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BS IEC/IEEE 63195-1:2022

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Assessment of power density of human exposure to radio frequency fields from wireless devices in close proximity to the head and body (frequency range of 6 GHz to 300 GHz) – Measurement procedure

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BSI 2022 146
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PDF Pages PDF Title
2 undefined
4 English
CONTENTS
11 FOREWORD
13 INTRODUCTION
14 1 Scope
15 2 Normative references
3 Terms and definitions
3.1 Exposure metrics and parameters
18 3.2 Spatial, physical, and geometrical parameters associated with exposure metrics
19 3.3 Measurement instrumentation, field probe, and data-processing parameters
22 3.4 RF power parameters
23 3.5 Test device technical operating and antenna parameters
25 3.6 Test device physical configurations
26 3.7 Uncertainty parameters
27 4 Symbols and abbreviated terms
4.1 Symbols
4.1.1 Physical quantities
28 4.1.2 Constants
4.2 Abbreviated terms
29 5 Quick start guide and application of this document
5.1 Quick start guide
30 Tables
Table 1 โ€“ Evaluation plan check-list
31 Figures
Figure 1 โ€“ Quick Start Guide
32 5.2 Application of this document
5.3 Stipulations
6 Measurement system and laboratory requirements
6.1 General requirements
33 6.2 Laboratory requirements
34 6.3 Field probe requirements
6.4 Measurement instrumentation requirements
35 6.5 Scanning system requirements
6.5.1 Single-probe systems
6.5.2 Multiple field-probe systems
36 6.6 Device holder requirements
37 6.7 Post-processing quantities, procedures, and requirements
6.7.1 Formulas for calculation of sPD
39 6.7.2 Post-processing procedure
40 6.7.3 Requirements
Figure 2 โ€“ Simplified view of a generic measurement setupinvolving the use of reconstruction algorithms
41 7 Protocol for PD assessment
7.1 General
7.2 Measurement preparation
7.2.1 Relative system check
7.2.2 DUT requirements
42 7.2.3 DUT preparation
43 7.2.4 Selecting evaluation surfaces
44 Figure 3 โ€“ Cross-sectional view of SAM phantom for SAR evaluationsat the reference plane, as described in IEC/IEEE 62209-1528:2020
Figure 4 โ€“ Cross-sectional view of SAM virtual phantom for PD evaluations at the reference plane (shell thickness is 2 mm everywhere, including at the pinna)
46 7.3 Tests to be performed
7.3.1 General
Figure 5 โ€“ Example reference coordinate system forthe left-ear ERP of the SAM phantom
Figure 6 โ€“ Example reference points and vertical and horizontal lines on a DUT
48 7.3.2 Tests to be performed when supported by simulations of the antenna array
Figure 7 โ€“ Flow chart for test procedure in 7.3
50 7.3.3 Tests to be performed by measurements of the antenna array
7.4 Measurement procedure
7.4.1 General measurement procedure
51 7.4.2 Power density assessment methods
Figure 8 โ€“ Flow chart for general measurement procedure in 7.4.1
52 Figure 9 โ€“ Flow chart for power density assessment methods in 7.4.2
Table 2 โ€“ Minimum evaluation distance between the DUT antenna andthe evaluation surface for which the plane wave equivalent approximation applies
53 7.4.3 Power scaling for operating mode and channel
55 7.4.4 Correction for DUT drift
56 7.5 Exposure combining
7.5.1 General
57 7.5.2 Combining power density and SAR results
59 Figure 10 โ€“ SAR and power density evaluation at a point r
Figure 11 โ€“ Combining SAR (top) and power density (bottom) for the SAM phantom
60 8 Uncertainty estimation
8.1 General
8.2 Requirements for uncertainty evaluations
8.3 Description of uncertainty models
61 8.4 Uncertainty terms dependent on the measurement system
8.4.1 CAL โ€“ Calibration of the measurement equipment
8.4.2 COR โ€“ Probe correction
8.4.3 FRS โ€“ Frequency response
62 8.4.4 SCC โ€“ Sensor cross coupling
63 8.4.5 ISO โ€“ Isotropy
8.4.6 LIN โ€“ System linearity error
8.4.7 PSC โ€“ Probe scattering
64 8.4.8 PPO โ€“ Probe positioning offset
8.4.9 PPR โ€“ Probe positioning repeatability
65 8.4.10 SMO โ€“ Sensor mechanical offset
8.4.11 PSR โ€“ Probe spatial resolution
8.4.12 FLD โ€“ Field impedance dependence (ratio |E|/|H|)
8.4.13 MED โ€“ Measurement drift
66 8.4.14 APN โ€“ Amplitude and phase noise
8.4.15 TR โ€“ Measurement area truncation
8.4.16 DAQ โ€“ Data acquisition
8.4.17 SMP โ€“ Sampling
8.4.18 REC โ€“ Field reconstruction
67 8.4.19 SNR โ€“ Signal-to-noise ratio
8.4.20 TRA โ€“ Forward transformation and backward transformation
68 8.4.21 SCA โ€“ Power density scaling
8.4.22 SAV โ€“ Spatial averaging
8.4.23 COM โ€“ Exposure combining
8.5 Uncertainty terms dependent on the DUT and environmental factors
8.5.1 PC โ€“ Probe coupling with DUT
69 8.5.2 MOD โ€“ Modulation response
8.5.3 IT โ€“ Integration time
70 8.5.4 RT โ€“ Response time
8.5.5 DH โ€“ Device holder influence
8.5.6 DA โ€“ DUT alignment
8.5.7 AC โ€“ RF ambient conditions
8.5.8 TEM โ€“ Laboratory temperature
71 8.5.9 REF โ€“ Reflections in laboratory
8.5.10 MSI โ€“ Measurement system immunity/secondary reception
8.5.11 DRI โ€“ DUT drift
8.6 Combined and expanded uncertainty
72 Table 3 โ€“ Template of measurement uncertainty for power density measurements
74 Table 4 โ€“ Example measurement uncertainty budget forpower density measurement results
75 9 Measurement report
9.1 General
9.2 Items to be recorded in measurement reports
78 Annex A (normative)Measurement system check and system validation tests
A.1 Overview
79 A.2 Normalization to total radiated power
A.2.1 General
A.2.2 Option 1: Accepted power measurement
80 Figure A.1 โ€“ Recommended accepted power measurement setupfor relative system check, absolute system check and system validation
Figure A.2 โ€“ Equipment setup for measurement offorward power Pf and forward coupled power Pfc
Figure A.3 โ€“ Equipment setup for measuringthe shorted reverse coupled power Prcs
81 Figure A.4 โ€“ Equipment setup for measuring thepower with the reference antenna
82 Figure A.5 โ€“ Port numbering for the S-parametermeasurements of the directional coupler
83 A.2.3 Option 2: Total radiated power measurement
Table A.1 โ€“ Example of power measurement uncertainty
84 A.3 Relative system check
A.3.1 Purpose
A.3.2 Antenna and test conditions
85 A.3.3 Procedure
A.3.4 Acceptance criteria
87 A.4 Absolute system check
A.4.1 Purpose
A.4.2 Antenna and test conditions
A.4.3 Procedure
A.4.4 Acceptance criteria
88 A.5 System validation
A.5.1 Purpose
A.5.2 Procedure
89 A.5.3 Validation of modulation response
A.5.4 Acceptance criteria
Table A.2 โ€“ Communication signals for modulation response test
91 Annex B (normative)Antennas for system check and system validation tests
B.1 General
92 B.2 Pyramidal horn antennas for system checks
Table B.1 โ€“ Target values for pyramidal horn antennas at different frequencies
93 B.3 Cavity-fed dipole arrays for system validation
B.3.1 Description
Table B.2 โ€“ Main dimensions for the cavity-fed dipole arraysat each frequency of interest
94 Figure B.1 โ€“ Main dimensions for the cavity-fed dipole arrays โ€“ 30 GHz design
95 Table B.3 โ€“ Geometrical parameters of the cavity-fed dipole arraysat each frequency of interest
Table B.4 โ€“ Substrate and metallic block parameters for the cavity-fed dipole arrays at each frequency of interest
96 B.3.2 Numerical target values for cavity-fed dipole arrays
B.3.3 Field and power density distribution patterns
Table B.5 โ€“ Target values for the cavity-fed dipole arrays at10 GHz, 30 GHz, 60 GHz, and 90 GHz
97 Figure B.2 โ€“ 10 GHz patterns of |Etotal| and Re{S}total for the cavity-fed dipole arrays at distances ofa) 2 mm, b) 5 mm, c) 10 mm, and d) 50 mm from the upper surface of the dielectric substrate
98 Figure B.3 โ€“ 30 GHz patterns of |Etotal| and Re{S}total for the cavity-fed dipole arrays at distances ofa) 2 mm, b) 5 mm, c) 10 mm, and d) 50 mm from the upper surface of the dielectric substrate
99 Figure B.4 โ€“ 60 GHz patterns of |Etotal| and Re{S}total for the cavity-fed dipole arrays at distances ofa) 2 mm, b) 5 mm, c) 10 mm, and d) 50 mm from the upper surface of the dielectric substrate
100 Figure B.5 โ€“ 90 GHz patterns of |Etotal| and Re{S}total for the cavity-fed dipole arrays at distances ofa) 2 mm, b) 5 mm, c) 10 mm, and d) 50 mm from the upper surface of the dielectric substrate
101 B.3.4 Far-field radiation patterns
102 Figure B.6 โ€“ Far-field radiation patterns of a) 10 GHz, b) 30 GHz,c) 60 GHz, and d) 90 GHz cavity-fed dipole arrays
103 B.4 Pyramidal horns with slot arrays for system validation
B.4.1 Description
Figure B.7 โ€“ Main dimensions for the 0,15 mm stainless steel stencil with slot array
104 Figure B.8 โ€“ Main dimensions for the pyramidal horn antennas
Table B.6 โ€“ Main dimensions for the stencilwith slot array for each frequency
105 B.4.2 Numerical target values for pyramidal horns loaded with a slot array
Table B.7 โ€“ Primary dimensions for the correspondingpyramidal horns at each frequency
106 B.4.3 Field and power density distribution patterns
Table B.8 โ€“ Target values for the pyramidal horns loaded with slot arraysat 10 GHz, 30 GHz, 60 GHz, and 90 GHz
107 Figure B.9 โ€“ 10 GHz patterns of |Etotal| and Re{S}total for the pyramidal horn loaded with a slot arrayat distances of a) 2 mm, b) 5 mm, c) 10 mm, and d) 50 mm from the upper surface of the slot array
108 Figure B.10 โ€“ 30 GHz patterns of |Etotal| and Re{S}total for the pyramidal horn loaded with a slot arrayat distances of a) 2 mm, b) 5 mm, c) 10 mm, and d) 50 mm from the upper surface of the slot array
109 Figure B.11 โ€“ 60 GHz patterns of |Etotal| and Re{S}total for the pyramidal horn loaded with a slot arrayat distances of a) 2 mm, b) 5 mm, c) 10 mm, and d) 50 mm from the upper surface of the slot array
110 Figure B.12 โ€“ 90 GHz patterns of |Etotal| and Re{S}total for the pyramidal horn loaded with a slot arrayat distances of a) 2 mm, b) 5 mm, c) 10 mm, and d) 50 mm from the upper surface of the slot array
111 B.4.4 Far-field radiation patterns
112 B.5 Antenna validation procedure
B.5.1 General
Figure B.13 โ€“ Far-field radiation patterns of a) 10 GHz, b) 30 GHz,c) 60 GHz, and d) 90 GHz pyramidal horn loaded with a slot array
113 B.5.2 Objectives, scope, and usage specifications
B.5.3 Antenna design
B.5.4 Numerical targets
B.5.5 Reference antennas calibration
B.5.6 Antenna verification and life expectation
B.5.7 Uncertainty budget considerations
114 B.6 Validation procedure for wideband signals
B.6.1 General
B.6.2 Validation signals
B.6.3 Validation antennas and setup
B.6.4 Target values for validation antennas transmitting wideband signals
B.6.5 Wideband signal uncertainty
115 B.6.6 Validation procedure
116 Annex C (normative)Calibration and characterization of measurement probes
C.1 General
C.2 Calibration of waveguide probes
C.2.1 General
C.2.2 Sensitivity
C.2.3 Linearity
117 C.2.4 Lower detection limit
C.2.5 Isotropy
C.2.6 Response time
C.3 Calibration for isotropic scalar E-field or H-field probes
C.3.1 General
C.3.2 Sensitivity
C.3.3 Isotropy
118 C.3.4 Linearity
C.3.5 Lower detection limit
C.3.6 Response time
C.4 Calibration of phasor E-field or H-field probes
C.4.1 General
C.4.2 Sensitivity
119 C.4.3 Isotropy
C.4.4 Linearity
C.4.5 Lower detection limit
C.5 Calibration uncertainty parameters
C.5.1 General
C.5.2 Input power to the antenna
C.5.3 Mismatch effect (input power measurement)
120 C.5.4 Gain and offset distance
C.5.5 Signal spectrum
C.5.6 Setup stability
121 C.5.7 Uncertainty for field impedance variations
C.6 Uncertainty budget template
Table C.1 โ€“ Uncertainty analysis of the probe calibration
123 Annex D (informative)Information on use of square or circular shapes for power density averaging area in conformity evaluations
D.1 General
D.2 Method using computational analysis
D.3 Areas averaged with square and circular shapes on planar evaluation surface
Figure D.1 โ€“ Schematic view of the assessment of the variationof sPD using square shape by rotating AUT (antenna under test)
124 Figure D.2 โ€“ Comparison of psPD averaged using square versus circular shaped areas on planar evaluation surfaces
125 D.4 Areas averaged with square and circular shapes on nonplanar evaluation surface
Figure D.3 โ€“ Example PD distributions withdevice next to ear evaluation surface
Table D.1 โ€“ Phase shift values for the array antenna
126 Figure D.4 โ€“ Comparison of psPD averaged using cube cross-section (square-like) versus sphere cross-section (circular-like) shaped areas fordevice next to ear evaluation surface
127 Annex E (informative)Reconstruction algorithms
E.1 General
E.2 Methodologies to extract local field components and power densities
E.2.1 General
128 E.2.2 Phase-less approaches
E.2.3 Approaches using E-field polarization ellipse measurements
E.2.4 Direct near-field measurements
129 E.3 Forward transformation (propagation) of the fields
E.3.1 General
Figure E.1 โ€“ Simulation (left) and forward transformation from measurements applying methods described in [29] (right) of power density in the xz-plane (above) and yz-plane (below) at a distance of 2 mm for a cavity-fed dipole array at 30 GHz (see Annex B)
130 E.3.2 Field expansion methods
E.3.3 Field integral equation methods
131 E.4 Backward transformation (propagation) of the fields
E.4.1 General
E.4.2 Field expansion methods โ€“ the plane wave expansion
132 E.4.3 Inverse source methods
133 E.5 Analytical reference functions
Table E.1 โ€“ List of analytical reference functionsand associated psPDn+ target values
134 Table E.2 โ€“ List of analytical reference functionsand associated psPDtot+ target values
Table E.3 โ€“ List of analytical reference functionsand associated psPDmod+ target values
135 Annex F (normative)Interlaboratory comparisons
F.1 Purpose
F.2 Reference devices
F.3 Power setup
F.4 Interlaboratory comparison โ€“ procedure
136 Annex G (informative)PD test and verification example
G.1 Purpose
G.2 DUT overview
G.3 Test system verification
G.4 Test setup
G.5 Power density results
G.6 Combined exposure (Total Exposure Ratio)
137 Annex H (informative)Applicability of plane-wave equivalent approximations
H.1 Objective
H.2 Method
H.3 Results
139 H.4 Discussion
Figure H.1 โ€“ psPDpwe / psPDtot as function of distance (in units of ฮป) from cavity-fed dipole array (CDA##G, left-side) and pyramidal horn with slot arrays (SH##G,right-side) operating at 10 GHz, 30 GHz, 60 GHz, and 90 GHz
140 Annex I (informative)Rationales for concepts and methods applied inthis document and IEC/IEEE 63195-2
I.1 Frequency range
I.2 Calculation of sPD
I.2.1 Application of the Poynting vector for calculation of incident power density
141 I.2.2 Averaging area
142 Bibliography
BS IEC/IEEE 63195-1:2022
$215.11