BS ISO 14571:2020
$102.76
Metallic coatings on non-metallic basis materials. Measurement of coating thickness. Micro-resistivity method
| Published By | Publication Date | Number of Pages |
| BSI | 2020 | 16 |
This document specifies a method for non-destructive measurements of the thickness of conductive coatings on non-conductive base materials. This method is based on the principle of the sheet resistivity measurement and is applicable to any conductive coatings and layers of metal and semiconductor materials. In general, the probe has to be adjusted to the conductivity and the thickness of the respective application. However, this document focuses on metallic coatings on non-conductive base materials (e.g. copper on plastic substrates, printed circuit boards).
This method is also applicable to thickness measurements of conductive coatings on conductive base materials, if the resistivity of the coating and the base material is significantly different. However, this case is not considered in this document.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 2 | National foreword |
| 6 | Foreword |
| 7 | 1 Scope 2 Normative references 3 Terms and definitions 4 Measurement principle |
| 10 | 5 Factors affecting measurement uncertainty 5.1 Range of measurement 5.2 Coating resistivity 5.3 Width of the sample |
| 11 | 5.4 Curvature 5.5 Surface roughness 5.6 Temperature 5.7 Probe contact pressure 6 Calibration of instruments 6.1 General |
| 12 | 6.2 Calibration standards 6.3 Verification 7 Procedure 7.1 General 7.2 Width of the sample 7.3 Curvature 7.4 Number of measurements |
| 13 | 7.5 Surface cleanliness 8 Accuracy requirements 9 Test report |
| 14 | Annex A (informative) Method for determining the critical current path width |
| 15 | Bibliography |
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ISO 14571:2020
Metallic coatings on non-metallic basis materials — Measurement of coating thickness — Micro-resistivity method Published…
