UNE-EN IEC 60749-30:2020
$22.10
Semiconductor devices – Mechanical and climatic test methods – Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
| Published By | Publication Date | Number of Pages |
| AENOR | 2020-11-01 | 21 |
| Published Code | AENOR |
|---|---|
| Published By | Asociación Española de Normalización |
| Publication Date | 2020-11-01 |
| Pages Count | 21 |
| Language | English |
| File Size | 2.1 MB |
| ICS Codes | 31.080.01 - Semiconductor devices in general |
