BSI 20/30410215 DC:2020 Edition
$13.70
BS EN IEC 63287-1. Semiconductor devices. Generic semiconductor qualification guidelines – Part 1. Guidelines for LSI reliability qualification
Published By | Publication Date | Number of Pages |
BSI | 2020 | 44 |
Status | Definitive |
---|---|
Pages | 44 |
Publication Date | 2020-03-06 |
Standard Number | 20/30410215 DC |
Title | BS EN IEC 63287-1. Semiconductor devices. Generic semiconductor qualification guidelines – Part 1. Guidelines for LSI reliability qualification |
Identical National Standard Of | IEC 63287-1 Ed.1.0, prEN IEC 63287-1:2020 |
Descriptors | Semiconductor devices, Reliability, Electrical failure, Tests, Test methods |
Publisher | BSI |
Committee | EPL/47 |
ICS Codes | 31.080.01 - Semiconductor devices in general |