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BSI 24/30497128 DC:2024 Edition

BSI 24/30497128 DC:2024 Edition

$10.54

BS EN IEC 61788-15 Superconductivity – Part 15. Electronic characteristic measurements. Intrinsic surface impedance of superconductor films at microwave frequencies

Published By Publication Date Number of Pages
BSI 2024 56
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PDF Catalog

PDF Pages PDF Title
10 1 Scope
2 Normative references
3 Terms and definitions
11 4 Requirements
5 Apparatus
5.1 Measurement equipment
12 5.2 Measurement apparatus
16 5.3 Dielectric rods
17 5.4 Superconductor films and copper cavity
6 Measurement procedure
6.1 Set-up
6.2 Measurement of the reference level
18 6.3 Measurement of the RS of oxygen-free high purity copper
20 6.4 Determination of the effective RS of superconductor films and tan( of standard dielectric rods
21 6.5 Determination of the penetration depth
23 6.6 Determination of the intrinsic surface impedance
24 7 Uncertainty of the test method
7.1 Measurement of unloaded quality factor
7.2 Measurement of loss tangent
25 7.3 Temperature
7.4 Specimen and holder support structure
7.5 Uncertainty in the intrinsic surface impedance
8 Test Report
8.1 Identification of test specimen
26 8.2 Report of the ZS values
8.3 Report of the test conditions
27 Annex A (informative) Additional information relating to clauses 1 to 8
A.1 Concerning the Scope
28 A.2 Requirements
29 A.3 Theory and the measurement procedure for the intrinsic surface impedance
A.3.1 Theoretical relation between the ZS and the ZSe [1]3
33 A.3.2 Calculation of the geometrical factors [3]
34 A.3.3 Procedure for determining the intrinsic ZS [1, 3, 4]
A.3.3.1 Determination of the intrinsic penetration depth [2, 5]
35 A.3.3.2 Determination of the intrinsic surface impedance
36 A.4 Dimensions of the standard sapphire rod
37 A.5 Dimensions of the closed type resonator
38 A.6 Test results for type A and type B sapphire resonators
A.6.1 Test results for type A resonator
42 A.6.2 Test results for type B sapphire resonator
45 A.7 Uncertainty of the test results
A.8 Reference documents
47 Annex B (informative) Standard uncertainty evaluation in the test method for the intrinsic surface impedance of superconductor films at microwave frequencies
B.1 Assessment of combined uncertainty in the ZS from uncertainties in the RSe and λ
48 B.2 Assessment of combined uncertainty in the ZS from the measured complex conductivity
49 B.3 Results from the round robin test
B.3.1 Uncertainties in the RSe and f0
52 B.3.2 Uncertainty in the λ
B.3.3 Uncertainties in the ZS of the YBCO films from the round robin test
53 B.3.4 Effects of uncertainty in temperature on ur(RSe) from the round robin test
54 B.4 Reference documents of Annex B

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BSI 24/30497128 DC
$10.54