BS ISO 20720:2018:2019 Edition
$102.76
Microbeam analysis. Methods of specimen preparation for analysis of general powders using WDS and EDS
| Published By | Publication Date | Number of Pages |
| BSI | 2019 | 18 |
This document specifies specimen preparation methods for the analysis of particles in powders using energy-dispersive spectrometers (EDS) or wavelength-dispersive spectrometers (WDS) installed on an EPMA or SEM. The preparation methods for powder particle analysis are classified by the analytical purpose and the particle size.
This document applies to inorganic particles larger than 100 nm and smaller than 100 µm in diameter.
It applies only to analysis of “general” powders, which means that it excludes procedures for special applications such as forensic or trace analysis.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 2 | National foreword |
| 6 | Foreword |
| 7 | Introduction |
| 9 | 1 Scope 2 Normative references 3 Terms and definitions 4 Abbreviated terms 5 Analytical purposes and methods of specimen preparation for particle analysis[1] 5.1 Methods of specimen preparation for particle analysis |
| 10 | 5.2 Description of preparation methods 5.2.1 Analysis of whole particles or surface of particles |
| 12 | 5.2.2 Analysis of cross-section of particles |
| 13 | 5.3 Choosing preparation methods |
| 14 | 6 Electric conductivity processing |
| 15 | Annex A (informative) Examples of X-ray strength dependency on tablet-forming pressure |
| 16 | Annex B (informative) Example of X-ray strength dependency on tablet-forming particle size |
| 17 | Bibliography |
