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BS ISO 18118:2024 – TC

BS ISO 18118:2024 – TC

$186.33

Tracked Changes. Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

Published By Publication Date Number of Pages
BSI 2024 76
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PDF Catalog

PDF Pages PDF Title
46 undefined
50 Foreword
51 Introduction
53 1 Scope
2 Normative references
3 Terms and definitions
56 4 Symbols and abbreviated terms
57 5 General information
58 6 Measurement conditions
6.1 General
59 6.2 Excitation source
6.3 Energy resolution
6.4 Energy step and scan rate
6.5 Signal intensity
6.6 Gain and time constant (for AES instruments with analogue detection systems)
6.7 Modulation to generate a derivative spectrum
7 Data-analysis procedures
60 8 Spectrometer response function
9 Determination of chemical composition using relative sensitivity factors
9.1 Calculation of chemical composition
9.1.1 General
61 9.1.2 Composition determined from elemental relative sensitivity factors
9.1.3 Composition determined from atomic relative sensitivity factors or average matrix relative sensitivity factors
9.2 Uncertainties in calculated compositions
62 Annex A (informative) Formulae for relative sensitivity factors
68 Annex B (informative) Information on uncertainty of the analytical results
71 Bibliography

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BS ISO 18118:2024 - TC
$186.33