BS EN IEC 62819:2023:2024 Edition
$198.66
Live working. Eye, face and head protectors against the effects of electric arc. Performance requirements and test methods
Published By | Publication Date | Number of Pages |
BSI | 2024 | 54 |
This part of IEC 63275-1 gives a test method to evaluate gate threshold voltage shift of silicon carbide (SiC) power metal-oxide-semiconductor field-effect transistors (MOSFETs) using room temperature readout after applying continuous positive gate-source voltage stress at elevated temperature. The proposed method accepts a certain amount of recovery by allowing large delay times between stress and measurement (up to 10h).
PDF Catalog
PDF Pages | PDF Title |
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2 | undefined |
5 | Annex ZA (normative)Normative references to international publicationswith their corresponding European publications |
7 | English CONTENTS |
9 | FOREWORD |
11 | INTRODUCTION |
12 | 1 Scope 2 Normative references |
13 | 3 Terms, definitions and symbols 3.1 Terms and definitions |
20 | 3.2 Abbreviated terms, symbols and units 4 Requirements 4.1 General 4.2 Design requirements |
21 | 4.3 Mechanical and optical requirements 4.3.1 Mechanical and optical requirements for a device or the part of a device covering eyes or face |
22 | Tables Table 1 ā LT classes |
24 | Figures Figure 1 ā Reference points |
25 | 4.3.2 Mechanical requirements for a device or a part of a device other than those protecting the eyes or face 4.4 Arc thermal protection requirements 4.4.1 General |
26 | 4.4.2 General requirements for protective devices or combination of devices 4.4.3 Additional requirements for face shields 4.4.4 Additional requirements for helmets 4.4.5 Protection requirement of protectors protecting against an electric arc |
27 | 4.4.6 Other requirements for textile components 4.4.7 Performance verification for exposed and not exposed accessories |
28 | 4.5 Marking |
29 | 4.6 Instructions for use |
31 | 5 Test procedures 5.1 General 5.2 Test against the effects of an electric arc 5.2.1 Type tests 5.2.2 Type testing method for the determination of the arc rating values ATPV, EBT and/or ELIM |
34 | Figure 2 ā Schematic view of test set-up, indicating vertical and horizontal positioning of test head on top of mannequin with respect to arc electrodes for open-arc test |
35 | Figure 3 ā Test head with four calorimetric sensors for open-arc test |
37 | 5.2.3 Type testing method for the determination of the arc protection class |
38 | Figure 4 ā Test set-up: Schematic view of test set-up, indicating vertical and horizontal positioning of test head on top of torso with respect to arc electrodes for box-test |
39 | Figure 5 ā Test head with four calorimetric sensors for the box-test |
40 | 5.2.4 Testing of protectors intended to provide 360Ā° protection |
41 | 5.2.5 Additional tests for face shields allowing various wearing distances to the face or different wearing distances associated with different helmets Table 2 ā Minimum of specimens mounted on a test head exposed to an arc from the side and/or the back |
42 | 5.3 Test report 5.4 Marking 5.4.1 Visual inspection 5.4.2 Durability of marking 5.5 Instructions for use 6 Method of assessment of defects and verification of performance applicable to protectors having completed the production phase 6.1 General |
43 | 6.2 Completeness and correctness of assembly 6.3 Product finishing 6.4 Functioning 6.5 Optical properties 6.6 Alternative means to test protectors against the effects of an electric arc when the production phase has been completed 6.7 Packaging and labelling 7 Modifications |
44 | Annexes Annex A (normative) Symbol: Protection against the thermal effect of the electric arc(IEC 60417-6353:2016-02) |
45 | Annex B (informative) Marking examples |
46 | Table B.1 ā Protective performance information |
47 | Annex C (informative) Use and maintenance C.1 Use C.2 Maintenance |
48 | Annex D (normative) Chronological order of type tests Table D.1 ā List of type tests |
50 | Annex E (normative) Classification of defects Table E.1 ā Classification of defects and associated requirements and tests |
51 | Annex F (informative) Rationale for the classification of defects Table F.1 ā Justification for the type of defect |
52 | Bibliography |