BSI 20/30427157 DC:2020 Edition
$13.70
BS IEC 61189-2-808. Test methods for electrical materials, printed board and other interconnection structures and assemblies – Part 2-808. Thermal resistance of dielectric layer by thermal transient method
Published By | Publication Date | Number of Pages |
BSI | 2020 | 17 |
Status | Definitive |
---|---|
Pages | 17 |
Publication Date | 2020-12-08 |
Standard Number | 20/30427157 DC |
Title | BS IEC 61189-2-808. Test methods for electrical materials, printed board and other interconnection structures and assemblies – Part 2-808. Thermal resistance of dielectric layer by thermal transient method |
Identical National Standard Of | IEC 61189-2-808 Ed.1.0 |
Descriptors | Structures, Open systems interconnection, Printing board, Testing methods |
Publisher | BSI |
Committee | EPL/501 |
ICS Codes | 31.180 - Printed circuits and boards |