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ASME BPVC V 2013

ASME BPVC V 2013

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ASME BPVC – V -2013 BPVC Section V, Nondestructive Examination

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ASME 2013
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PDF Catalog

PDF Pages PDF Title
5 Table of Contents
17 List of Sections
18 INTERPRETATIONS
CODE CASES
19 Foreword
21 Statement of Policy on the Use of the Certification Mark and Code Authorization in Advertising
Statement of Policy on the Use of ASME Marking to Identify Manufactured Items
22 Submittal of Technical Inquiries to the Boiler and Pressure Vessel Standards Committees
1 Introduction
2 Inquiry Format
23 3 Code Revisions or Additions
4 Code Cases
5 Code Interpretations
6 Submittals
24 Personnel
39 ASTM Personnel
40 Summary of Changes
44 List of Changes in Record Number Order
46 Cross-Referencing and Stylistic Changes in the Boiler and Pressure Vessel Code
47 Subsection A Nondestructive Methods of Examination
Article 1 General Requirements
T-110 Scope
T-120 General
48 T-130 Equipment
T-150 Procedure
49 T-160 Calibration
T-170 Examinations and Inspections
T-180 Evaluation
T-190 Records/Documentation
50 Mandatory Appendices
Mandatory Appendix I Glossary of Terms for Nondestructive Examination
I-110 Scope
I-120 General Requirements
I-130 Requirements
51 Nonmandatory Appendices
Nonmandatory Appendix A Imperfection vs Type of NDE Method
A-110 Scope
A-110 Imperfection vs Type of NDE Method
53 Article 2 Radiographic Examination
T-210 Scope
T-220 General Requirements
T-221 Procedure Requirements
T-222 Surface Preparation
T-223 Backscatter Radiation
T-224 System of Identification
T-225 Monitoring Density Limitations of Radiographs
T-226 Extent of Examination
T-230 Equipment and Materials
T-231 Film
54 T-232 Intensifying Screens
T-233 Image Quality Indicator (IQI) Design
T-233.1 Hole-Type IQI Designation, Thickness, and Hole Diameters
T-233.2 Wire IQI Designation, Wire Diameter, and Wire Identity
55 T-234 Facilities for Viewing of Radiographs
T-260 Calibration
T-261 Source Size
T-262 Densitometer and Step Wedge Comparison Film
T-270 Examination
T-271 Radiographic Technique
56 T-272 Radiation Energy
T-273 Direction of Radiation
T-274 Geometric Unsharpness
T-275 Location Markers
57 T-275 Location Marker Sketches
58 T-276 IQI Selection
T-277 Use of IQIs to Monitor Radiographic Examination
T-276 IQI Selection
60 T-280 Evaluation
T-281 Quality of Radiographs
T-282 Radiographic Density
T-283 IQI Sensitivity
T-284 Excessive Backscatter
T-283 Equivalent Hole-Type IQI Sensitivity
61 T-285 Evaluation by Manufacturer
T-290 Documentation
T-291 Radiographic Technique Documentation Details
T-292 Radiograph Review Form
62 Mandatory Appendix I In-Motion Radiography
I-210 Scope
I-220 General Requirements
I-223 Backscatter Detection Symbol Location
I-260 Calibration
I-263 Beam Width
I-270 Examination
I-274 Geometric and In-Motion Unsharpness
I-275 Location Markers
I-277 Placement and Number of IQIs
63 I-279 Repaired Area
I-263 Beam Width Determination
64 Mandatory Appendix II Real-Time Radioscopic Examination
II-210 Scope
II-220 General Requirements
II-221 Procedure Requirements
II-230 Equipment and Materials
II-231 Radioscopic Examination Record
II-235 Calibration Block
II-236 Calibrated Line Pair Test Pattern and Step Wedge
II-237 Equivalent Performance Level
II-260 Calibration
II-263 System Performance Measurement
II-264 Measurement With a Calibration Block
65 II-270 Examination
II-278 System Configuration
II-280 Evaluation
II-286 Factors Affecting System Performance
II-290 Documentation
II-291 Radioscopic Technique Information
II-292 Evaluation by Manufacturer
66 Mandatory Appendix III Digital Image Acquisition, Display, and Storage for Radiography and Radioscopy
III-210 Scope
III-220 General Requirements
III-221 Procedure Requirements
III-222 Original Image Artifacts
III-230 Equipment and Materials
III-231 Digital Image Examination Record
III-234 Viewing Considerations
III-236 Calibrated Optical Line Pair Test Pattern and Optical Density Step Wedge
III-250 Image Acquisition and Storage
III-255 Area of Interest
III-258 System Configuration
III-260 Calibration
III-263 System Performance Measurement
III-280 Evaluation
III-286 Factors Affecting System Performance
67 III-287 System-Induced Artifacts
III-290 Documentation
III-291 Digital Imaging Technique Information
III-292 Evaluation by Manufacturer
68 Mandatory Appendix IV Interpretation, Evaluation, and Disposition of Radiographic and Radioscopic Examination Test Results Produced by the Digital Image Acquisition and Display Process
IV-210 Scope
IV-220 General Requirements
IV-221 Procedure Requirements
IV-222 Original Image Artifacts
IV-230 Equipment and Materials
IV-231 Digital Image Examination Record
IV-234 Viewing Considerations
IV-236 Calibrated Optical Line Pair Test Pattern and Optical Density Step Wedge
69 IV-250 Image Acquisition, Storage, and Interpretation
IV-255 Area of Interest
IV-258 System Configuration
IV-260 Calibration
IV-263 System Performance Measurement
IV-280 Evaluation
IV-286 Factors Affecting System Performance
IV-287 System-Induced Artifacts
IV-290 Documentation
IV-291 Digital Imaging Technique Information
IV-292 Evaluation by Manufacturer
70 Mandatory Appendix V Glossary of Terms for Radiographic Examination
V-210 Scope
V-220 General Requirements
V-230 Requirements
72 Mandatory Appendix VI Digital Image Acquisition, Display, Interpretation, and Storage of Radiographs for Nuclear Applications
VI-210 Scope
VI-220 General Requirements
VI-221 Supplemental Requirements
VI-222 Written Procedure
VI-223 Personnel Requirements
VI-230 Equipment and Materials
VI-231 System Features
VI-232 System Spot Size
73 VI-240 System Performance Requirements
VI-241 Spatial Resolution
VI-242 Contrast Sensitivity
VI-243 Dynamic Range
VI-244 Spatial Linearity
VI-250 Technique
VI-251 Spatial Resolution Evaluation
VI-252 Contrast Sensitivity Evaluation
VI-253 Dynamic Range Evaluation
VI-254 Spatial Linearity Evaluation
VI-260 Demonstration of System Performance
VI-261 Procedure Demonstration
VI-262 Processed Targets
VI-263 Changes in Essential Variables
VI-264 Frequency of Verification
74 VI-265 Changes in System Performance
VI-270 Examination
VI-271 System Performance Requirements
VI-272 Artifacts
VI-273 Calibration
VI-280 Evaluation
VI-281 Process Evaluation
VI-282 Interpretation
VI-283 Baseline
VI-290 Documentation
VI-291 Reporting Requirements
VI-292 Archiving
75 Mandatory Appendix VI Supplement A
VI-A-210 Scope
VI-A-220 General
VI-A-221 Reference Film
VI-A-230 Equipment and Materials
VI-A-231 Reference Targets
VI-A-232 Spatial Resolution Targets
VI-A-233 Constrast Sensitivity Targets
VI-A-234 Dynamic Range Targets
VI-A-235 Spatial Linearity Targets
VI-A-240 Miscellaneous Requirements
76 VI-A-1 Reference Film
77 VI-A-241 Material
VI-A-242 Film Size
VI-A-243 Spatial Resolution
VI-A-244 Density
VI-A-245 Linearity
78 Mandatory Appendix VII Radiographic Examination of Metallic Castings
VII-210 Scope
VII-220 General Requirements
VII-224 System of Identification
VII-270 Examination
VII-271 Radiographic Technique
VII-276 IQI Selection
VII-280 Evaluation
VII-282 Radiographic Density
VII-290 Documentation
VII-293 Layout Details
79 Mandatory Appendix VIII Radiography Using Phosphor Imaging Plate
VIII-210 Scope
VIII-220 General Requirements
VIII-221 Procedure Requirements
VIII-225 Monitoring Density Limitations of Radiographs
VIII-230 Equipment and Materials
VIII-231 Phosphor Imaging Plate
VIII-234 Facilities for Viewing of Radiographs
VIII-260 Calibration
VIII-262 Densitometer and Step Wedge Comparison Film
VIII-270 Examination
VIII-277 Use of IQIs to Monitor Radiographic Examination
80 VIII-280 Evaluation
VIII-281 System-Induced Artifacts
VIII-282 Image Brightness
VIII-283 IQI Sensitivity
VIII-284 Excessive Backscatter
VIII-287 Measuring Scale
VIII-288 Interpretation
VIII-290 Documentation
VIII-291 Digital Imaging Technique Documentation Details
81 VIII-293
82 Mandatory Appendix IX Application of Digital Radiography
IX-210 Scope
IX-220 General Requirements
IX-221 Procedure Requirements
IX-225 Monitoring Density Limitations of Radiographs
IX-230 Equipment and Materials
IX-231 Film
IX-232 Intensifying Screens
IX-234 Facilities for Viewing of Radiographs
IX-260 Calibration
IX-262 Densitometer and Step Wedge Comparison Film
IX-270 Examination
IX-277 Use of IQIs to Monitor Radiographic Examination
83 IX-280 Evaluation
IX-281 Quality of Radiographs
IX-282 Image Brightness
IX-283 IQI Sensitivity
IX-284 Excessive Backscatter
IX-287 Measuring Scale
IX-288 Interpretation
84 IX-290 Documentation
IX-291 Digital Imaging Technique Documentation Details
IX-293
85 Nonmandatory Appendix A Recommended Radiographic Technique Sketches for Pipe or Tube Welds
A-210 Scope
86 A-210-1 Single-Wall Radiographic Techniques
87 A-210-2 Double-Wall Radiographic Techniques
89 Nonmandatory Appendix C Hole-Type IQI Placement Sketches for Welds
C-210 Scope
90 C-210-1 Side and Top Views of Hole-Type IQI Placements
91 C-210-2 Side and Top Views of Hole-Type IQI Placements
92 C-210-3 Side and Top Views of Hole-Type IQI Placements
93 C-210-4 Side and Top Views of Hole-Type IQI Placements
94 Nonmandatory Appendix D Number of IQIs (Special Cases)
D-210 Scope
D-210-1 Complete Circumference Cylindrical Component
D-210-2 Section of Circumference 240 deg or More Cylindrical Component (Example is Alternate Intervals)
95 D-210-3 Section(s) of Circumference Less than 240 deg Cylindrical Component
D-210-4 Section(s) of Circumference Equal to or More than 120 deg and Less than 240 deg Cylindrical Component Option
D-210-5 Complete Circumferential Welds Spherical Component
D-210-6 Welds in Segments of Spherical Component
96 D-210-7 Plan View A-A
D-210-8 Array of Objects in a Circle
97 Article 4 Ultrasonic Examination Methods for Welds
T-410 Scope
T-420 General
T-421 Written Procedure Requirements
T-430 Equipment
T-431 Instrument Requirements
T-432 Search Units
T-433 Couplant
98 T-434 Calibration Blocks
T-421 Requirements of an Ultrasonic Examination Procedure
100 T-434.1.7.2 Ratio Limits for Curved Surfaces
101 T-434.2.1 Non-Piping Calibration Blocks
102 T-434.3-1 Calibration Block for Piping
103 T-434.3-2 Alternate Calibration Block for Piping
104 T-434.4.1 Calibration Block for Technique One
105 T-434.4.2.1 Alternate Calibration Block for Technique One
106 T-434.4.2.2 Alternate Calibration Block for Technique One
T-434.4.3 Calibration Block for Technique Two
107 T-434.5.1 Calibration Block for Straight Beam Examination of Nozzle Side Weld Fusion Zone and/or Adjacent Nozzle Parent Metal
108 T-440 Miscellaneous Requirements
T-441 Identification of Weld Examination Areas
T-450 Techniques
T-451 Coarse Grain Materials
T-452 Computerized Imaging Techniques
T-460 Calibration
T-461 Instrument Linearity Checks
T-462 General Calibration Requirements
109 T-463 Calibration for Non-Piping
T-464 Calibration for Piping
110 T-465 Calibration for Weld Metal Overlay Cladding
T-466 Calibration for Nozzle Side Weld Fusion Zone and/or Adjacent Nozzle Parent Metal
T-467 Calibration Confirmation
111 T-470 Examination
T-471 General Examination Requirements
T-472 Weld Joint Distance Amplitude Technique
112 T-473 Weld Metal Overlay Cladding Techniques
T-474 Nondistance Amplitude Techniques
T-475 Nozzle Side Weld Fusion Zone and/or Adjacent Nozzle Parent Metal
T-477 Post-Examination Cleaning
T-480 Evaluation
T-481 General
113 T-482 Evaluation Level
T-483 Evaluation of Laminar Reflectors
T-484 Alternative Evaluations
T-490 Documentation
T-491 Recording Indications
T-492 Examination Records
T-493 Report
T-494 Storage Media
114 Mandatory Appendix I Screen Height Linearity
I-410 Scope
I-440 Miscellaneous Requirements
I-410 Scope
I-440 Linearity
115 Mandatory Appendix II Amplitude Control Linearity
II-410 Scope
II-440 Miscellaneous Requirements
116 Mandatory Appendix III Time of Flight Diffraction (TOFD) Technique
III-410 Scope
III-420 General
III-422 Written Procedure Requirements
III-430 Equipment
III-431 Instrument Requirements
III-432 Search Units
III-422 Requirements of a TOFD Examination Procedure
117 III-434 Calibration Blocks
III-435 Mechanics
III-460 Calibration
III-463 Calibration
III-464 Calibration for Piping
III-465 Calibration for Cladding
118 III-434.2.1(a) TOFD Reference Block
III-434.2.1(b) Two-Zone Reference Block Example
119 III-467 Encoder Confirmation
III-470 Examination
III-471.1 Examination Coverage
III-471.4 Overlap
III-471.5 Multiple Zone Examination
III-471.6 Recording Data (Gated Region)
III-471.8 Reflectors Transverse to the Weld Seam
III-463.5 Offset Scans
120 III-471.9 Supplemental I.D. and O.D. Near Surface Examination
III-472 Weld Joint Distance Amplitude Technique
III-473 Cladding Technique
III-475 Data Sampling Spacing
III-485 Missing Data Lines
III-486 Flaw Sizing and Interpretation
III-490 Documentation
III-492 Examination Record
III-493 Report
121 Mandatory Appendix IV Phased Array Manual Raster Examination Techniques Using Linear Arrays
IV-410 Scope
IV-420 General
IV-422 Written Procedure Requirements
IV-461 Instrument Linearity Checks
IV-462 General Calibration Requirements
IV-492 Examination Record
IV-422 Requirements of a Phased Manual Raster Scanning Examination Procedure Using Linear Arrays
122 Mandatory Appendix V Phased Array E-Scan and S-Scan Linear Scanning Examination Techniques
V-410 Scope
V-420 General
V-421.1 Requirements
V-421.2 Procedure Qualification
V-422 Scan Plan
V-467 Encoder Calibration
V-421 Requirements of a Phased Array Linear Scanning Examination Procedure Using Linear Arrays
123 V-492 Examination Record
124 Mandatory Appendix VII Ultrasonic Examination Requirements for Workmanship Based Acceptance Criteria
VII-410 Scope
VII-420 General
VII-421.3 Written Procedure and Procedure Qualification
VII-423 Personnel Qualifications
VII-431 Instrument Requirements
VII-442 Scanning Data
VII-421 Requirements of an Ultrasonic Examination Procedure for Workmanship Based Acceptance Criteria
125 VII-483 Evaluation of Laminar Reflectors
VII-485 Evaluation
VII-486 Supplemental Manual Techniques
VII-487 Evaluation by Manufacturer
VII-492 Examination Record
126 Mandatory Appendix VIII Ultrasonic Examination Requirements for a Fracture Mechanics Based Acceptance Criteria
VIII-410 Scope
VIII-420 General
VIII-421.2 Procedure Qualification
VIII-421.3 Written Procedure and Procedure Qualification
VIII-423 Personnel Qualifications
VIII-431 Instrument Requirements
VIII-442 Scanning Data
VIII-421 Requirements of an Ultrasonic Examination Procedure for Fracture Mechanics Based Acceptance Criteria
127 VIII-483 Evaluation of Laminar Reflectors
VIII-485 Evaluation Settings
VIII-486 Size and Category
VIII-487 Supplemental Manual Techniques
VIII-488 Evaluation by Manufacturer
VIII-492 Examination Record
128 Mandatory Appendix IX Procedure Qualification Requirements for Flaw Sizing and Categorization
IX-410 Scope
IX-420 General
IX-435 Demonstration Blocks
IX-442 Qualification Data
IX-480 Evaluation
IX-481 Size and Category
IX-482 Automated and Semi-Automated Acceptance Performance Criteria
129 IX-483 Supplemental Manual Technique(s) Acceptable Performance
IX-492 Demonstration Block Record
130 Nonmandatory Appendix A Layout of Vessel Reference Points
A-410 Scope
A-440 Miscellaneous Requirements
A-441 Circumferential (Girth) Welds
A-442 Longitudinal Welds
A-443 Nozzle-to-Vessel Welds
131 Nonmandatory Appendix B General Techniques for Angle Beam Calibrations
B-410 Scope
B-460 Calibration
B-461 Sweep Range Calibration
B-461.1 Sweep Range (Side-Drilled Holes)
132 B-461.2 Sweep Range (IIW Block)
B-461.3 Sweep Range (Notches)
133 B-462 Distance–Amplitude Correction
B-462.1 Sensitivity and Distance–Amplitude Correction (Side-Drilled Holes)
134 B-463 Distance–Amplitude Correction Inner 1/4 Volume (See Nonmandatory Appendix J, Figure J-431 View A)
B-464 Position Calibration (See Figure B-464)
B-462.3 Sensitivity and Distance-Amplitude Correction (Notches)
135 B-465 Calibration Correction for Planar Reflectors Perpendicular to the Examination Surface at or Near the Opposite Surface (See Figure B-465)
B-466 Beam Spread (See Figure B-466)
B-464 Position Depth and Beam Path
B-465 Planar Reflections
136 B-466 Beam Spread
137 Nonmandatory Appendix C General Techniques for Straight Beam Calibrations
C-410 Scope
C-460 Calibration
C-461 Sweep Range Calibration (See Figure C-461)
C-462 Distance–Amplitude Correction (See Figure C-462)
C-461 Sweep Range
138 C-462 Sensitivity and Distance–Amplitude Correction
139 Nonmandatory Appendix D Examples of Recording Angle Beam Examination Data
D-410 Scope
D-420 General
D-470 Examination Requirements
D-471 Reflectors With Indication Amplitudes Greater Than 20% of DAC or Reference Level
D-472 Reflectors With Indication Amplitudes Greater Than the DAC Curve or Reference Level
D-473 Flaw Sizing Techniques to Be Qualified and Demonstrated
D-490 Documentation
140 D-490 Search Unit Location, Position, and Beam Direction
D-490 Example Data Record
141 D-491 Reflectors With Indication Amplitudes Greater Than 20% of DAC or Reference Level
D-492 Reflectors With Indication Amplitudes Greater Than the DAC Curve or Reference Level
D-493 Reflectors That Require Measurement Techniques to Be Qualified and Demonstrated
143 Nonmandatory Appendix E Computerized Imaging Techniques
E-410 Scope
E-420 General
E-460 Calibration
E-470 Examination
E-471 Synthetic Aperture Focusing Technique for Ultrasonic Testing (SAFT-UT)
144 E-472 Line-Synthetic Aperture Focusing Technique (L-SAFT)
E-473 Broadband Holography Technique
145 E-460.1 Lateral Resolution and Depth Discrimination Block for 45 deg and 60 deg Applications
146 E-474 UT-Phased Array Technique
E-475 UT-Amplitude Time-Of-Flight Locus-Curve Analysis Technique
147 E-460.2 Lateral and Depth Resolution Block for 0 deg Applications
148 E-476 Automated Data Acquisition and Imaging Technique
149 Nonmandatory Appendix G Alternate Calibration Block Configuration
G-410 Scope
G-460 Calibration
G-461 Determination of Gain Correction
G-461 Transducer Factor F1 for Various Ultrasonic Transducer Diameters and Frequencies
150 G-461(a) Critical Radius RC for Transducer/Couplant Combinations
151 G-461(b) Correction Factor (Gain) for Various Ultrasonic Examination Parameters
152 Nonmandatory Appendix I Examination of Welds Using Angle Beam Search Units
I-470 Examination
I-471 General Scanning Requirements
I-472 Exceptions To General Scanning Requirements
I-473 Examination Coverage
153 Nonmandatory Appendix J Alternative Basic Calibration Block
J-410 Scope
J-430 Equipment
J-431 Basic Calibration Block
J-432 Basic Calibration Block Material
J-433 Calibration Reflectors
154 J-431 Basic Calibration Block
156 Nonmandatory Appendix K Recording Straight Beam Examination Data for Planar Reflectors
K-410 Scope
K-470 Examination
K-471 Overlap
K-490 Records/Documentation
157 Nonmandatory Appendix L TOFD Sizing Demonstration/Dual Probe — Computer Imaging Technique
L-410 Scope
L-420 General
L-430 Equipment
L-431 System
L-432 Demonstration Block
L-460 Calibration
L-461 System
L-462 System Checks
L-470 Examination
L-480 Evaluation
L-481 Sizing Determinations
158 L-482 Sizing Accuracy Determinations
L-483 Classification/Sizing System
L-432 Example of a Flat Demonstration Block Containing Three Notches
159 L-490 Documentation
L-491 Demonstration Report
160 Nonmandatory Appendix M General Techniques for Angle Beam Longitudinal Wave Calibrations
M-410 Scope
M-460 Calibration
M-461 Sweep Range Calibration
M-461.1 Sweep Range (Side-Drilled Holes)
161 M-461.2 Sweep Range (Cylindrical Surfaces)
162 M-462 Distance-Amplitude Correction (DAC) (See Figure M-462)
M-461.3 Sweep Range (Straight Beam Search Unit)
163 M-462 Sensitivity and Distance–Amplitude Correction
164 Nonmandatory Appendix N Time of Flight Diffraction (TOFD) Interpretation
N-410 Scope
N-420 General
N-421 TOFD Images — Data Visualization
N-421(a) Schematic Showing Waveform Transformation into Grayscale
165 N-421(b) Schematic Showing Generation of Grayscale B-Scan From Multiple A-Scans
N-421(c) Schematic Showing Standard TOFD Setup and Display With Waveform and Signal Phases
166 N-450 Procedure
N-451 Measurement Tools
N-452 Flaw Position Errors
N-453 Measuring Flaw Length
N-454 Measuring Flaw Depth
N-421(d) TOFD Display With Flaws and Displayed A-Scan
167 N-480 Evaluation
N-481 Single Flaw Images
N-451 Measurement Tools for Flaw Heights
N-452(a) Schematic Showing the Detection of Off-Axis Flaws
168 N-452(b) Measurement Errors From Flaw Position Uncertainty
N-453 TOFD Image Showing Hyperbolic “Tails” From the Ends of a Flaw Image Used to Measure Flaw Length
169 N-454(a) TOFD Image Showing Top and Bottom Diffracted Signals From Midwall Flaw and A-Scan Interpretation
N-454(b) TOFD Image Showing Top and Bottom Diffracted Signals From Centerline Crack and A-Scan Interpretation
170 N-482 Multiple Flaw Images
N-481(a) Schematics of Image Generation, Scan Pattern, Waveform, and TOFD Display Showing the Image of the Point Flaw
171 N-481(b) Schematics of Image Generation, Flaw Location, and TOFD Display Showing the Image of the Inside (ID) Surface-Breaking Flaw
N-481(c) Schematics of Image Generation, Flaw Location, and TOFD Display Showing the Image of the Outside (OD) Surface-Breaking Flaw
172 N-481(d) Schematics of Flaw Location, Signals, and TOFD Display Showing the Image of the Midwall Flaw
N-481(e) Flaw Location and TOFD Display Showing the Image of the Lack of Root Penetration
173 N-481(f) Flaw Location and TOFD Display Showing the Image of the Concave Root Flaw
N-481(g) Flaw Location, TOFD Display Showing the Image of the Midwall Lack of Fusion Flaw, and the A-Scan
174 N-481(h) Flaw Location and TOFD Display Showing the Image of the Porosity
N-481(i) Flaw Location and TOFD Display Showing the Image of the Transverse Crack
175 N-481(j) Schematics of Image Generation, Flaw Location, and TOFD Display Showing the Image of the Interpass Lack of Fusion
176 N-482(a) Schematic of Flaw Locations and TOFD Image Showing the Lateral Wave, Backwall, and Three of the Four Flaws
177 N-482(b) Schematic of Flaw Locations and TOFD Display Showing the Lateral Wave, Backwall, and Four Flaws
178 N-483 Typical Problems With TOFD Interpretation
N-483(a) Acceptable Noise Levels, Flaws, Lateral Wave, and Longitudinal Wave Backwall
179 N-483(b) TOFD Image with Gain Too Low
180 N-483(c) TOFD Image With Gain Set Too High
N-483(d)(1) TOFD Image With the Gate Set Too Early
181 N-483(d)(2) TOFD Image With the Gate Set Too Late
N-483(d)(3) TOFD Image With the Gate Set Too Long
182 N-483(e) TOFD Image With Transducers Set Too Far Apart
N-483(f) TOFD Image With Transducers Set Too Close Together
183 N-483(g) TOFD Image With Transducers not Centered on the Weld Axis
N-483(h) TOFD Image Showing Electrical Noise Interference
184 Nonmandatory Appendix O Time of Flight Diffraction (TOFD) Technique — General Examination Configurations
O-410 Scope
O-430 Equipment
O-432 Search Units
O-470 Examination
O-432(a) Search Unit Parameters for Single Zone Examinations Up to 3 in. (75 mm)
O-432(b) Search Unit Parameters for Multiple Zone Examinations Up to 12 in. (300 mm) Thick
185 O-470(a) Example of a Single Zone TOFD Setup
O-470 Recommended TOFD Zones for Butt Welds Up to 12 in. (300 mm) Thick
186 O-470(b) Example of a Two Zone TOFD Setup (Equal Zone Heights)
O-470(c) Example of a Three Zone TOFD Setup (Unequal Zone Heights With Zone 3 Addressed by Two Offset Scans)
187 O-470(d) Example of a Four Zone TOFD Setup (Equal Zone Heights)
188 Nonmandatory Appendix P Phased Array (PAUT) Interpretation
P-410 Scope
P-420 General
P-421 PAUT Images — Data Visualization
P-450 Procedure
P-451 Measurement Tools
P-452 Flaw Sizing Techniques
P-480 Evaluation
189 P-421-1 Black and White (B&W) Version of Color Palette
P-421-2 Scan Pattern Format
190 P-421-3 Example of an E-Scan Image Display
191 P-421-4 Example of an S-Scan Image Display
P-452.1 Flaw Length Sizing Using Amplitude Drop Technique and the Vertical Cursors on the C-Scan Display
192 P-452.2-1 Scan Showing Flaw Height Sizing Using Amplitude Drop Technique and the Horizontal Cursors on the B-Scan Display
P-452.2-2 Flaw Height Sizing Using Top Diffraction Technique and the Horizontal Cursors on the S-Scan Display (The two arrows in the A-scan at left show the relevant signals for measurement.)
193 P-481 ID (Inside Diameter) Connected Crack
P-481 S-Scan of I.D. Connected Crack
194 P-481.1 E-Scan of LOF in Midwall
P-481.2 S-Scan of Porosity, Showing Multiple Reflectors
195 P-481.3 O.D. Toe Crack Detected Using S-Scan
P-481.4 IP Signal on S-Scan, Positioned on Root
196 P-481.5 Slag Displayed as a Midwall Defect on S-Scan
197 Article 5 Ultrasonic Examination Methods for Materials
T-510 Scope
T-520 General
T-521 Basic Requirements
T-522 Written Procedure Requirements
T-530 Equipment
T-531 Instrument
T-532 Search Units
T-533 Couplant
T-534 Calibration Block Requirements
198 T-560 Calibration
T-561 Instrument Linearity Checks
T-562 General Calibration Requirements
T-522 Variables of an Ultrasonic Examination Procedure
199 T-534.3 Straight Beam Calibration Blocks for Bolting
200 T-563 Calibration Confirmation
T-564 Casting Calibration for Supplementary Angle Beam Examinations
T-570 Examination
T-571 Examination of Product Forms
201 T-572 Examination of Pumps and Valves
T-573 Inservice Examination
T-574 Thickness Measurement
T-577 Post-Examination Cleaning
T-580 Evaluation
T-590 Documentation
T-591 Recording Indications
T-592 Examination Records
202 T-593 Report
T-594 Storage Media
203 Mandatory Appendix I Ultrasonic Examination of Pumps and Valves
I-510 Scope
I-530 Equipment
I-531 Calibration Blocks
I-560 Calibration
I-561 System Calibration
I-570 Examination
204 Mandatory Appendix II Inservice Examination of Nozzle Inside Corner Radius and Inner Corner Regions
II-510 Scope
II-530 Equipment
II-531 Calibration Blocks
II-560 Calibration
II-561 System Calibration
II-570 Examination
205 Mandatory Appendix III Glossary of Terms for Ultrasonic Examination
III-510 Scope
III-520 General Requirements
III-540 Miscellaneous Requirements
208 Mandatory Appendix IV Inservice Examination of Bolts
IV-510 Scope
IV-530 Equipment
IV-531 Calibration Blocks
IV-560 Calibration
IV-561 DAC Calibration
IV-570 Examination
IV-571 General Examination Requirements
209 Article 6 Liquid Penetrant Examination
T-610 Scope
T-620 General
T-621 Written Procedure Requirements
T-630 Equipment
T-640 Miscellaneous Requirements
T-641 Control of Contaminants
T-642 Surface Preparation
210 T-643 Drying After Preparation
T-650 Technique
T-651 Techniques
T-652 Techniques for Standard Temperatures
T-653 Techniques for Nonstandard Temperatures
T-654 Technique Restrictions
T-660 Calibration
T-670 Examination
T-671 Penetrant Application
T-621 Requirements of a Liquid Penetrant Examination Procedure
211 T-672 Penetration (Dwell) Time
T-673 Excess Penetrant Removal
T-674 Drying After Excess Penetrant Removal
T-675 Developing
T-672 Minimum Dwell Times
212 T-676 Interpretation
T-677 Post-Examination Cleaning
T-680 Evaluation
T-690 Documentation
T-691 Recording of Indications
213 T-692 Examination Records
214 Mandatory Appendix I Glossary of Terms for Liquid Penetrant Examination
I-610 Scope
I-620 General Requirements
I-630 Requirements
215 Mandatory Appendix II Control of Contaminants for Liquid Penetrant Examination
II-610 Scope
II-640 Requirements
II-641 Nickel Base Alloys
II-642 Austenitic or Duplex Stainless Steel and Titanium
II-690 Documentation
216 Mandatory Appendix III Qualification Techniques for Examinations at Nonstandard Temperatures
III-610 Scope
III-630 Materials
III-640 Requirements
III-641 Comparator Application
III-630 Liquid Penetrant Comparator
218 Article 7 Magnetic Particle Examination
T-710 Scope
T-720 General
T-721 Written Procedure Requirements
T-730 Equipment
T-731 Examination Medium
T-740 Miscellaneous Requirements
T-741 Surface Conditioning
219 T-750 Technique
T-751 Techniques
T-752 Prod Technique
T-721 Requirements of a Magnetic Particle Examination Procedure
220 T-753 Longitudinal Magnetization Technique
T-754 Circular Magnetization Technique
221 T-755 Yoke Technique
T-756 Multidirectional Magnetization Technique
T-754.2.1 Single-Pass and Two-Pass Central Conductor Technique
T-754.2.2 The Effective Region of Examination When Using an Offset Central Conductor
222 T-760 Calibration
T-761 Frequency of Calibration
T-762 Lifting Power of Yokes
T-763 Gaussmeters
T-764 Magnetic Field Adequacy and Direction
223 T-765 Wet Particle Concentration and Contamination
T-764.2(a) Pie-Shaped Magnetic Particle Field Indicator
T-764.2(b)(1) Artificial Flaw Shims
224 T-764.2(b)(2) Artificial Flaw Shims
225 T-766 System Performance of Horizontal Units
T-770 Examination
T-771 Preliminary Examination
T-772 Direction of Magnetization
T-773 Method of Examination
T-774 Examination Coverage
T-775 Rectified Current
226 T-776 Excess Particle Removal
T-777 Interpretation
T-766.1 Ketos (Betz) Test Ring
227 T-778 Demagnetization
T-779 Post-Examination Cleaning
T-780 Evaluation
T-790 Documentation
T-791 Multidirectional Magnetization Technique Sketch
T-792 Recording of Indications
228 T-793 Examination Records
229 Mandatory Appendix I Magnetic Particle Examination Using the AC Yoke Technique on Ferritic Materials Coated with Nonmagnetic Coatings
I-710 Scope
I-720 General
I-721 Written Procedure Requirements
I-722 Personnel Qualification
I-721 Requirements of AC Yoke Technique on Coated Ferritic Component
230 I-723 Procedure/Technique Demonstration
I-730 Equipment
I-740 Miscellaneous Requirements
I-741 Coating Thickness Measurement
I-750 Technique
I-751 Technique Qualification
I-760 Calibration
I-761 Yoke Maximum Lifting Force
231 I-762 Light Intensity Measurement
I-770 Examination
I-780 Evaluation
I-790 Documentation
I-791 Examination Record
232 Mandatory Appendix II Glossary of Terms for Magnetic Particle Examination
II-710 Scope
II-720 General Requirements
II-730 Requirements
233 Mandatory Appendix III Magnetic Particle Examination Using the Yoke Technique with Fluorescent Particles in an Undarkened Area
III-710 Scope
III-720 General
III-721 Written Procedure Requirements
III-723 Procedure Demonstration
III-750 Technique
III-751 Qualification Standard
III-760 Calibration
III-761 Black Light Intensity Measurement
III-762 White Light Intensity Measurement
III-770 Examination
III-721 Requirements for an AC or HWDC Yoke Technique With Fluorescent Particles in an Undarkened Area
234 III-777 Interpretation
III-790 Documentation
III-791 Examination Record
235 Mandatory Appendix IV Qualification of Alternate Wavelength Light Sources for Excitation of Fluorescent Particles
IV-710 Scope
IV-720 General
IV-721 Written Procedure Requirements
IV-723 Procedure Demonstration
IV-750 Technique
IV-751 Qualification Standard
IV-752 Filter Glasses
IV-770 Qualification Examinations
IV-771 Black Light Intensity
IV-772 Examination Requirements
IV-721 Requirements for Qualifying Alternate Wavelength Light Sources for Excitation of Specific Fluorescent Particles
236 IV-773 Qualification of Alternate Wavelength Light Source and Specific Particles
IV-790 Documentation
IV-791 Examination Record
237 Mandatory Appendix V Requirements for the Use of Magnetic Rubber Techniques
V-710 Scope
V-720 General Requirements
V-721 Written Procedure Requirements
V-730 Equipment
V-731 Magnetizing Apparatus
V-732 Magnetic Rubber Materials
V-733 Magnetic Field Strength
V-734 Magnification
V-740 Miscellaneous Requirements
V-741 Surface Preparation
238 V-742 Taping and Damming
V-743 Release Treatment
V-750 Techniques
V-751 Techniques
V-752 Application of Magnetic Field
V-764 Magnetic Field Adequacy and Direction
V-721 Requirements for the Magnetic Rubber Examination Procedure
239 V-770 Examination
V-773 Application of Liquid Polymer- Magnetic Particle Material
V-774 Movement During Cure
V-776 Removal of Replicas
V-780 Evaluation
V-790 Documentation
V-793 Examination Records
240 Nonmandatory Appendix A Measurement of Tangential Field Strength with Gaussmeters
A-710 Scope
A-720 General Requirements
A-730 Equipment
A-750 Procedure
A-790 Documentation/Records
241 Article 8 Eddy Current Examination
T-810 Scope
242 Mandatory Appendix I Glossary of Terms for Eddy Current Examination
I-810 Scope
I-820 General Requirements
I-830 Requirements
243 Mandatory Appendix II Eddy Current Examination of Nonferromagnetic Heat Exchanger Tubing
II-810 Scope
II-820 General
II-821 Written Procedure Requirements
II-822 Personnel Requirements
II-830 Equipment
244 II-821 Requirements for an Eddy Current Examination Procedure
245 II-840 Requirements
II-860 Calibration
246 II-860.3.1 Differential Technique Response From Calibration Reference Standard
247 II-870 Examination
II-880 Evaluation
II-890 Documentation
II-860.3.2 Absolute Technique Response From Calibration Reference Standard
248 II-880 Flaw Depth as a Function of Phase Angle at 400 kHz [Ni–Cr–Fe 0.050 in. (1.24 mm) Wall Tube]
250 Mandatory Appendix III Eddy Current Examination on Coated Ferritic Materials
III-810 Scope
III-820 General
III-821 Personnel Qualification
III-822 Written Procedure Requirements
III-823 Procedure Demonstration
III-830 Equipment
III-850 Technique
III-860 Calibration
251 III-870 Examination
III-890 Documentation
III-891 Examination Report
III-893 Record Retention
252 Mandatory Appendix IV External Coil Eddy Current Examination of Tubular Products
IV-810 Scope
IV-820 General
IV-821 Performance
IV-822 Personnel Qualification
IV-823 Written Procedure Requirements
IV-830 Equipment
IV-831 Test Coils and Probes
IV-823 Requirements of an External Coil Eddy Current Examination Procedure
253 IV-832 Scanners
IV-833 Reference Specimen
IV-850 Technique
IV-860 Calibration
IV-861 Performance Verification
IV-862 Calibration of Equipment
IV-870 Examination
IV-880 Evaluation
IV-890 Documentation
IV-891 Examination Reports
IV-893 Record Retention
254 Mandatory Appendix V Eddy Current Measurement of Nonconductive-Nonmagnetic Coating Thickness on a Nonmagnetic Metallic Material
V-810 Scope
V-820 General
V-821 Written Procedure Requirements
V-822 Personnel Qualification
V-823 Procedure/Technique Demonstration
V-830 Equipment
V-831 Probes
V-821 Requirements of an Eddy Current Examination Procedure for the Measurement of Nonconductive-Nonmagnetic Coating Thickness on a Metallic Material
255 V-850 Technique
V-860 Calibration
V-870 Examination
V-880 Evaluation
V-860 Typical Lift-off Calibration Curve for Coating Thickness Showing Thickness Calibration Points Along the Curve
256 V-890 Documentation
V-891 Examination Report
V-893 Record Retention
257 Mandatory Appendix VI Eddy Current Detection and Measurement of Depth of Surface Discontinuities in Nonmagnetic Metals with Surface Probes
VI-810 Scope
VI-820 General
VI-821 Written Procedure Requirements
VI-822 Personnel Qualification
VI-823 Procedure/Technique Demonstration
VI-821 Requirements of an Eddy Current Examination Procedure for the Detection and Measurement of Depth for Surface Discontinuities in Nonmagnetic Metallic Materials
258 VI-830 Equipment
VI-831 Probes
VI-832 Reference Specimen
VI-850 Technique
VI-860 Calibration
VI-870 Examination
VI-880 Evaluation
259 VI-890 Documentation
VI-891 Examination Report
VI-893 Record Retention
VI-832 Reference Specimen
VI-850 Impedance Plane Representations of Indications From Figure VI-832
260 Mandatory Appendix VII Eddy Current Examination of Magnetic and Nonmagnetic Conductive Metals to Determine if Flaws are Surface-Connected
VII-810 Scope
VII-820 General
VII-821 Performance
VII-822 Personnel Qualification
VII-823 Written Procedure Requirements
VII-830 Equipment
VII-830.1 System Description
VII-830.2 Surface Probes
VII-830.3 Cables
VII-830.4 Instrumentation
VII-823 Requirements of an Eddy Current Surface Examination Procedure
261 VII-830.5 Reference Specimen
VII-850 Technique
VII-860 Calibration
VII-861 General
VII-830.5 Eddy Current Reference Specimen
262 VII-862 Calibration Response
VII-870 Examination
VII-880 Evaluation
VII-890 Documentation
VII-891 Examination Report
VII-892 Record Retention
263 VII-862 Impedance Plane Responses for Stainless Steel (a) and Carbon Steel (b) Reference Specimens
264 Mandatory Appendix VIII Eddy Current Examination of Nonmagnetic Heat Exchanger Tubing
VIII-810 Scope
VIII-820 General
VIII-821 Written Procedure Requirements
VIII-830 Equipment
VIII-831 Data Acquisition System
VIII-832 Analog Data Acquisition System
265 VIII-833 Digital Data Acquisition System
VIII-834 Bobbin Coils
VIII-850 Technique
VIII-850.1 Probe Data Acquisition Speed
VIII-821 Requirements for an Eddy Current Examination Procedure
266 VIII-850.2 Automated Data Screening System
VIII-860 Calibration
VIII-861 Equipment Calibration
VIII-862 Calibration Reference Standards
VIII-863 Base Frequency
267 VIII-864 Set-up and Adjustment
VIII-870 Examination
VIII-864.1 Differential Technique Response From Calibration Reference
VIII-864.2 Absolute Technique From Calibration Reference Standard
268 VIII-880 Evaluation
VIII-880.1 Data Evaluation
VIII-880.2 Means of Determining Indication Depth
VIII-880.2 Frequencies Used for Data Evaluation
VIII-890 Documentation
VIII-890.1 Reporting
VIII-890.2 Support Members
VIII-890.3 Records
269 Article 9 Visual Examination
T-910 Scope
T-920 General
T-921 Written Procedure Requirements
T-922 Personnel Requirements
T-923 Physical Requirements
T-921 Requirements of a Visual Examination Procedure
270 T-930 Equipment
T-950 Technique
T-951 Applications
T-952 Direct Visual Examination
T-953 Remote Visual Examination
T-954 Translucent Visual Examination
T-980 Evaluation
T-990 Documentation
T-991 Report of Examination
T-993 Record Maintenance
271 Mandatory Appendix I Glossary of Terms for Visual Examination
I-910 Scope
I-920 General
272 Article 10 Leak Testing
T-1000 Introduction
T-1010 Scope
T-1020 General
T-1030 Equipment
273 T-1040 Miscellaneous Requirements
T-1050 Procedure
T-1060 Calibration
T-1070 Test
T-1080 Evaluation
T-1090 Documentation
275 Mandatory Appendix I Bubble Test — Direct Pressure Technique
I-1000 Introduction
I-1010 Scope
I-1020 General
I-1030 Equipment
I-1070 Test
I-1021 Requirements of a Direct Pressure Bubble Leak Testing Procedure
276 I-1080 Evaluation
277 Mandatory Appendix II Bubble Test — Vacuum Box Technique
II-1000 Introduction
II-1010 Scope
II-1020 General
II-1030 Equipment
II-1021 Requirements of a Vacuum Box Leak Testing Procedure
278 II-1070 Test
II-1080 Evaluation
279 Mandatory Appendix III Halogen Diode Detector Probe Test
III-1000 Introduction
III-1010 Scope
III-1020 General
III-1030 Equipment
III-1060 Calibration
280 III-1070 Test
III-1021 Requirements of a Halogen Diode Detector Probe Testing Procedure
III-1031 Tracer Gases
281 III-1080 Evaluation
282 Mandatory Appendix IV Helium Mass Spectrometer Test — Detector Probe Technique
IV-1000 Introduction
IV-1010 Scope
IV-1020 General
IV-1030 Equipment
IV-1060 Calibration
283 IV-1070 Test
IV-1021 Requirements of a Helium Mass Spectrometer Detector Probe Testing Procedure
284 IV-1080 Evaluation
285 Mandatory Appendix V Helium Mass Spectrometer Test — Tracer Probe Technique
V-1010 Scope
V-1020 General
V-1021 Written Procedure Requirements
V-1030 Equipment
V-1031 Instrument
V-1032 Auxiliary Equipment
V-1033 Calibration Leak Standard
V-1060 Calibration
V-1061 Instrument Calibration
286 V-1062 System Calibration
V-1070 Test
V-1071 Scanning Rate
V-1072 Scanning Direction
V-1073 Scanning Distance
V-1074 Leakage Detection
V-1075 Flow Rate
V-1080 Evaluation
V-1081 Leakage
V-1021 Requirements of a Helium Mass Spectrometer Tracer Probe Testing Procedure
287 V-1082 Repair/Retest
288 Mandatory Appendix VI Pressure Change Test
VI-1010 Scope
VI-1020 General
VI-1021 Written Procedure Requirements
VI-1030 Equipment
VI-1031 Pressure Measuring Instruments
VI-1032 Temperature Measuring Instruments
VI-1021 Requirements of a Pressure Change Testing Procedure
289 VI-1060 Calibration
VI-1061 Pressure Measuring Instruments
VI-1062 Temperature Measuring Instruments
VI-1070 Test
VI-1071 Pressure Application
VI-1072 Vacuum Application
VI-1073 Test Duration
VI-1074 Small Pressurized Systems
VI-1075 Large Pressurized Systems
VI-1076 Start of Test
VI-1077 Essential Variables
VI-1080 Evaluation
VI-1081 Acceptable Test
VI-1082 Rejectable Test
290 Mandatory Appendix VII Glossary of Terms for Leak Testing
VII-1010 Scope
VII-1020 General
292 Mandatory Appendix VIII Thermal Conductivity Detector Probe Test
VIII-1000 Introduction
VIII-1010 Scope
VIII-1020 General
VIII-1030 Equipment
VIII-1060 Calibration
293 VIII-1070 Test
VIII-1021 Requirements of a Thermal Conductivity Detector Probe Testing Procedure
VIII-1031 Tracer Gases
294 VIII-1080 Evaluation
295 Mandatory Appendix IX Helium Mass Spectrometer Test — Hood Technique
IX-1010 Scope
IX-1020 General
IX-1021 Written Procedure Requirements
IX-1030 Equipment
IX-1031 Instrument
IX-1032 Auxiliary Equipment
IX-1021 Requirements of a Helium Mass Spectrometer Hood Testing Procedure
296 IX-1033 Calibration Leak Standard
IX-1050 Technique
IX-1051 Permeation
IX-1052 Repetitive or Similar Tests
IX-1060 Calibration
IX-1061 Instrument Calibration
IX-1062 System Calibration
IX-1070 Test
IX-1071 Standard Technique
297 IX-1072 Alternative Technique
IX-1080 Evaluation
IX-1081 Leakage
IX-1082 Repair/Retest
298 Mandatory Appendix X Ultrasonic Leak Detector Test
X-1000 Introduction
X-1020 General
X-1030 Equipment
X-1060 Calibration
X-1021 Requirements of an Ultrasonic Leak Testing Procedure
299 X-1070 Test
X-1080 Evaluation
300 Nonmandatory Appendix A Supplementary Leak Testing Equation Symbols
A-10 Applicability of the Formulas
301 Article 11 Acoustic Emission Examination of Fiber-Reinforced Plastic Vessels
T-1110 Scope
T-1120 General
T-1121 Vessel Conditioning
T-1122 Vessel Stressing
T-1123 Vessel Support
T-1124 Environmental Conditions
T-1121 Requirements for Reduced Operating Level Immediately Prior to Examination
302 T-1125 Noise Elimination
T-1126 Instrumentation Settings
T-1127 Sensors
T-1128 Procedure Requirements
T-1130 Equipment
T-1160 Calibration
T-1161 System Calibration
303 T-1162 Sensor Locations and Spacings
T-1163 Systems Performance Check
T-1170 Examination
304 T-1173(a)(1) Atmospheric Vessels Stressing Sequence
305 T-1173(a)(2) Vacuum Vessels Stressing Sequence
306 T-1173(a)(3) Test Algorithm – Flowchart for Atmospheric Vessels
307 T-1173(b)(1) Pressure Vessel Stressing Sequence
308 T-1173(b)(2) Algorithm — Flowchart for Pressure Vessels
309 T-1180 Evaluation
T-1181 Evaluation Criteria
T-1182 Emissions During Load Hold EH
T-1183 Felicity Ratio Determination
T-1181 Evaluation Criteria
310 T-1184 High Amplitude Events Criterion
T-1185 Total Counts Criterion
T-1190 Documentation
T-1191 Report
T-1192 Record
311 Mandatory Appendix I Instrumentation Performance Requirements
I-1110 AE Sensors
I-1111 High Frequency Sensors
I-1112 Low Frequency Sensors
I-1120 Signal Cable
I-1130 Couplant
I-1140 Preamplifier
I-1150 Filters
I-1160 Power-Signal Cable
I-1161 Power Supply
I-1170 Main Amplifier
312 I-1180 Main Processor
I-1181 General
I-1182 Peak Amplitude Detection
I-1183 Signal Outputs and Recording
313 I-1183 Sample of Schematic of AE Instrumentation for Vessel Examination
314 Mandatory Appendix II Instrument Calibration
II-1110 General
II-1120 Threshold
II-1130 Reference Amplitude Threshold
II-1140 Count Criterion Nc and AM Value
II-1150 Measurement of M
II-1160 Field Performance
315 Mandatory Appendix III Glossary of Terms for Acoustic Emission Examination of Fiber-Reinforced Plastic Vessels
III-1110 Scope
III-1120 General Requirements
316 Nonmandatory Appendix A Sensor Placement Guidelines
A-1110 Case 1 — Atmospheric Vertical Vessel
317 A-1120 Case 2 — Atmospheric Vertical Vessel
318 A-1130 Case 3 — Atmospheric/Pressure Vessel
319 A-1140 Case 4 — Atmospheric/Pressure Vertical Vessel
320 A-1150 Case 5 — Atmospheric/Vacuum Vertical Vessel
321 A-1160 Case 6 — Atmospheric/Pressure Horizontal Tank
322 Article 12 Acoustic Emission Examination of Metallic Vessels During Pressure Testing
T-1210 Scope
T-1220 General
T-1221 Vessel Stressing
T-1222 Noise Reduction
T-1223 Sensors
T-1224 Location of Acoustic Emission Sources
T-1225 Procedure Requirements
323 T-1230 Equipment
T-1260 Calibration
T-1261 System Calibration
T-1262 On-Site System Calibration
T-1263 Attenuation Characterization
T-1264 Sensor Location
T-1265 Sensor Spacing
324 T-1266 Systems Performance Check
T-1270 Examination
T-1271 General Guidelines
T-1272 Background Noise
T-1273 Vessel Pressurization
325 T-1280 Evaluation
T-1281 Evaluation Criteria
T-1290 Documentation
T-1291 Written Report
T-1273.2.1 An Example of Pressure Vessel Test Stressing Sequence
326 T-1292 Record
T-1273.2.2 An Example of In-Service, Pressure Vessel, Test Loading Sequence
327 T-1281 An Example of Evaluation Criteria for Zone Location
328 MANDATORY APPENDIX I INSTRUMENTATION PERFORMANCE REQUIREMENTS
I-1210 Acoustic Emission Sensors
I-1220 Signal Cable
I-1230 Couplant
I-1240 Preamplifier
I-1250 Filter
I-1260 Power-Signal Cable
I-1270 Power Supply
I-1280 Main Amplifier
I-1290 Main Processor
I-1291 General
329 I-1292 Peak Amplitude Detection
330 Mandatory Appendix II Instrument Calibration and Cross-Referencing
II-1210 Manufacturer’s Calibration
II-1211 Annual Calibration
II-1220 Instrument Cross-Referencing
II-1221 Sensor Characterization
331 Mandatory Appendix III Glossary of Terms for Acoustic Emission Examination of Metal Pressure Vessels
III-1210 Scope
III-1220 General Requirements
III-1230 Requirements
332 NONMANDATORY APPENDIX A SENSOR PLACEMENT GUIDELINES
A-1210 Case 1 — Vertical Pressure Vessel Dished Heads, Lug or Leg Supported
333 A-1220 Case 2 — Vertical Pressure Vessel Dished Heads, Agitated, Baffled Lug, or Leg Support
334 A-1230 Case 3 — Horizontal Pressure Vessel Dished Heads, Saddle Supported
335 A-1240 Case 4 — Vertical Pressure Vessel Packed or Trayed Column Dished Heads, Lug or Skirt Supported
336 A-1250 Case 5 — Spherical Pressure Vessel, Leg Supported
337 Nonmandatory Appendix B Supplemental Information for Conducting Acoustic Emission Examinations
B-10 Frequency Selection
B-20 Combining More than One Sensor in a Single Channel
B-30 Attenuative Welds
B-40 Production Line Testing of Identical Vessels
338 Article 13 Continuous Acoustic Emission Monitoring
T-1310 Scope
T-1311 References
T-1320 General
T-1321 Monitoring Objectives
T-1322 Relevant Indications
T-1323 Personnel Qualification
T-1324 Component Stressing
339 T-1325 Noise Interference
T-1326 Coordination With Plant System Owner/Operator
T-1327 Source Location and Sensor Mounting
T-1330 Equipment
T-1331 General
T-1332 Sensors
T-1333 Signal Cables
340 T-1331 Functional Flow Diagram — Continuous AE Monitoring System
T-1332.2 Response of a Waveguide AE Sensor Inductively Tuned to 500 kHz
341 T-1334 Amplifiers
T-1335 AE Monitor
T-1340 Requirements
T-1341 Equipment Qualification
T-1342 Sensor Qualification
342 T-1343 Signal Pattern Recognition
T-1344 Material Attenuation/Characterization
T-1345 Background Noise
T-1346 Qualification Records
T-1347 Sensor Installation
343 T-1348 Signal Lead Installation
T-1349 AE Monitor Installation
T-1350 Procedure Requirements
T-1351 AE System Operation
T-1352 Data Processing, Interpretation, and Evaluation
T-1353 Data Recording and Storage
T-1360 Calibration
T-1361 Sensors
T-1362 Complete AE Monitor System
344 T-1363 Calibration Intervals
T-1364 Calibration Records
T-1370 Examination
T-1371 Personnel
T-1372 Plant Startup
T-1373 Plant Steady-State Operation
T-1374 Nuclear Components
T-1375 Nonnuclear Metal Components
T-1376 Nonmetallic Components
T-1377 Limited Zone Monitoring
T-1378 Hostile Environment Applications
T-1379 Leak Detection Applications
345 T-1380 Evaluation/Results
T-1381 Data Processing, Interpretation, and Evaluation
T-1382 Data Requirements
T-1390 Reports/Records
T-1391 Reports to Plant System Owner/Operator
T-1392 Records
T-1393 Record Retention Requirements
346 Mandatory Appendix I Nuclear Components
I-1310 Scope
I-1320 Terms Specific to this Appendix
I-1330 Equipment Qualification
I-1331 Preamplifiers
I-1332 Monitor System
I-1340 Sensors
I-1341 Sensor Type
I-1342 Frequency Response
I-1343 Signal Processing
I-1350 Calibration
I-1351 Calibration Block
I-1352 Calibration Interval
347 I-1360 Evaluation/Results
348 Mandatory Appendix II Non-Nuclear Metal Components
II-1310 Scope
II-1320 Equipment/Qualifications
II-1321 Sensor Response
II-1322 Couplant
II-1323 Preamplifier
II-1324 Signal Cable
II-1325 Power Supply
II-1326 Main Amplifier
II-1327 Main Processor
II-1330 Sensors
II-1331 Sensor Mounting/Spacing
II-1332 Sensor Spacing for Multichannel Source Location
349 II-1333 Sensor Spacing for Zone Location
II-1340 Calibration
II-1341 Manufacturer’s Calibration
II-1342 Annual Calibration
II-1343 System Performance Check
II-1344 System Performance Check Verification
II-1350 Evaluation
II-1351 Evaluation Criteria — Zone Location
II-1352 Evaluation Criteria — Multisource Location
II-1351 An Example of Evaluation Criteria for Zone Location
350 II-1352 An Example of Evaluation Criteria for Multisource Location
351 Mandatory Appendix III Nonmetallic Components
III-1310 Scope
III-1320 Background
III-1321 References
III-1330 Material Considerations
III-1331 Sensor Frequency
III-1332 Source Location Accuracy
III-1340 Calibration
III-1341
III-1342
III-1343
III-1344
III-1345
352 III-1350 Evaluation/Results
III-1351 Evaluation Criteria
III-1352 Source Mechanism
353 Mandatory Appendix IV Limited Zone Monitoring
IV-1310 Scope
IV-1320 Terms Specific to this Appendix
IV-1330 General
IV-1331 Techniques
IV-1332 Guard Sensor Technique
IV-1333 Other Techniques
IV-1340 Requirements
IV-1341 Procedure
IV-1342 Redundant Sensors
IV-1343 System Calibration
IV-1350 Evaluation/Results
354 IV-1360 Reports/Records
355 Mandatory Appendix V Hostile Environment Applications
V-1310 Scope
V-1320 Sensors
V-1321 Surface Mounted Sensors
V-1322 Waveguide Sensors
V-1323 Sensor Monitoring
V-1324 Signal Cables
356 V-1322 Metal Waveguide AE Sensor Construction
357 V-1323 Mounting Fixture for Steel Waveguide AE Sensor
358 Mandatory Appendix VI Leak Detection Applications
VI-1310 Scope
VI-1320 General
VI-1330 Equipment
VI-1331 Sensor Type
VI-1332 Waveguide
359 VI-1333 Electronic Filters
VI-1340 Procedure
VI-1342 Calibration Checks
VI-1350 Examination
VI-1351 Implementation of System Requirements
VI-1352 Calibration Procedure
VI-1353 Equipment Qualification and Calibration Data
VI-1360 Evaluation/Results
VI-1361 Leak Indications
VI-1362 Leak Location
360 Mandatory Appendix VII Glossary of Terms for Acoustic Emission Examination
VII-1310 Scope
VII-1320 General Requirements
VII-1330 Requirements
361 Article 14 Examination System Qualification
T-1410 Scope
T-1420 General Requirements
T-1421 The Qualification Process
T-1422 Technical Justification
T-1423 Performance Demonstration
T-1424 Levels of Rigor
362 T-1425 Planning a Qualification Demonstration
T-1430 Equipment
T-1440 Application Requirements
T-1441 Technical Justification Report
363 T-1442 Performance Demonstration
364 T-1443 Examination System Re-qualification
T-1450 Conduct of Qualification Demonstration
T-1451 Protocol Document
T-1452 Individual Qualification
T-1460 Calibration
365 T-1470 Examination
T-1471 Intermediate Rigor Detection Test
T-1472 High Rigor Detection Tests
366 T-1472.1 Total Number of Samples for a Given Number of Misses at a Specified Confidence Level and POD
T-1472.2 Required Number of First Stage Examiners vs. Target Pass Rate
367 T-1480 Evaluation
T-1490 Documentation and Records
368 Mandatory Appendix I Glossary of Terms for Examination System Qualification
I-1410 Scope
I-1420 General Requirements
I-1430 Requirements
369 Mandatory Appendix II UT Performance Demonstration Criteria
II-1410 Scope
II-1420 General
II-1430 Equipment
II-1434 Qualification Blocks
II-1440 Application Requirements
370 II-1450 Conduct of Qualification Demonstration
II-1434 Flaw Characterization for Tables II-1434-1 and II-1434-2
II-1434-1 Flaw Acceptance Criteria for 4 in. to 12 in. Thick Weld
II-1434-2 Flaw Acceptance Criteria for Larger Than 12 in. Thick Weld
371 II-1460 Calibration
II-1470 Examination
II-1480 Evaluation
II-1481 Low Level
II-1482 Intermediate Level
II-1483 High Level
II-1490 Documentation
372 Article 15 Alternating Current Field Measurement Technique (ACFMT)
T-1510 Scope
T-1520 General
T-1521 Supplemental Requirements
T-1522 Written Procedure Requirements
T-1530 Equipment
T-1531 Instrument
T-1532 Probes
T-1533 Calibration Blocks
373 T-1540 Miscellaneous Requirements
T-1541 Surface Conditioning
T-1542 Demagnetization
T-1543 Identification of Weld Examination Areas
T-1560 Calibration
T-1561 General Requirements
T-1562 Calibration
T-1522 Requirements of an ACFMT Examination Procedure
374 T-1563 Performance Confirmation
T-1570 Examination
T-1571 General Examination Requirements
T-1533 ACFMT Calibration Block
375 T-1572 Examination Coverage
T-1573 Overlap
T-1574 Interpretation
T-1580 Evaluation
T-1590 Documentation
T-1591 Recording Indication
T-1592 Examination Record
T-1593 Report
376 Article 16 Magnetic Flux Leakage (MFL) Examination
T-1610 Scope
T-1620 General
T-1621 Personnel Qualification Requirements
T-1622 Equipment Qualification Requirements
T-1623 Written Procedure Requirements
377 T-1630 Equipment
T-1640 Requirements
T-1650 Calibration
T-1660 Examination
T-1622.1.1 Reference Plate Dimensions
378 T-1670 Evaluation
T-1680 Documentation
T-1622.1.2 Reference Pipe or Tube Dimensions
T-1623 Requirements of an MFL Examination Procedure
380 Article 17 Remote Field Testing (RFT) Examination Method
T-1710 Scope
T-1720 General
T-1721 Written Procedure Requirements
T-1722 Personnel Requirements
T-1730 Equipment
T-1750 Technique
T-1721 Requirements of an RFT Examination Procedure
381 T-1760 Calibration
T-1761 Instrument Calibration
T-1762 System Preparation
T-1763 System Set-up and Calibration
T-1762 Pit Reference Tube (Typical)
382 T-1763.1(a) Voltage Plane Display of Differential Channel Response for Through Wall Hole (Through Hole Signal) and 20% Groove Showing Preferred Angular Relationship
T-1763.1(b) Voltage Plane Display of Differential Channel Response for the Tube Support Plate (TSP), 20% Groove, and Through Wall Hole (Through Hole Signal)
383 T-1764 Auxiliary Frequency(s) Calibration Procedure
T-1765 Calibration Confirmation
T-1766 Correlation of Signals to Estimate Depth of Flaws
T-1770 Examination
T-1771 General
T-1772 Probe Speed
T-1780 Evaluation
T-1790 Documentation
T-1763.2 Reference Curve and the Absolute Channel Signal Response From Two Circumferential Grooves and a Tube Support Plate
384 T-1793 Record Retention
385 Subsection B Documents Adopted by Section V
386 Article 22 Radiographic Standards
387 SE-94
401 SE-747
417 SE-999
423 SE-1025
431 SE-1030
443 SE-1114
449 SE-1165
457 SE-1255
469 SE-1416
475 SE-1647
480 Article 23 Ultrasonic Standards
481 SA-388/SA-388M
491 SA-435/SA-435M
495 SA-577/SA-577M
499 SA-578/SA-578M
507 SA-609/SA-609M
519 SA-745/SA-745M
525 SB-548
531 SE-213
545 SE-273
551 SE-797/SE-797M
559 SE-2491
579 SE-2700
589 Article 24 Liquid Penetrant Standards
591 SD-129
597 SD-516
603 SD-808
609 SE-165
630 Article 25 Magnetic Particle Standards
631 SD-1186
637 SE-709
686 Article 26 Eddy Current Standards
687 SE-243
695 SE-2096
706 Article 29 Acoustic Emission Standards
707 SE-650
711 SE-976
721 SE-1211
729 SE-1419
738 Article 30 Terminology for Nondestructive Examinations Standard
739 SE-1316
777 Article 31 Alternating Current Field Measurement Standard
779 SE-2261
792 MANDATORY APPENDICES
Mandatory Appendix I
793 Mandatory Appendix II Standard Units for Use in Equations
II-1 Standard Units for Use in Equations
794 NONMANDATORY APPENDICES
Nonmandatory Appendix A Guidance for the Use of U.S. Customary and SI Units in the ASME Boiler and Pressure Vessel Code
A-1 Use of Units in Equations
A-2 Guidelines Used to Develop SI Equivalents
796 A-3 Soft Conversion Factors
797 Endnotes
799 Index
803 INTERPRETATIONS Volume 62

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