| Descriptors |
Electrical measurement, Orientation, Heat of activation, Inspection, Accelerated testing, Capacitance measurement, Breakdown voltage, Sampling methods, Quality assurance systems, Transistors, Marking, Semiconductor diodes, Capability approval, Electrical testing, Test equipment, Semiconductor rectifiers, Thyristors, Circuits, Designations, Testing conditions, Acceptance (approval), Thermal testing, Noise (spurious signals), Mechanical testing, Approval testing, Electronic equipment and components, Environmental testing, Qualification approval, Performance testing, Semiconductor devices, Voltage measurement, Transient voltages, Current measurement, Colour codes, Visual inspection (testing), Power measurement (electric), Statistical quality control, Assessed quality, Specification (approval), Endurance testing, Quality control, Leak tests
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