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BSI PD IEC/PAS 63083:2017

$142.49

Specific absorption rate (SAR) measurement procedure for long term evolution (LTE) devices

Published By Publication Date Number of Pages
BSI 2017 32
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This Publicly Available Specification (PAS) applies to measurement procedures of Specific Absorption Rate (SAR) generated by devices with LTE (Long Term Evolution) technology specified by 3rd Generation Partnership Project (3GPP), Rel. 8 and 9 [1] where the devices are intended to be used with the radiating part in close proximity to the human head and body. This document supports both FDD and TDD modes. The objective of this document is to define the number of test conditions with respect to basic radio frequency aspects, i.e. channel bandwidths, number and offset of allocated resource blocks (RB), modulation, and maximum power reduction (MPR) for IEC 62209-1 and IEC 62209-2.

PDF Catalog

PDF Pages PDF Title
4 CONTENTS
5 FOREWORD
7 INTRODUCTION
8 1 Scope
2 Normative references
3 Terms and definitions
9 4 Symbols and abbreviated terms
5 Protocol for SAR assessment
5.1 General LTE SAR testing considerations
5.1.1 Description of LTE Mode selection
12 5.2 Power and SAR Measurement Protocol
Step 1: RF conducted power measurement
Figures
Figure 1 – Use of conducted power for LTE Mode selection
13 Step 2: SAR measurement for the LTE Mode generating maximum RF conducted power (Pmax) and Device Position causing maximum SAR
Approach 1 (AP1): Select the SAR measurement at Device Position causing maximum SAR for Step 2
Approach 2 (AP2): SAR measurement at Device Position causing maximum SAR for LTE Modes included in subset S
Approach 3 (AP3): Limited SAR measurements at Device Position causing maximum SAR for LTE Modes included in subset S
14 6 Uncertainty estimation
7 Measurement report
15 Annex A (informative) Supporting information
16 Figure A.1 – Low, Middle, and High channel at 2 GHz band (Band 1)
Figure A.2 – RF conducted power vs. 10g SAR
17 Tables
Table A.1 – CV of α
18 Figure A.3 – 1g SAR as a function of RF conducted power in various test conditions (dashed lines indicate y=a*x linear regressions)
Table A.2 – Maximum CV of α found in Study 2
20 Annex B (informative) Maximum Power Reduction (MPR)
Table B.1 – Maximum Power Reduction (MPR) for Power Class 3
21 Annex C (informative) Power test conditions
Table C.1 – Test Configuration Table without MPR
Table C.2 – Test Configuration Table with MPR
22 Annex D (normative) RF Conducted Output Power Measurement
23 Annex E (informative) RF Conducted LTE Modes to be tested for Band 3, 7 and 20
Table E.1 – Band 3 (1 710 MHz to 1 785 MHz)
26 Table E.2 – Band 7 (2 500 MHz to 2 570 MHz)
28 Table E.3 – Band 20 (832 MHz to 862 MHz)
30 Bibliography
BSI PD IEC/PAS 63083:2017
$142.49