BSI 20/30409285 DC 2020
$13.70
BS IEC 63284. Semiconductor devices. Reliability test method of on-stress reliability by inductive load switching for gallium nitride transistors
| Published By | Publication Date | Number of Pages |
| BSI | 2020 | 13 |
| Status | Definitive |
|---|---|
| Pages | 13 |
| Publication Date | 2020-04-01 |
| Standard Number | 20/30409285 DC |
| Title | BS IEC 63284. Semiconductor devices. Reliability test method of on-stress reliability by inductive load switching for gallium nitride transistors |
| Identical National Standard Of | 47/2624/CD, prEN IEC 63284:2021 |
| Descriptors | Electronic equipment and components, Semiconductor devices, Semiconductors, Metal oxide semiconductors, Testing methods |
| Publisher | BSI |
| Committee | EPL/47 |
| ICS Codes | 31.080.01 - Semiconductor devices in general |
