BS EN IEC 60512-99-003:2023

$102.76

Connectors for electrical and electronic equipment. Tests and measurements – Endurance test schedules. Test 99c: Test schedule for balanced single-pair connectors separating (unmating) under electrical load

Published By	Publication Date	Number of Pages
BSI	2023	22

Guaranteed Safe Checkout

Categories: 29.100.01 - Components for electrical equipment in general, BSI

If you have any questions, feel free to reach out to our online customer service team by clicking on the bottom right corner. We’re here to assist you 24/7.
Email:[email protected]

IEC 60512-99-003:2023 is used for the assessment of connectors within the scope of SC 48B that are used in balanced single-pair communication cabling with remote power, in support of e.g., IEEE 802.3 remote powering applications for point-to-point connections. The object of this document is to detail a test schedule to determine the ability of sets of single-pair connectors as defined in the IEC 63171 series to withstand a minimum of 100 mechanical operations with electrical load, where an electrical current is being passed through the connector in accordance with IEC 60512-9-3 during the separation (unmating) step. This document does not cover multidrop powering applications of single-pair connectors.

PDF Catalog

PDF Pages	PDF Title
2	undefined
5	Annex ZA (normative)Normative references to international publicationswith their corresponding European publications
7	English CONTENTS
8	FOREWORD
10	1 Scope 2 Normative references
11	3 Terms, definitions and acronyms 3.1 Terms and definitions 3.2 Acronyms 4 General 5 Preparation of specimens 6 Test circuit requirements 6.1 General
12	6.2 Voltage and current Figures Figure 1 – Test circuit diagram for one pole Table 1 – Remote powering test requirements
13	6.3 Auxiliary equipment 7 Test methods 7.1 Mechanical operations with electrical load 7.2 Flowing mixed gas corrosion 8 Test and test schedule – Test group UEL 1
14	Table 2 – Test group UEL 1
16	Annex A (informative)Test voltage and current setting instructions A.1 General A.2 Rationale A.3 Suggested setting instructions
17	Annex B (informative)Discussion of the test circuit elements B.1 General B.2 The test circuit elements B.2.1 Power supply B.2.2 Inductors B.2.3 PD load B.3 An example of calculating voltage and load
18	Annex C (informative)Development of the test circuit C.1 Model of the PSE and the PD C.2 Removal of the semiconductors Figure C.1 – PSE and PD model Figure C.2 – Removal of the semiconductors
19	C.3 Combination of the elements C.4 Further adjustments Figure C.3 – Combination of the elements Figure C.4 – Removal of the capacitors and concentration of the inductors
20	C.5 Final schematic for unmating under load Figure C.5 – Final schematic
21	Bibliography