 Angular vibration
41	5.5.3.21.2 Linear vibration 5.5.3.21.2.1 Random vibration 5.5.3.21.2.2 Sinusoidal dwell
42	5.5.3.21.2.3 Sinusoidal sweep 5.5.3.22 Wash down 5.6 Electromagnetic environmental effects (E3) 5.6.1 Conducted emissions
43	5.6.2 Conducted susceptibility 5.6.3 Radiated emissions 5.6.4 Radiated susceptibility 5.7 Life 5.7.1 Useful life
44	5.7.2 Storage life 5.7.3 Operating life 5.8 Reliability and maintainability 5.8.1 Mean time between failure (MTBF) 5.8.2 Mean time to repair (MTTR)
45	5.9 Testability 5.9.1 Built-in test (BIT) 5.9.1.1 Start-up BIT 5.9.1.2 Periodic BIT 5.9.1.3 Initiated BIT
46	5.9.1.4 Failure detection rate 5.9.1.5 False alarm rate 5.9.2 Fault isolation 5.10 Safety
47	5.11 Hardware design and construction 5.11.1 Corrosion 5.11.2 Dissimilar metals
48	5.11.3 Hazardous materials 5.11.4 Soldering 5.11.5 Hardware design process 5.11.6 Parts selection 5.11.7 Workmanship 5.11.8 Identification and marking
49	5.11.9 Interchangeability 5.11.10 External surfaces
50	5.11.11 Isolation 5.11.12 Electrical bonding 5.12 Software design 5.13 Human factors
51	6. Quality assurance 6.1 Verification methods 6.2 Qualification tests 6.2.1 Qualification test samples
52	6.2.2 Qualification tests and sequence 6.3 Acceptance tests 6.3.1 Individual acceptance tests 6.3.1.1 Functional testing
53	6.3.1.2 Environmental stress screening (ESS) 6.3.1.3 Rejection and retest 6.3.2 Lot acceptance tests 6.3.2.1 Sampling plan
54	6.3.2.2 Acceptance/rejection criteria 6.3.2.3 Sample tests and sequence 6.3.2.4 Rejection and retest 6.3.2.5 Defects in items already accepted
55	6.4 Reliability tests 6.4.1 Demonstration testing 6.4.2 Highly accelerated life testing (HALT) 6.5 Design verification test (DVT) 6.6 Software tests 6.7 Hardware logic tests 6.8 Latent defects 7. Preparation for delivery 7.1 Preservation, packaging, and packing
56	7.2 Marking 8. Notes 8.1 Intended use 8.2 Ordering data 8.3 Compensation equations
57	8.3.1 Translational data channels
58	8.3.2 Rotational data channels
59	8.4 Other
60	Annex A (informative) Bibliography
61	Back cover