BSI DD IEC/TS 62396-2:2008

$142.49

Process management for avionics. Atmospheric radiation effects – Guidelines for single event effects testing for avionics systems

Published By	Publication Date	Number of Pages
BSI	2008	28

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Categories: 03.100.50 - Production. Production management, BSI

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Description

IEC TS 62396-2:2008 (E) provides guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons. Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of devices and boards due to the atmospheric neutrons in the atmosphere at aircraft altitudes.

Additional information

Status	Withdrawn
Title	Process management for avionics. Atmospheric radiation effects – Guidelines for single event effects testing for avionics systems
Replaces	DD IEC/PAS 62396-2:2007
Publisher	BSI
Committee	GEL/107
Pages	28
Publication Date	2008-10-31
Withdrawn Date	2014-08-31
Replaced By	BS IEC 62396-2:2012
ISBN	978 0 580 62024 9
Standard Number	DD IEC/TS 62396-2:2008
Identical National Standard Of	IEC/TS 62396-2:2008
Descriptors	Air transport engineering, Environmental testing, Electromagnetic radiation, Electronic equipment and components, Production management, Electronic engineering, Atmospheric radiation, Ionizing radiation, Integrated circuits, Aircraft components, Environment (working), Neutrons, Electrical equipment
ICS Codes	03.100.50 - Production. Production management

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BSI DD IEC/TS 62396-2:2008

$142.49


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