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BSI PD IEC TS 62607-2-5:2022

BSI PD IEC TS 62607-2-5:2022

$142.49

Nanomanufacturing. Key control characteristics – Carbon nanotube materials. Mass density of vertically-aligned carbon nanotubes: X-ray absorption method

Published By Publication Date Number of Pages
BSI 2022 24
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PDF Catalog

PDF Pages PDF Title
2 undefined
4 CONTENTS
6 FOREWORD
8 INTRODUCTION
9 1 Scope
2 Normative references
3 Terms, definitions, and abbreviated terms
3.1 Terms and definitions
10 3.2 Abbreviated terms
4 Measurement of mass density of vertically-aligned carbon nanotubes with Xray absorption method
4.1 General
4.2 Measurement principle
Figures
Figure 1 – Measurement principle of X-ray absorption method
11 4.3 Description of measurement equipment and apparatus
4.4 Sample preparation
4.5 Thickness measurement with X-ray absorption method
Figure 2 – Parameters determining the spatial resolution of X-ray absorption method
12 4.6 Density measurement with X-ray absorption method
Figure 3 – Example of X-ray projection image of VACNTs grown on Si substrate
Figure 4 – Example of transmitted X-ray intensity profile for VACNT sample
13 5 Appropriate data formats
Figure 5 – Example of calibration result for non-monochromatic incident X-ray
14 Tables
Table 1 – Possible data format to be given together withdensity of VACNTs obtained with X-ray absorption method
15 Annex A (informative)Case study of mass density measurements forvertically-aligned carbon nanotubes
A.1 Overview
A.2 Sample preparation for VACNTs
A.3 Confirmation of X-ray incidence parallel to the substrate surface
16 A.4 Thickness and mass density measurements with transmitted X-ray intensity profiles
Figure A.1 – Schematic drawings of beam alignment proceduresfor X-ray absorption measurement
17 Figure A.2 – X-ray projection images and transmitted X-rayintensity profiles observed for two VACNT samples
18 A.5 Measurement results for a VACNT film with a thickness of several hundred micrometres
Figure A.3 – Cross-sectional scanning electron microscopeimages of two VACNT samples
Table A.1 – Parameters obtained from the transmittedX-ray intensity profiles for two VACNT samples
19 Figure A.4 – X-ray projection image and transmitted X-rayintensity profile observed for a thicker VACNT film
Figure A.5 – Cross-sectional scanning electron microscopeimage of a thicker VACNT film
Table A.2 – Parameters obtained from the transmitted X-rayintensity profile for a thicker VACNT film
20 A.6 Measurement results for a VACNT film with a thickness of several millimetres
21 Figure A.6 – X-ray projection image and transmitted X-ray intensityprofile observed for a millimetre-thick VACNT film
Figure A.7 – X-ray projection image and mass densityprofile observed for a millimetre-thick VACNT film
22 Bibliography

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BSI PD IEC TS 62607-2-5:2022
$142.49