BS ISO 17470:2014
$102.76
Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
| Published By | Publication Date | Number of Pages |
| BSI | 2014 | 22 |
This International Standard gives guidance for the identification of elements and the investigation of the presence of specific elements within a specific volume (on a μm3 scale) contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 6 | Foreword |
| 7 | Introduction |
| 9 | Section sec_1 Section sec_2 Section sec_3 Section sec_3.1 Section sec_3.2 Section sec_3.3 Section sec_3.4 1 Scope 2 Normative references 3 Terms and definitions |
| 10 | Section sec_4 Section sec_5 Section sec_6 Section sec_6.1 Section sec_6.2 Section sec_6.2.1 4 Abbreviated terms 5 Apparatus 6 Procedure for identification 6.1 General 6.2 Setting of analysis conditions |
| 11 | Section sec_6.2.2 Section sec_6.2.2.1 Section sec_6.2.2.2 Section sec_6.2.2.3 |
| 12 | Section sec_6.3 Section sec_6.3.1 Section sec_6.3.2 6.3 Method for analysing an X-ray spectrum |
| 13 | Section sec_6.4 6.4 Detection limit |
| 14 | Section sec_7 7 Test report |
| 15 | Annex sec_A Annex A (informative) Example of the test report on qualitative analysis of a stainless steel sample by EPMA |
| 17 | Table tab_e Figure fig_A.1 |
| 18 | Reference ref_1 Reference ref_2 Reference ref_3 Bibliography |
