BSI PD ISO/TS 10867:2019
$142.49
Nanotechnologies. Characterization of single-wall carbon nanotubes using near infrared photoluminescence spectroscopy
| Published By | Publication Date | Number of Pages |
| BSI | 2019 | 26 |
This document gives guidelines for the characterization of single-wall carbon nanotubes (SWCNTs) using near infrared (NIR) photoluminescence (PL) spectroscopy.
It provides a measurement method for the determination of the chiral indices of the semi-conducting SWCNTs in a sample and their relative integrated PL intensities.
The method can be expanded to estimate the relative mass concentrations of semi-conducting SWCNTs in a sample from their measured integrated PL intensities and knowledge of their PL cross-sections.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 2 | undefined |
| 6 | Foreword |
| 7 | Introduction |
| 9 | 1 Scope 2 Normative references 3 Terms and definitions |
| 10 | 4 Principles of band gap photoluminescence of SWCNTs 4.1 Structure of SWCNTs |
| 11 | 4.2 Band structure and PL peaks |
| 12 | 4.3 Exciton effects |
| 13 | 5 NIR-PL apparatus 5.1 NIR-PL spectrometer 5.2 Light source |
| 14 | 6 Sample preparation methods 6.1 Preparation of dispersion for measurement 6.2 Preparation of solid film dispersion for measurement |
| 15 | 7 Measurement procedures 8 Data analysis and results interpretation 8.1 Empirical rules for structural assignment |
| 16 | 8.2 Determination of the chiral indices of the semi-conducting SWCNTs in a sample |
| 17 | 9 Uncertainties 10 Test report |
| 18 | Annex A (informative) Case studies |
| 24 | Bibliography |
