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BS EN 62493:2015+A1:2022

$215.11

Assessment of lighting equipment related to human exposure to electromagnetic fields

Published By Publication Date Number of Pages
BSI 2022 72
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PDF Pages PDF Title
2 undefined
7 CONTENTS
11 FOREWORD
13 INTRODUCTION
14 1 Scope
2 Normative references
15 3 Terms, definitions, physical quantities, units and abbreviations
3.1 Terms and definitions
17 3.2 Physical quantities and units
Tables
Table 1 – Physical quantities and units
18 3.3 Abbreviations
4 Limits
4.1 General
4.2 Unintentional radiating part of lighting equipment
4.2.1 General
19 4.2.2 Lighting equipment deemed to comply with the Van der Hoofden test without testing
4.2.3 Application of limits
4.3 Intentional radiating part of lighting equipment
20 5 General requirements Van der Hoofden test
5.1 Measurand
5.2 Supply voltage and frequency
Figures
Figure 1 – Compliance routes and pass/fail criteria for lighting equipment
21 5.3 Measurement frequency range
5.4 Ambient temperature
5.5 Measurement equipment requirements
Table 2 – Receiver or spectrum analyser settings
22 Figure 2 – The Van der Hoofden test head
Figure 3 – Example of a protection circuit
23 5.6 Measurement instrumentation uncertainty
5.7 Test report
5.8 Evaluation of results
6 Measurement procedure for the Van der Hoofden test
6.1 General
24 6.2 Operating conditions
6.2.1 Operating conditions for lighting equipment
6.2.2 Operating conditions for specific lighting equipment
6.2.3 Operating conditions for lighting equipment with intentional radiators
6.3 Measurement distance
6.4 Measurement set-up
6.4.1 General
25 6.4.2 Measurement set-up for specific lighting equipment
6.5 Location of measurement test head
Figure 4 – Measurement set-up
26 6.6 Calculation of the results
7 Assessment procedure intentional radiators
7.1 General
7.2 Low-power exclusion method
7.2.1 General
7.2.2 Determination of the total radiated power
7.2.3 Determination of the low-power exclusion level
27 7.2.4 Summation of multiple transmitters
7.3 Application of the EMF product standard for body worn-equipment
7.4 Application of the EMF product standard for base stations
7.5 Application of another EMF standard
28 Figure 5 – Compliance demonstration procedure for the intentional-transmitter part of the lighting equipment
29 Annexes
Annex A (normative) Measurement distances
Table A.1 – Lighting equipment and measurement distances
30 Annex B (informative) Location of measurement test head
Figure B.1 – Location of measurement point in the transverse direction of lighting equipment – side view
Figure B.2 – Location of measurement points in the longitude direction of lighting equipment – side view
31 Figure B.3 – Location of measurement points in the longitude direction of lighting equipment; in the direction of illumination
Figure B.4 – Location of measurement point for lighting equipment with rotationally symmetrical dimensions
32 Figure B.5 – Location of measurement point for lighting equipment with rotationally symmetrical dimensions; in the direction of illumination
Figure B.6 – Location of measurement point for lighting equipment with the same dimensions in the x- and y- axis
33 Figure B.7 – Location of measurement point(s) for lighting equipment with single capped lamp (360° illumination)
Figure B.8 – Location of measurement points for lighting equipment with a remote controlgear
34 Figure B.9 – Location of measurement point for an independent electronic converter
Figure B.10 – Location of measurement point(s) for an uplighter (floor standing/suspended)
35 Annex C (informative) Exposure limits
C.1 General
C.2 ICNIRP basic restrictions
C.2.1 Basic restrictions – SAR
C.2.2 Basic restrictions – Internal electric field
C.2.3 Changes introduced by ICNIRP 2020 with respect to ICNIRP 1998 and ICNIRP 2010
Table C.1 – Basic restrictions for general public exposure to time varying electric and magnetic fields for frequencies between 100 kHz and 300 GHz
Table C.2 – Basic restrictions for general public exposure to time varying electric and magnetic fields for frequencies up to 10 MHz
36 C.3 IEEE
Table C.3 – IEEE basic restrictions (BR) for the general public
Table C.4 – IEEE basic restrictions (BR) between 100 kHz and 3 GHz for the general public
37 Annex D (informative) Rationale measurement and assessment method
D.1 General
D.2 Induced internal electric field
D.2.1 General
Figure D.1 – Overview measurement and assessment method
39 D.2.2 Induced electric field due to the magnetic field; Eeddy(fi,dloop)
Figure D.2 – Distances of the head, loop and measurement set-up
40 Table D.1 – Induced internal electric field calculations
41 Figure D.3 – Maximum current in the 2 m LLA as function of the frequency
43 Figure D.4 – Induced internal electric field and associated limit levels
44 D.2.3 Induced electric field due to the electric field; Ecap(fi,d)
Figure D.5 – Example of magnetic-field test result using the LLA
45 Figure D.6 – Distances of the head and measurement set-up
Figure D.7 – Plot of Equation (D.20)
46 Table D.2 – Calculation main contributions
47 D.3 Thermal effects from 100 kHz to 300 GHz
D.3.1 General
Table D.3 – Frequency steps for the amplitude addition that equals 1,11 times B6
48 D.3.2 The 100 kHz to 30 MHz contribution to the thermal effects
Table D.4 – Frequency steps for the power addition that equals 0,833 times B6
49 D.3.3 The 30 MHz to 300 MHz contribution to the thermal effects
Figure D.8 – Example of the CM-current measured using a conducted emission test
Table D.5 – Field strength limits according to CISPR 15
50 D.3.4 Overall conclusion for the contribution to thermal effects
51 Annex E (normative) Practical internal electric-field measurement and assessment method
E.1 Measurement of induced internal electric field
E.2 Calculation program
52 E.3 Compliance criterion for the Van der Hoofden head test
Table E.1 – Conductivity as a function of frequency (see Table C.1 of IEC 62311:2007)
53 Annex F (normative) Protection network
F.1 Calibration of the protection network
Figure F.1 – Test set-up for normalization of the network analyser
54 F.2 Calculation of the theoretical characteristic of the protection network
Figure F.2 – Test set-up for measurement of the voltage division factor using a network analyser
55 Figure F.3 – Calculated theoretical characteristic for the calibration of the protection network
56 Annex G (informative) Measurement instrumentation uncertainty
Table G.1 – Uncertainty calculation for the measurement method described in Clauses 5 and 6 in the frequency range from 20 kHz to 10 MHz
57 Table G.2 – Comments and information to Table G.1
58 Annex H (informative) Equipment deemed to comply
59 Figure H.1 – Flow chart to determine applicability deemed to comply without F factor measurement
60 Annex I (informative) Intentional radiators
I.1 General
I.2 Intentional radiators in lighting equipment
I.3 Properties of antennas in lighting applications
61 Table I.1 – Overview of wireless radio technologies that might be applied in lighting systems
62 Figure I.1 – Luminaire with a transmitting antenna in a room
63 Figure I.2 – Impact of a conducting ceiling/plane
64 Figure I.3 – Electric field of a small electrical dipole: analytical formula vs far-field approximation
65 Figure I.4 – Electric field as a function of distance, antenna gain and input power (far-field approximation)
66 I.4 Exposure assessment approach
I.4.1 General
I.4.2 Determination of average total radiated power Pint,rad
Figure I.5 – Impact of pulsed signals on the average exposure
67 I.4.3 Determination of the low-power exclusion level Pmax
I.5 Multiple transmitters in a luminaire
68 I.6 Exposure to multiple luminaires
I.7 References in Annex I
70 Bibliography
BS EN 62493:2015+A1:2022
$215.11