BS ISO 17987-7:2016
$215.11
Road vehicles. Local Interconnect Network (LIN) – Electrical Physical Layer (EPL) conformance test specification
| Published By | Publication Date | Number of Pages |
| BSI | 2016 | 186 |
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 7 | Foreword |
| 8 | Introduction |
| 11 | 1 Scope 2 Normative references 3 Terms, definitions, symbols and abbreviated terms 3.1 Terms and definitions 3.2 Symbols |
| 14 | 3.3 Abbreviated terms |
| 15 | 4 Conventions 5 EPL 12 V LIN devices with RX and TX access 5.1 Test specification overview 5.1.1 Test case organization |
| 16 | 5.1.2 Measurement and signal generation requirements |
| 17 | 5.2 Operational conditions — Calibration 5.2.1 Electrical input/output, LIN protocol 5.2.2 [EPL–CT 1] Operating voltage range |
| 18 | 5.2.3 Threshold voltages |
| 22 | 5.2.4 [EPL–CT 5] Variation of VSUP_NON_OP |
| 23 | 5.2.5 IBUS under several conditions |
| 26 | 5.2.6 Slope control |
| 29 | 5.2.7 Propagation delay |
| 31 | 5.2.8 Supply voltage offset |
| 38 | 5.2.9 Failure |
| 40 | 5.2.10 [EPL–CT 22] Verifying internal capacitance and dynamic interference — IUT as slave |
| 42 | 5.3 Operation mode termination 5.3.1 General |
| 43 | 5.3.2 [EPL–CT 23] Measuring internal resistor — IUT as slave |
| 44 | 5.3.3 [EPL–CT 24] Measuring internal resistor — IUT as master 5.4 Static test cases |
| 48 | 6 EPL 12 V LIN devices without RX and TX access 6.1 Test specification overview 6.2 Communication scheme 6.2.1 General 6.2.2 IUT as slave |
| 49 | 6.2.3 IUT as master |
| 50 | 6.2.4 IUT class C device |
| 52 | 6.3 Test case organization |
| 53 | 6.4 Measurement and signal generation — Requirements 6.4.1 Data generation |
| 55 | 6.4.2 Various requirements 6.5 Operational conditions — Calibration 6.5.1 Electrical input/output, LIN protocol 6.5.2 [EPL–CT 25] Operating voltage range |
| 57 | 6.5.3 Threshold voltages |
| 61 | 6.5.4 [EPL–CT 29] Variation of VSUP_NON_OP ∈ [–0,3 V to 7,0 V], [18 V to 40 V] |
| 62 | 6.5.5 IBUS under several conditions |
| 65 | 6.5.6 Slope control |
| 69 | 6.5.7 [EPL–CT 35] Propagation delay |
| 75 | 6.5.8 Supply voltage offset |
| 84 | 6.5.9 Failure |
| 86 | 6.5.10 [EPL–CT 48] Verifying internal capacitance and dynamic interference — IUT as slave |
| 88 | 6.6 Operation mode termination 6.6.1 General |
| 89 | 6.6.2 [EPL–CT 49] Measuring internal resistor — IUT as slave 6.6.3 [EPL–CT 50] Measuring internal resistor — IUT as master 6.7 Static test cases |
| 92 | 7 EPL 24 V LIN devices with RX and TX access |
| 93 | 7.1 Test specification overview 7.1.1 Test case organization 7.1.2 Measurement and signal generation — Requirements |
| 94 | 7.2 Operational conditions — Calibration 7.2.1 Electrical input/output, LIN protocol 7.2.2 [EPL–CT 51] Operating voltage range |
| 96 | 7.2.3 Threshold voltages |
| 100 | 7.2.4 [EPL–CT 55] Variation of VSUP_NON_OP |
| 101 | 7.2.5 IBUS under several conditions |
| 104 | 7.2.6 Slope control |
| 107 | 7.2.7 Propagation delay |
| 108 | 7.2.8 Supply voltage offset |
| 122 | 7.2.9 Failure |
| 124 | 7.2.10 [EPL–CT 80] Verifying internal capacitance and dynamic interference — IUT as slave |
| 126 | 7.3 Operation mode termination 7.3.1 General |
| 127 | 7.3.2 [EPL–CT 81] Measuring internal resistor — IUT as slave 7.3.3 [EPL–CT 82] Measuring internal resistor — IUT as master |
| 128 | 7.4 Static test cases |
| 131 | 8 EPL 24 V LIN devices without RX and TX access 8.1 Test specification overview 8.2 Communication scheme 8.2.1 Overview |
| 132 | 8.2.2 IUT as slave 8.2.3 IUT as master |
| 133 | 8.2.4 IUT Class C device |
| 135 | 8.3 Test case organization |
| 136 | 8.4 Measurement and signal generation — Requirements 8.4.1 Data generation |
| 138 | 8.4.2 Various requirements 8.5 Operational conditions — Calibration 8.5.1 Electrical input/output, LIN protocol 8.5.2 [EPL–CT 83] Operating voltage range |
| 140 | 8.5.3 Threshold voltages |
| 145 | 8.5.4 [EPL–CT 87] Variation of VSUP_NON_OP ∈ [–0,3 V to 7,0 V], [18 V to 58 V] |
| 147 | 8.5.5 IBUS under several conditions |
| 151 | 8.5.6 Slope control |
| 156 | 8.5.7 [EPL–CT 93] Propagation delay |
| 161 | 8.5.8 Supply voltage offset |
| 174 | 8.5.9 Failure |
| 176 | 8.5.10 [EPL–CT 106] Verifying internal capacitance and dynamic interference — IUT as slave |
| 177 | 8.6 Operation mode termination 8.6.1 General |
| 178 | 8.6.2 [EPL–CT 107] Measuring internal resistor — IUT as slave 8.6.3 [EPL–CT 108] Measuring internal resistor — IUT as master |
| 179 | 8.7 Static test cases |
| 182 | Bibliography |
