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UNE-EN 62047-22:2014

$19.50

Semiconductor devices – Micro-electromechanical devices – Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates

Published By Publication Date Number of Pages
AENOR 2014-11-01 14
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Published Code

AENOR

Published By

Asociación Española de Normalización

Publication Date

2014-11-01

Pages Count

14

Language

English

File Size

522.2 KB

ICS Codes 31.080.99 - Other semiconductor devices
UNE-EN 62047-22:2014
$19.50