BSI PD ISO/TR 19733:2019
$142.49
Nanotechnologies. Matrix of properties and measurement techniques for graphene and related two-dimensional (2D) materials
| Published By | Publication Date | Number of Pages |
| BSI | 2019 | 26 |
This document provides a matrix which links key properties of graphene and related two-dimensional (2D) materials to commercially available measurement techniques. The matrix includes measurement techniques to characterize chemical, physical, electrical, optical, thermal and mechanical properties of graphene and related 2D materials.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 2 | National foreword |
| 7 | Foreword |
| 8 | Introduction |
| 9 | 1 Scope 2 Normative references 3 Terms and definitions, symbols and abbreviated terms 3.1 Terms and definitions |
| 10 | 3.2 Symbols and abbreviated terms |
| 11 | 4 Matrix of properties and measurement techniques for graphene and related 2D materials |
| 12 | 5 Properties and measurands 5.1 Structural properties 5.1.1 Crystal defect |
| 13 | 5.1.2 Domain (grain) size |
| 14 | 5.1.3 Flake size 5.1.4 Number of layers 5.1.5 Stacking angle 5.1.6 Surface area 5.1.7 Thickness 5.2 Chemical properties 5.2.1 Metal contents |
| 15 | 5.2.2 Non-graphene contents and residue 5.2.3 Oxygen content 5.3 Mechanical properties, elastic modulus 5.4 Thermal properties, thermal conductivity 5.5 Optical properties, optical transmittance 5.6 Electrical and electronic properties 5.6.1 Charge carrier concentration (density) |
| 16 | 5.6.2 Charge carrier mobility 5.6.3 Sheet resistance 5.6.4 Work function 6 Measurement techniques 6.1 Atomic force microscopy (AFM) |
| 17 | 6.2 Brunauer, Emmett and Teller method (BET) 6.3 Combustion analysis 6.4 Electron probe X-ray microanalysis (EPMA) |
| 18 | 6.5 Electron spin resonance (ESR) 6.6 Fourier transform- infrared spectroscopy (FT-IR) 6.7 Hall bar measurement |
| 19 | 6.8 Inductively coupled plasma — Mass spectrometry (ICP-MS) 6.9 Kelvin probe force microscopy (KPFM) 6.10 Low energy electron microscopy (LEEM) |
| 20 | 6.11 Optical microscopy 6.12 Raman spectroscopy 6.13 Scanning electron microscopy (SEM) |
| 21 | 6.14 Secondary-ion mass spectrometry (SIMS) 6.15 Scanning tunnelling microscopy (STM) 6.16 Transmission electron microscopy (TEM) |
| 22 | 6.17 Thermogravimetric analysis (TGA) 6.18 Titration 6.19 Ultraviolet photoelectron microscopy (UPS) 6.20 Ultraviolet, visible, near-infrared (UV-VIS-NIR) spectroscopy |
| 23 | 6.21 X-ray diffraction (XRD) 6.22 X-ray photoelectron spectroscopy (XPS) 6.23 4-point probe |
| 24 | Bibliography |
